The X-ray diffraction (XRD) is studied in thermally evaporated cadmium iodide (CdI2) thin films with various thicknesses. The grain size, calculated from the XRD, is found to increase with increasing the thickness of the film, while the reflectivity and refractive index decease with increasing the wavelength of the exciting light. The optical absorption spectra show both allowed direct and indirect interband transitions across a fundamental gap in CdI2. It is found that both indirect and direct

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... band gap (Eg) decrease with increasing the thickness of the film and that the indirect Eg is lower than the direct Eg by an amount of about 0.7 eV. The direct Eg is also decreased with increasing both the grain size and temperature. However, the temperature dependence of Eg follows the Varshni relation. Our results highlight the possibility of engineering or tuning the Eg of CdI2 by controlling the thickness of the film, grain size as well as temperature.