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Spectral phonon mean free path and thermal conductivity accumulation in defected graphene: The effects of defect type and concentration
2015
Physical Review B
The spectral phonon properties in defected graphene were unclear due to the lack of advanced techniques on predicting the phonon-defect scattering rate without fitting parameters. Taking advantages of the extended phonon normal mode analysis, we obtained the spectral phonon relaxation time and mean free path (MFP) in defected graphene and studied the impacts of three common types of defects, Stone-Thrower-Wales (STW) defect, double vacancy (DV), and mono vacancy (MV). Phonon-STW defect
doi:10.1103/physrevb.91.224301
fatcat:idfqexdkqvc5tjjdwy5ueu3cxq