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Characterizing and evaluating voltage noise in multi-core near-threshold processors
2013
International Symposium on Low Power Electronics and Design (ISLPED)
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Lowering the supply voltage to improve energy efficiency leads to higher load current and elevated supply sensitivity. In this paper, we provide the first quantitative analysis of voltage noise in multi-core near-threshold processors in a future 10nm technology across SPEC CPU2006 benchmarks. Our results reveal larger guardband requirement and significant energy efficiency loss due to power delivery nonidealities at near threshold, and highlight the importance of accurate voltage noise
doi:10.1109/islped.2013.6629271
dblp:conf/islped/ZhangTKLWB13
fatcat:fch7jbuwrzdw5drfcc65uzadoa