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Vibration-induced fatigue failures in bonding wires used in stacked chip modules
Proceedings. 1998 International Conference on Multichip Modules and High Density Packaging (Cat. No.98EX154)
An instrument recently constructed for Goddard Space Flight Center involved stacked chip memory modules having about six thousand 1 mil gold wires, each between 4.6 mm and 6.1 mm long. Four of these bond wires fractured during the final box-level random vibration test which had spectral power to 850 Hz. Investigation determined that these wires have fundamental resonant frequencies in the range from 1.4 kHz to 2.3 kHz, with quality factors up to 300, when the bonds at each end are rigid.
doi:10.1109/icmcm.1998.670799
fatcat:77r64v4mlbbdfkvyzzrdj6zfim