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Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application time for stuck-at faults. We show that similar advantages exist when considering transition faults. We first show that a test sequence under the transparent-scan approach can imitate the application of broadside tests for transition faults. Test compaction can proceed similar to stuck-at faults by omitting test vectorsdoi:10.1109/date.2006.244098 dblp:conf/date/PomeranzR06a fatcat:s2s75wvr65fp7aqvfpiojj6hju