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Optical Manufacturing and Testing VI
The technique for measuring changes in diffuse surfaces using Electronic Speckle Pattern Interferometry (ESPI) is well known. We present a new electronic speckle pattern interferometer that takes advantage of a single-frame spatial phase-shifting technique to significantly reduce sensitivity to vibration and enable complete data acquisition in a single laser pulse. The interferometer was specifically designed to measure the stability of the James Webb Space Telescope (JWST) backplane. Duringdoi:10.1117/12.620619 fatcat:e3e2b35uarbjxguwty5hyyo34e