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The Compton profiles of nitric oxide and acetylene molecules have been determined at an incident photon energy of 20 keV. Compton profile measurements are carried out with the beamline BL15U1 at the Shanghai Synchrotron Radiation Facility (SSRF). A dedicated gas cell is used, in which diffuse scattering is effectively suppressed. By considering that the statistical accuracy of 0.2% at pz ≈ 0 is achieved, the Compton profiles of NO and C2H2 determined in this paper can serve as the experimentaldoi:10.7498/aps.64.153302 fatcat:tqayvzvsb5hslkc6s3qnbc63sm