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Modeling the plastic relaxation onset in realistic SiGe islands on Si(001)
2008
Physical Review B
A detailed investigation of plastic relaxation onset in heteroepitaxial SiGe islands on Si͑001͒ is presented. The strain field induced by a straight misfit-dislocation segment is modeled by finite-element-method ͑FEM͒ calculations in three dimensions, fully taking into account the interaction with the multifaceted free surfaces of realistic islands. The total elastic energies before and after the placement of a 60°dislocation segment in the most favorable position are therefore evaluated by a
doi:10.1103/physrevb.78.184104
fatcat:xsarixaibbd3bjwyi6mvougzwi