Quantitative Characterization of Grain Structure and Orientation using Electron Back-Scattered Diffraction Patterns Collected by Serial Sectioning

M Groeber, Y Bhandari, M D Uchic, D Dimiduk, S Ghosh
2005 Microscopy and Microanalysis  
doi:10.1017/s1431927605507542 fatcat:yba7gdanyzculcrzhfatacoioa