Using BIST control for pattern generation

G. Kiefer, H.-J. Wunderlich
Proceedings International Test Conference 1997  
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It takes advantage of the fact that any autonomous BIST scheme needs a BIST control unit for indicating the completion of the self-test at least. Hence, pattern counters and bit counters are always available, and they provide information to be used for deterministic pattern generation by some additional circuitry. This paper
more » ... resents a systematic way for synthesizing a pattern generator which needs less area than a 32-bit LFSR for random pattern generation for all the benchmark circuits.
doi:10.1109/test.1997.639636 dblp:conf/itc/KieferW97 fatcat:wvmxad6t2rayhha6igzcr4u56i