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Leakage power reduction of embedded memories on FPGAs through location assignment
2006
Proceedings of the 43rd annual conference on Design automation - DAC '06
Transistor leakage is poised to become the dominant source of power dissipation in digital systems, and reconfigurable devices are not immune to this problem. Modern FPGAs already have a significant amount of memory on the die, and with each generation the proportion of embedded memory to logic cells is growing. While assigning high V th can limit the leakage power, embedded memory timing is critical to performance and will draw an increasingly significant amount of leakage current. However,
doi:10.1145/1146909.1147067
dblp:conf/dac/MengSK06
fatcat:xw6vlkofx5gevhwj2fzn6m72ia