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CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
2008
2008 IEEE International Conference on Computer Design
Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures, gate-oxide wearout, and transient faults are becoming increasingly common. In order to overcome these issues and develop robust design techniques for large-market silicon ICs, it is necessary to rely on accurate failure analysis frameworks which enable design houses to faithfully evaluate both the impact of a wide range
doi:10.1109/iccd.2008.4751886
dblp:conf/iccd/PellegriniCZSBA08
fatcat:7ukprqsrn5fcxd2odz6ymjk55e