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Micro diffraction methods like the Kossel or X-ray rotation tilt techniques generate diffraction patterns consisting of conic sections. Extracting information about lattice parameters, orientation or stresses from those patterns generally requires additional information. As a consequence, it is necessary to make high precision measurements of the pattern center and the detector-sample distance. By modeling the focal curves of a diffraction pattern it is possible to determine these parametersdoi:10.4236/jamp.2015.311166 fatcat:25kcj6vihnadtonhyohudsrmqq