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The following reviews were selected from those recently published in various IEEE TRANSACTIONS, Magazines, and Newsletters. They are reprinted here to make them conveniently available to the many readers who otherwise might not have ready access to them. Each review is followed by an identification of its original source.doi:10.1109/proc.1985.13273 fatcat:qy6yld3fv5ftvjre2jeq3py3rm