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A novel system is presented which is capable of measuring with high accuracy the linear ͑Pockels͒ electro-optic effect by means of a new dynamic ͑ac͒ method. This method is based on the observation of the photodetected output obtained from a Senarmont-type ellipsometric system with an ac ͑modulating͒ voltage being applied onto the electro-optic sample under test. This observation is made on a high sensitivity oscilloscope and allows us to determine accurately the null point of the system bydoi:10.1063/1.1148109 fatcat:qupcu2eqyfajfm4wqx3l2b46c4