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Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data

S. D. Ventura, E. G. Birgin, J. M. Martínez, I. Chambouleyron
2005 Journal of Applied Physics  
doi:10.1063/1.1849431 fatcat:35a3kyv65jfhbitcnexnqd7rhy