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Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis Rev. Sci. Instrum. 83, 063702 (2012) High-speed Lissajous-scan atomic force microscopy: Scan pattern planning and control design issues Rev. Sci. Instrum. 83, 063701 (2012) High potential sensitivity in heterodyne amplitude-modulation Kelvin probe force microscopy Appl. Phys. Lett. 100, 223104 (2012) Effect ofdoi:10.1063/1.120039 fatcat:s2dwxasqbrhoxaytibup4vg6my