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Although QCA (Quantum-dot Cellular Automata) is a promising nanotechnology to replace CMOS (Complementary Metal-Oxide-Semiconductor), it has several known reliability problems. Consequently, the design of robust QCA structures is a mandatory step towards the consolidation of this new technology. This paper presents a novel methodology for error analysis of QCA structures based on deterministic and random insertion of possible defects to either the cells and to the phase shifts of the clockingdoi:10.29292/jics.v11i2.433 fatcat:ftv3xhnnarcutb6bsdu23yprhi