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The magnetic-resonance force microscope: a new tool for high-resolution, 3-D, subsurface scanned probe imaging

P.C. Hammel, D.V. Pelekhov, P.E. Wigen, T.R. Gosnell, M.M. Midzor, M.L. Roukes
2003 Proceedings of the IEEE  
The magnetic-resonance force microscope (MRFM) is a novel scanned probe instrument which combines the three-dimensional (3-D) imaging capabilities of magnetic-resonance imaging with the high sensitivity  ...  It will enable nondestructive, chemical-specific, high-resolution microscopic studies and imaging of subsurface properties of a broad range of materials.  ...  The region of interest for the MRFM operating as a high spatial resolution subsurface imaging tool is near the leading edge of the signal where the force slice is well defined and the number of spins contributing  ... 
doi:10.1109/jproc.2003.811797 fatcat:jcnh2lulfzfx3hffaf5n6xhlay

Magnetic resonance force microscopy and the solid state quantum computer

Denis V. Pelekhov, I. Martin, A. Suter, David W. Reagor, P. C. Hammel, James A. Lott, Nikolai N. Ledentsov, Kevin J. Malloy, Bruce E. Kane, Thomas W. Sigmon
2002 Quantum Dot Devices and Computing  
Magnetic Resonance Force Microscopy (MRFM)-a novel scanning probe technique based on mechanical detection of magnetic resonance-provides an attractive means of addressing these requirements.  ...  Moreover, the MRFM is capable of true 3D subsurface imaging. These features will make MRFM an invaluable tool for the implementation of a spin-based QC.  ...  The region of interest for the MRFM operating as a high spatial resolution subsurface imaging tool is near the leading edge of the signal where the sensitive slice is well defined and the number of spins  ... 
doi:10.1117/12.460799 fatcat:tdabcbvrmnf7lna6miftomyiji

A metrological scanning force microscope

Y. Xu, S.T. Smith, P.D. Atherton
1996 Precision engineering  
Finally, a metrological scanning force microscope has been constructed, combining a constant force probe system, an x-y scanning stage and a 3D coarse positioning mechanism into a metrological system.  ...  The object of the project introduced in this thesis was to develop a scanning force microscope of metrological capability with the aim of making significant improvement in scanning force microscopy from  ...  Then the new optimized force probe was applied to a metrological scanning force microscope. a diagram of the force probe sensor.  ... 
doi:10.1016/0141-6359(95)00057-7 fatcat:lgmlnzyubvewzizbzqutophp4u

Unlocking new contrast in a scanning helium microscope

M. Barr, A. Fahy, J. Martens, A. P. Jardine, D. J. Ward, J. Ellis, W. Allison, P. C. Dastoor
2016 Nature Communications  
Scanning helium microscopy is able to image such structures completely non-destructively by taking advantage of a neutral helium beam as a chemically, electrically and magnetically inert probe of the sample  ...  Furthermore, the charged nature of these probes presents difficulties when imaging with electric or magnetic fields, or for insulating materials where the addition of a conductive coating is not desirable  ...  To eliminate this possibility, atomic force microscope (AFM) studies were conducted using a Cypher scanning probe microscope with sub-nanometre resolution in both lateral and axial directions to determine  ... 
doi:10.1038/ncomms10189 pmid:26727303 pmcid:PMC4725762 fatcat:lyve2bhvevavfga6gzbbdjcrge

Single-Chip Scanning Probe Microscopes [chapter]

Neil Sarkar, Raafat R. Mansour
2015 Advanced Micro and Nanosystems  
Scanning probe microscopes (SPMs) are the highest resolution imaging instruments available today and are among the most important tools in nanoscience.  ...  This work also includes the development, fabrication and imaging results of the first single-chip dynamic AFMs, with integrated flexural resonant cantilevers and 3 DOF scanning.  ...  If multiple modes are of interest, each quantity must be calculated for each of the modes, and the models can be connected in parallel to the forcing sources.  ... 
doi:10.1002/9783527690237.ch9 fatcat:sl2exqkphjdvhjjt6fdgjouabu

Nanomechanical mapping of soft materials with the atomic force microscope: methods, theory and applications

Ricardo Garcia
2020 Chemical Society Reviews  
This review provides an introduction to the state-of-the-art force microscope methods to map at high-spatial resolution the elastic and viscoelastic properties of proteins, polymers and cells.  ...  Financial support from the European Research Council ERC-AdG-340177 and the Ministerio de Ciencia e Innovación (MAT2016-76507-R, PID2019-106801GB-I00) are acknowledged.  ...  Acknowledgements The author benefitted from multiple and insightful discussions with Simone Benaglia, Mingdong Dong, Victor G. Gisbert and Manuel R. Uhlig during the writing of this report.  ... 
doi:10.1039/d0cs00318b pmid:32662499 fatcat:dqedbb2i5jfknkn6z2dstopbzu

Theories of scanning probe microscopes at the atomic scale

Werner A. Hofer, Adam S. Foster, Alexander L. Shluger
2003 Reviews of Modern Physics  
After a brief introduction to the experimental techniques and the main factors determining image formation, the authors consider the theoretical models developed for the scanning tunneling microscope (  ...  The theoretical models used to analyze and interpret experimental scanning probe microscope (SPM) images and spectroscopic data now provide information not only about the surface, but also the probe tip  ...  We are grateful to EPSRC and the British Council for financial support.  ... 
doi:10.1103/revmodphys.75.1287 fatcat:6x54zyjs5ffgfhtpbm2edrsgme

Investigative Tools: Experimental Methods and Probes [chapter]

J. Murday, R. Celotta, D. Y. Pui, P. West
2000 Nanotechnology Research Directions: IWGN Workshop Report  
The 1993 NSF panel report Atomic Imaging and Manipulation (AIM) for Advanced concluded that (a) important new science would become accessible as a result of the development of atomic-resolution microscopy  ...  , (b) a substantial program in electron microscopy and scanning tip techniques would strengthen U.S. competitiveness, and (c) many user-friendly, low-cost, fast-turnaround compact microscopes were important  ...  Topography Thermal imageMagnetism by magnetic force and resonance microscopes (MFM) (Hobbs et al. 1989; Rugar et al. 1992) .  ... 
doi:10.1007/978-94-015-9576-6_3 fatcat:jl7zb7n4pze63bigcq3gh34m6i

A scanning tunneling microscope control system with potentiometric capability

A.H. Bredekamp, J. Tapson
1999 1999 IEEE Africon. 5th Africon Conference in Africa (Cat. No.99CH36342)  
of probe microscopes.  ...  This new type of electronic microscope had the ability to obtain atomic resolution, and for the first time materials scientists had the ability to image atoms in their lattice structure using a tabletop  ... 
doi:10.1109/afrcon.1999.820754 fatcat:ebuzcforlvenzh3uaj6i74xhca

Nanoscale magnetic resonance imaging

C. L. Degen, M. Poggio, H. J. Mamin, C. T. Rettner, D. Rugar
2009 Proceedings of the National Academy of Sciences of the United States of America  
We have combined ultrasensitive magnetic resonance force microscopy (MRFM) with 3D image reconstruction to achieve magnetic resonance imaging (MRI) with resolution <10 nm.  ...  MRFM ͉ MRI ͉ nuclear magnetic resonance ͉ molecular structure imaging M agnetic resonance imaging (MRI) is well-known in medicine and in the neurosciences as a powerful tool for acquiring 3D morphological  ...  Swanson for help with sample preparation; J. Frommer for AFM support; M. Hart and M. Farinelli for fabrication of the microwire and magnetic tip; M. Ting and A.  ... 
doi:10.1073/pnas.0812068106 pmid:19139397 pmcid:PMC2628306 fatcat:5ynoaelvrneq7gkp6uqng4oky4

Design and Fabrication of Scanning Near-Field Microwave Probes Compatible With Atomic Force Microscopy to Image Embedded Nanostructures

M. Tabib-Azar, Y. Wang
2004 IEEE transactions on microwave theory and techniques  
Design, fabrication, and characterization of near-field microwave scanning probes compatible with an atomic force microscope (AFM) for imaging of embedded nanostructures are discussed.  ...  Index Terms-Atomic force microscope (AFM), cantilever beams, coaxial probes, scanning local probe microscopy (SLPM), scanning near-field microwave microscope (SNMM), silicon-oninsulator (SOI).  ...  These tools include the scanning tunneling Manuscript microscope (STM) [1] - [5] , atomic force microscope (AFM) [6] - [10] , scanning capacitance microscope (SCM) [10] - [15] , magnetic force  ... 
doi:10.1109/tmtt.2004.823596 fatcat:igyjtdkzpfaqlful5wk5tcjxsq

Scanning Probe Microscopy in Materials Science [chapter]

Bryan D. Huey, Justin Luria, Dawn A. Bonnell
2019 Springer Handbooks  
The authors are also grateful to Nikhila Balasubramanya and Luis Ortiz for assistance with manuscript details, and to Maxim Nikiforov for his considerable input on a previous edition of this chapter.  ...  BDH and JL acknowledge support from the DoE Sunshot program. DAB acknowledges financial support from NSF and DoE. Dr. Sergei Kalinin and Dr.  ...  Pekarik: Imaging integrated circuit dopant profiles with the force-based scanning Kelvin probe microscope, J. Vac. Sci. Technol. B 14, 440-446 (1996) 25.49 M.  ... 
doi:10.1007/978-3-030-00069-1_25 fatcat:h6bhcrxl4zaejfdupjiqulaqly

Comprehensive review of surgical microscopes: technology development and medical applications

Ling Ma, Baowei Fei
2021 Journal of Biomedical Optics  
With advanced visualization and improved ergonomics, the surgical microscope has become a powerful tool in neurosurgery, spinal, ENT, ophthalmic, plastic and reconstructive surgeries.  ...  The aim of this review is threefold: (i) providing a comprehensive technical overview of surgical microscopes, (ii) providing critical references for microscope selection and system development, and (iii  ...  Acknowledgments This research was supported in part by the U.S.  ... 
doi:10.1117/1.jbo.26.1.010901 pmid:33398948 pmcid:PMC7780882 fatcat:7xuymzlwkrhrxld2lv7urfjc6u

Enabling and Investigative Tools: Measuring Methods, Instruments, and Metrology [chapter]

Dawn A. Bonnell, Vinayak P. Dravid, Paul S. Weiss, David Ginger, Keith Jackson, Don Eigler, Harold Craighead, Eric Isaacs
2011 Nanotechnology Research Directions for Societal Needs in 2020  
(d) Magnetic force microscope image of the magnetic domain structure of a thin film taken with a focused, ion beam-milled tip (e) Conductance map of a HfO thin film containing electronic defects that result  ...  A scattering-type near-field scanning optical microscopy (s-NSOM) offers the best opportunity for high spatial resolution.  ... 
doi:10.1007/978-94-007-1168-6_3 fatcat:xpqc5ckouvbytnmb7xuqnq6upq

Super Resolution Imaging of Material Properties Using MEMS Near-Field Microwave Spatial Modulator Arrays

Run Wang, Massood Tabib-Azar
2006 2006 1st IEEE International Conference on Nano/Micro Engineered and Molecular Systems  
Here we discuss a new technique that combines aspects of the "free-space" imaging with the super resolution of near-field scanning probes by using an array of local scatterers near the sample.  ...  We also imaged carbon nanotubes using an atomic force microscope tip as the local scatterer with an unprecedented resolution of 5nm at 100GHz.  ...  Local probe microscopy that includes tools such as scanning tunneling microscope (STM) [1] , scanning near-field optical microscopy (SNOM) [2] , atomic force microscopes (AFM) [3] , magnetic force microscope  ... 
doi:10.1109/nems.2006.334843 fatcat:okktvqxq2bcrlpo2wguwlntke4
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