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ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool?

M. Scholz, D. Linten, S. Thijs, S. Sangameswaran, M. Sawada, T. Nakaei, T. Hasebe, G. Groeseneken
2009 IEEE Transactions on Instrumentation and Measurement  
In this paper, TLP and HBM on-wafer setups are presented regarding their electrical schematics, the type of data that is obtained, and the required calibration methodologies.  ...  The electrical characterization of devices and circuits regarding their electrostatic discharge (ESD) robustness is done by using several measurement tools.  ...  ACKNOWLEDGMENT The authors would like to thank the IMEC Pilot Line, National Semiconductors, and Silterra Malaysia for processing the wafer material, which has been used for this study.  ... 
doi:10.1109/tim.2009.2017657 fatcat:7q4zwi4q6faedlx6azyj32s4tm

Novel design of driver and ESD transistors with significantly reduced silicon area

Koen G Verhaege, Markus Mergens, Christian Russ, John Armer, Phillip Jozwiak
2002 Microelectronics and reliability  
EOS/ESD symposium 2001 This paper presents three novel design techniques, which combined fulfill all major requirements posed on large driver and Electro Static Discharge (ESD) protection transistors:  ...  Abstract -This paper presents three novel design techniques, which combined fulfill all major requirements posed on large driver and Electro Static Discharge (ESD) protection transistors: minimum area  ...  Acknowledgements The authors gratefully acknowledge their Sarnoff coworkers: Wayne Fisher for FA work and SEM pictures; Girija Kolluri, Laura Housel and Russel Moen for device layout and design support  ... 
doi:10.1016/s0026-2714(01)00237-2 fatcat:us3h6eidgrbhjp3tg4ngihr6x4

Software-Based Monitoring and Analysis of a USB Host Controller Subject to Electrostatic Discharge [article]

Natasha Jarus, Antonio Sabatini, Pratik Maheshwari, Sahra Sedigh Sarvestani
2020 arXiv   pre-print
Observing, understanding, and mitigating the effects of failure in embedded systems is essential for building dependable control systems.  ...  Analysis of the recorded register values reveals differences in system execution when the system is subject to interference.  ...  In particular, the authors observe numerous multiple bit errors in IO registers and frequent spurious interrupt triggers. The effect of ESD on USB devices in particular has also been investigated.  ... 
arXiv:2004.06647v1 fatcat:swoy2mhk2rcxtnqk2ngvk2aiji

Paper titles

2020 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)  
and Its' Root Causes in Particle Swarm Optimization The Assisted Environment Information for Blind based on Video Captioning Method The Correlations between ESD and TLP in Large Array Devices The development  ...  Recognition for Satellite Image Signal control switching for improving Large Array Devices' ESD performances Simple authentication methods with pseudo IDs and derivative passwords Smart guiding glasses  ... 
doi:10.1109/icce-taiwan49838.2020.9258179 fatcat:2eheaztzhncixhbvp7nrbzml4m

CMOS Interface Circuits for High-Voltage Automotive Signals

Andrea Boni, Michele Caselli, Alessandro Magnanini, Matteo Tonelli
2022 Electronics  
The integration of electronic interfaces and acquisition circuits in a single device provides benefits in terms of component-count reduction and performance.  ...  In particular, a novel co-design of dedicated voltage clamps with electro-static discharge (ESD) protections is described.  ...  The relatively large range between the trigger voltages V T-MOS and V T-ESD is suitable to allocate the tolerance due to process corner and temperature, affecting both V T-MOS and V T-ESD .  ... 
doi:10.3390/electronics11060971 fatcat:iwfdfjys6jawjejqnd7tpdrv2q

Table of Contents – Technical

2020 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)  
A number of parameters that can affect the impedance plots were studied and tuned. Some of the measurement challenges when collecting this data are examined.  ...  Voltage regulator impedance characterization is a straightforward concept but the challenges in making highfidelity measurements are numerous as the impedance becomes progressively smaller.  ...  Abstract: Discrete transient voltage suppressor devices are used in addition to the on-chip ESD protection to protect the ICs from ESD damage.  ... 
doi:10.1109/emcsi38923.2020.9191654 fatcat:t65pmrzbfngppegmarqdvf56ru

2020 Index IEEE Transactions on Device and Materials Reliability Vol. 20

2020 IEEE transactions on device and materials reliability  
-that appeared in this periodical during 2020, and items from previous years that were commented upon or corrected in 2020.  ...  Note that the item title is found only under the primary entry in the Author Index. Insert para information here (DUMMY)  ...  ., +, TDMR Sept. 2020 596-603 Nanoelectronics Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays.  ... 
doi:10.1109/tdmr.2020.3048618 fatcat:norgmg6wznccti7t3e63qalilu

Table of Contents – Technical

2021 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium  
The proposed method is tested on a practical example which includes a 16-pin ball-grid array (BGA) device and the results are observed in good agreement with those obtained from a numerical  ...  The racks in an array can be divided into a few categories and the racks in each category have similar radiation patterns.  ... 
doi:10.1109/emc/si/pi/emceurope52599.2021.9559379 fatcat:bqobkpurjje4vb5xpdk56r4lpi

Paper Titles

2019 2019 IEEE 8th Global Conference on Consumer Electronics (GCCE)  
Editing Operation History The Study of the Correlation Between Particle Size and Processed Sound Signal of Ishikawa Mixing and Grinding Machine Tokenizing and Managing the Copyrights of Digital Content  ...  of Similar Users Evaluating the Drift-region Length Effect of nLDMOS on ESD Ability with a TLP Testing System Evaluation of a Vibration-based Route Indication for Children Who are Not Familiar with  ... 
doi:10.1109/gcce46687.2019.9015409 fatcat:6k3r6jixrvglrkrkzek636gb54

Graphene-reinforced polymeric nanocomposites in computer and electronics industries

Hossein KardanMoghaddam, Mohamadreza Maraki, Amir Rajaei
2020 Facta universitatis - series Electronics and Energetics  
manufacturing many electronics devices.  ...  In this paper, the applications of graphene nanoparticles reinforced polymer nanocomposites in the computer and electronics industry are investigated.  ...  This method was applied in a clean room, and the results were characterized by Transitional Linear Pulse (TLP). This device can be used to produce a new generation of ESD protectors on the chip.  ... 
doi:10.2298/fuee2003351m fatcat:r63mfevrnzbz7gp7llxzei4sx4

Program

2020 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)  
In this paper, analyses for the relations between ESD and TLP are taken into discussions for large array device (LAD).  ...  However, the non-correlations between TLP and ESD can be observed in the gate driving circuits [2], silicide devices [3] and poly fuses [4] .  ...  This paper deals with near-field localization problem by combining the advantages of the vector sensor array processing and maximum likelihood estimation in the condition of correlated signal, and propose  ... 
doi:10.1109/icce-taiwan49838.2020.9258230 fatcat:g25vw7mzvradxna2grlzp6kgiq

Program

2021 2021 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW)  
Analysis of the records showed a mild correlation between taking this tea and their quality of sleep.  ...  The main objective aims to improvise the correlation coefficient between the widely used IQM and Human Visual System (HVS).  ... 
doi:10.1109/icce-tw52618.2021.9602919 fatcat:aetmvxb7hfah7iuucbamos2wgu

日本電子顕微鏡学会第46回シンポジウム 口頭発表・講演概要

2001 Denshi kenbikyo  
sensitivity of the {200} reflections in the sphalerite structure.  ...  Here, the analysis of capped and uncapped InAs quantum dots on GaAs(100) substrates grown by molecular beam epitaxy at 480•Ž and 530•Ž is presented.  ...  Ono, and Dr. T. Tatsumi for their helpful discussions. We also thank Dr. M. Mitome of the National Institute for Research in Materials Science for his advice regarding the HREM simulation.  ... 
doi:10.11410/kenbikyo1950.36.supplement2_1 fatcat:jtp4txzlrzhwzjstvl5cf3jmpm

Annual Conference Of The British Cardiac Society G-Mex, Manchester 20-22 May 1997

1997 Heart  
There was also no correlation between the P1IIP and TIMP levels in either group.  ...  The devices were implanted between 1991 to 1993 and the shortest long term follow up in this cohort was thirty-two months (maximum fifty-seven months).  ...  ETA and ETB receptor binding was associated with the media (SV > VG =StVG > CA) and neointima (in VGs only) and with the neoadventitia (ADV) [table] .  ... 
doi:10.1136/hrt.77.suppl_1.i fatcat:diqpwcbyanebhb3svidac56x64

Study, Design and Fabrication of an Analogue VLSI Ormia-Ochracea-Inspired Delay Magnification System

Metha Kongpoon, Emmanuel Drakakis
2011
This study sheds light and tries to comprehend what mechanical parameters of the O2 ears are involved in the delay magnification process and how these parameters contribute to the magnification of the  ...  Inspired by the study of the O2 system, in the second part of our study, we modify the O2 system using simpler building blocks and structure which can provide a delay magnification comparable to the original  ...  technology using the device dimensions chosen in Chapter 5, packaged in a 100 pin grid arrays (PGA) package and tested.  ... 
doi:10.25560/8961 fatcat:vfbp5dxiirggfgqxp43w2zkx5m
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