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SAT-based ATPG beyond stuck-at fault testing

Sybille Hellebrand, Hans-Joachim Wunderlich
<span title="2014-01-28">2014</span> <i title="Walter de Gruyter GmbH"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/zhpjayiyj5gf5fycnlwue3krte" style="color: black;">it - Information Technology</a> </i> &nbsp;
The SAT-based strategies for the verification and synthesis of self-checking circuits presented in this paper can provide efficient solutions.  ...  As it is beyond the scope of this paper to explain SAT-based ATPG in detail, in the following only the basic steps are briefly summarized.  ...  In particular, it has been shown that SAT-based ATPG is more effective for hard to test faults and for redundancy identification [6, 7, 13] .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1515/itit-2013-1043">doi:10.1515/itit-2013-1043</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ixmyoriwvjcx3l3bowdnofizbu">fatcat:ixmyoriwvjcx3l3bowdnofizbu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170706081621/http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2014/ITIT_HelleW2014.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/6b/76/6b76056c166d6e6d7107b2b70619073095bb5bb0.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1515/itit-2013-1043"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> degruyter.com </button> </a>

Recent advances in SAT-based ATPG: Non-standard fault models, multi constraints and optimization

Bernd Becker, Rolf Drechsler, Stephan Eggersgluss, Matthias Sauer
<span title="">2014</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/zg5te5xuqjc3pciymmuk7f7e6e" style="color: black;">2014 9th IEEE International Conference on Design &amp; Technology of Integrated Systems in Nanoscale Era (DTIS)</a> </i> &nbsp;
In this paper, we first provide introductory knowledge on SAT-based ATPG and then report on latest developments enabling applications far beyond classical ATPG.  ...  It is well-known that in principle automatic test pattern generation (ATPG) can be solved by transforming the circuit and the fault considered into a Boolean satisfiability (SAT) instance and then calling  ...  That is, given a fault f , e.g. a stuck-at-0 or stuck-at-1 fault, additional constraints Φ f F for fault excitation and fault propagation with respect to the specific fault f have to be formulated.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/dtis.2014.6850674">doi:10.1109/dtis.2014.6850674</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/dtis/BeckerDES14.html">dblp:conf/dtis/BeckerDES14</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/xwlu3jwerjhjtdkq26cjdildpu">fatcat:xwlu3jwerjhjtdkq26cjdildpu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170705102043/http://www.informatik.uni-bremen.de/agra/doc/konf/14DTIS-SAT-ATPG.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/57/70/57706ba8a8455081b5ac6c0f2d7f4657afa6b4ed.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/dtis.2014.6850674"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

An effective fault ordering heuristic for SAT-based dynamic test compaction techniques

Stephan Eggersglüß, Rolf Drechsler
<span title="2014-01-28">2014</span> <i title="Walter de Gruyter GmbH"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/zhpjayiyj5gf5fycnlwue3krte" style="color: black;">it - Information Technology</a> </i> &nbsp;
counts of highly compacted test sets generated by a SAT-based dynamic test compaction approach.  ...  The effectiveness of these technique is significantly influenced by fault ordering.  ...  Preliminaries The strength of SAT-based ATPG is the ability to reliably generate tests for hard-to-detect faults.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1515/itit-2013-1041">doi:10.1515/itit-2013-1041</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/pkekmjjya5fwhpbf6pnvj6ptnu">fatcat:pkekmjjya5fwhpbf6pnvj6ptnu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20180725014731/https://www.degruyter.com/downloadpdf/j/itit.2014.56.issue-4/itit-2013-1041/itit-2013-1041.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/ff/b2/ffb2da006638772b63ef0c1afb1d954559ac8468.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1515/itit-2013-1041"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> degruyter.com </button> </a>

An Accelerating Technique for SAT-based ATPG

Yusuke Matsunaga
<span title="">2017</span> <i title="Information Processing Society of Japan"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/nrr476l26fbkboaavopttilsxe" style="color: black;">IPSJ Transactions on System LSI Design Methodology</a> </i> &nbsp;
This paper describes an accelerating technique for SAT based ATPG (automatic test pattern generation).  ...  Experimental results show that the proposed algorithm runs more than 3 times faster than the original SAT-based ATPG algorithm.  ...  SAT Based ATPG This section describes basic definitions and the existing techniques for SAT based ATPG.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.2197/ipsjtsldm.10.39">doi:10.2197/ipsjtsldm.10.39</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/iyyj3w3df5a3bgsq5aj5yt3r3q">fatcat:iyyj3w3df5a3bgsq5aj5yt3r3q</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20181102052728/https://www.jstage.jst.go.jp/article/ipsjtsldm/10/0/10_39/_pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/a6/d9/a6d9b551f85b5b98f8b3ac3676ab49676ba0fb3c.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.2197/ipsjtsldm.10.39"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

Generation of Reduced Test Vectors for Multiple Stuck at Faults using Genetic Algorithm

<span title="2019-09-10">2019</span> <i title="Blue Eyes Intelligence Engineering and Sciences Engineering and Sciences Publication - BEIESP"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/cj3bm7tgcffurfop7xzswxuks4" style="color: black;">VOLUME-8 ISSUE-10, AUGUST 2019, REGULAR ISSUE</a> </i> &nbsp;
patterns of single stuck at faults to identify MSA faults.  ...  As seen many of circuits have single and multiple faults, as known many research has been carried out to generate test pattern set that detect MSA faults, here the proposed ATPG method makes use of test  ...  For any given circuit size there exist numerous ATPG algorithms which will detect all the faults i.e. single stuck at faults, also in recent times SAT-Based ATPG methods are used.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.35940/ijitee.k1271.0981119">doi:10.35940/ijitee.k1271.0981119</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/bf6rusjptfefrfargmpkhactk4">fatcat:bf6rusjptfefrfargmpkhactk4</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20220309063427/https://www.ijitee.org/wp-content/uploads/papers/v8i11/K12710981119.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/0f/ba/0fba555718543bd950bb723586dcb5bb0b9fa429.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.35940/ijitee.k1271.0981119"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

Structural heuristics for SAT-based ATPG

Daniel Tille, Stephan Eggersgluss, Hoang M. Le, Rolf Drechsler
<span title="">2009</span> <i title="IEEE"> 2009 17th IFIP International Conference on Very Large Scale Integration (VLSI-SoC) </i> &nbsp;
A major challenge of research in the field of SAT-based ATPG is to obtain a robust algorithm which can solve hard SAT instances reliably without slowing down easy-to-solve SAT instances.  ...  Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed.  ...  SAT-based ATPG To compute a test pattern for a stuck-at fault F , an assignment to the inputs has to be found that guarantees at least one different output value at the correct circuit and the faulty circuit  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/vlsisoc.2009.6041334">doi:10.1109/vlsisoc.2009.6041334</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/aennobkd5zb2pi2tvgao46rieq">fatcat:aennobkd5zb2pi2tvgao46rieq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170809092035/http://www.informatik.uni-bremen.de/agra/doc/konf/2009vlsisoc.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/81/67/81678c41049bae27a66607048f60475c96f6f920.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/vlsisoc.2009.6041334"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools

Yu Zhang, Bei Zhang, Vishwani D. Agrawal
<span title="2014-10-31">2014</span> <i title="Springer Nature"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/dt5ooavfurcrfbcz432scm5wcu" style="color: black;">Journal of electronic testing</a> </i> &nbsp;
usable by a conventional single stuck-at fault test pattern generator.  ...  By adding a few logic gates and one or two modeling flip-flops to the circuit under test (CUT), we create a detection or diagnostic automatic test pattern generation (ATPG) model of transition delay faults  ...  ATPG model where a test for stuck-at fault on y detects the slow-to-rise fault on line xx Fig. 5 5 Simplified single-circuit-copy ATPG model where a test for a stuck-at fault on y detects the transition  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1007/s10836-014-5490-4">doi:10.1007/s10836-014-5490-4</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/pvjhivdrjzc5hiqt3wgzq4jtsi">fatcat:pvjhivdrjzc5hiqt3wgzq4jtsi</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170809021142/http://www.eng.auburn.edu/~agrawvd/TALKS/JETTA/11_Zhang_763-780.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/35/21/3521e00db13b4de02d7ab9d40314fa763b26d312.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1007/s10836-014-5490-4"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> springer.com </button> </a>

Multiple-Fault Diagnosis Based On Adaptive Diagnostic Test Pattern Generation

Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
<span title="">2007</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/rl7xk4fwazdrred2difr6v3lii" style="color: black;">IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems</a> </i> &nbsp;
test pattern, named single-observation single-location-at-a-time (SO-SLAT) pattern.  ...  Given a list of candidate suspects (which could be stuck-at, transition, bridging, or other faults obtained by any existing diagnosis method), we generate a set of SO-SLAT patterns, each of which attempts  ...  For example, for stuck-at fault diagnosis, we can construct a one-time-frame combinational model. A two-to-one MUX is inserted at the location of each stuck-at fault candidate.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcad.2006.884486">doi:10.1109/tcad.2006.884486</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ftjt3m3adzchfixcg7qo65yxca">fatcat:ftjt3m3adzchfixcg7qo65yxca</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170921210856/https://static.aminer.org/pdf/PDF/000/282/179/on_adaptive_diagnostic_test_generation.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/b8/bb/b8bb98f4944241ae3912accb2607b1ffc52c9c86.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcad.2006.884486"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Multiple-Fault Diagnosis Based on Single-Fault Activation and Single-Output Observation

Yung-Chieh Lin, Kwang-Ting Cheng
<span title="">2006</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/qjrrvry5ubgdlarkymvlxuip6m" style="color: black;">Proceedings of the Design Automation &amp; Test in Europe Conference</a> </i> &nbsp;
For a given list of candidate faults, which could be stuck-at, transition, bridging, or other faults, we generate a set of SO-SLAT patterns, each of which attempts to activate only one fault in the list  ...  In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multiple-fault diagnosis resolutions  ...  A SAT-based diagnosis approach [16] leverages the advances in SAT solving engines and cleverly transforms the multiple-fault diagnosis problem into a SAT problem.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/date.2006.243797">doi:10.1109/date.2006.243797</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/date/LinC06.html">dblp:conf/date/LinC06</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/dw225samenbtfhr6sdhzvce2ny">fatcat:dw225samenbtfhr6sdhzvce2ny</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20071120120125/http://www.date-conference.com/conference/proceedings/PAPERS/2006/DATE06/PDFFILES/04C_3.PDF" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/e0/87/e0872011a0798966e14185da93511ae192579dfe.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/date.2006.243797"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Constraint extraction for pseudo-functional scan-based delay testing

Yung-Chieh Lin, Feng Lu, Kai Yang, Kwang-Ting Cheng
<span title="">2005</span> <i title="ACM Press"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/fkjmyf3l45eo5ovjdnpeqpdjd4" style="color: black;">Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC &#39;05</a> </i> &nbsp;
This paper presents a pseudo-functional test methodology that attempts to minimize the over-testing problem of the scan-based circuits for the delay faults.  ...  Along with the functional justification (also called broad-side) test application scheme, the functional constraints are imposed to a commercial delay-fault ATPG tool to generate pseudofunctional delay  ...  Note that, unlike delay faults, there are relatively few ST-FU stuck-at faults due to the high-testability of stuck-at faults.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/1120725.1120797">doi:10.1145/1120725.1120797</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/aspdac/LinLYC05.html">dblp:conf/aspdac/LinLYC05</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/uwap5umn5vgatjpoefq3l35obe">fatcat:uwap5umn5vgatjpoefq3l35obe</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20100706114603/http://cadlab.ece.ucsb.edu/~web_adim/publication/2005/ASP05-1.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/ad/49/ad4984d8d7eec3d7fb06e7da2613b5a9bdf8094e.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/1120725.1120797"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> acm.org </button> </a>

Automatic test pattern generation for delay defects using timed characteristic functions

Shin-Yann Ho, Shuo-Ren Lin, Ko-Lung Yuan, Chien-Yen Kuo, Kuan-Yu Liao, Jie-Hong R. Jiang, Chien-Mo Li
<span title="">2013</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/ffbycmiwjfgqbewnyare6s37ru" style="color: black;">2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)</a> </i> &nbsp;
Experimental results show promising runtime and fault coverage improvements over prior SAT-based timing-aware ATPG methods.  ...  This paper proposes a viable ATPG method based on a satisfiability (SAT) formulation using timed characteristic functions (TCFs), which gained notable scalability enhancement very recently.  ...  For the fault model without specifies the fault size, stuck-at fault test generation tools are often used.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/iccad.2013.6691103">doi:10.1109/iccad.2013.6691103</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/iccad/HoLYKLJL13.html">dblp:conf/iccad/HoLYKLJL13</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/pjn2bzpd75gz5ncxamuqr2yzlq">fatcat:pjn2bzpd75gz5ncxamuqr2yzlq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170810190023/http://alcom.ee.ntu.edu.tw/publications/iccad13-delaytest.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/28/ee/28ee924186785ecb3541c924c4e08cc132bc894c.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/iccad.2013.6691103"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Pseudofunctional testing

Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
<span title="">2006</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/rl7xk4fwazdrred2difr6v3lii" style="color: black;">IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems</a> </i> &nbsp;
This paper presents a pseudofunctional-test methodology that attempts to minimize the overtesting problem of the scan-based circuits in automatic test pattern generation (ATPG) and built-in self-test (  ...  Index Terms-Boolean satisfiability (SAT), built-in self-test (BIST), delay testing, very large scale integration (VLSI) circuit testing. Kwang-Ting (Tim) Cheng (S'88-M'88-SM'98-F'  ...  In general, there exist many ST-FU faults for the harder-to-detect fault models such as delay and signal integrity faults, but fewer for easier-to-detect faults such as stuck-at faults.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcad.2005.857379">doi:10.1109/tcad.2005.857379</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/54o7bn72njhjxdxabwizhnyg2a">fatcat:54o7bn72njhjxdxabwizhnyg2a</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20100706131146/http://cadlab.ece.ucsb.edu/~web_adim/publication/2006/Pesudofunctional%20Testing.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/d3/c0/d3c0f14fe77416ce4d2d5992ddb0958fab0f8a8f.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcad.2005.857379"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Improving Test Pattern Generation with Implication Learning

Liu Xin
<span title="">2011</span> <i title="Elsevier BV"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/2i4dodta3jfcjf5zgk6skuuhwm" style="color: black;">Procedia Environmental Sciences</a> </i> &nbsp;
The CNF formula extractor for the single stuck-at faults (SSF) is detailed in [4] [5] [6] .  ...  An input assignment that differentiates the faulty circuit from the good circuit is a test to detect the fault. Several other SAT-based ATPG approaches were developed later [5, 6] .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1016/j.proenv.2011.12.020">doi:10.1016/j.proenv.2011.12.020</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/mqsepg4hfrbwpmgbnlilmiv34q">fatcat:mqsepg4hfrbwpmgbnlilmiv34q</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20190415171524/https://core.ac.uk/download/pdf/82152987.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/d4/e8/d4e8e0489d6137f9c916ab41764ce8fba818f51e.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1016/j.proenv.2011.12.020"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> elsevier.com </button> </a>

ATPG for Reversible Circuits Using Simulation, Boolean Satisfiability, and Pseudo Boolean Optimization

Robert Wille, Hongyan Zhang, Rolf Drechsler
<span title="">2011</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/k4pq3zhykrd3hdhey2qhybwinu" style="color: black;">2011 IEEE Computer Society Annual Symposium on VLSI</a> </i> &nbsp;
Besides a simulation-based technique, methods based on Boolean satisfiability and pseudo-Boolean optimization are thereby applied.  ...  First physical realizations are already available, motivating the development of efficient testing methods for this kind of circuits.  ...  In one of the first studies [14] , the stuck-at fault model was thereby applied. Later, it was shown that the validity of the stuck-at fault model is limited for reversible circuits [15] .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/isvlsi.2011.77">doi:10.1109/isvlsi.2011.77</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/isvlsi/WilleZD11.html">dblp:conf/isvlsi/WilleZD11</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/qqcos4jyrzcv5lkatqsxyuilua">fatcat:qqcos4jyrzcv5lkatqsxyuilua</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170922003325/http://www.informatik.uni-bremen.de/agra/doc/konf/11_isvlsi_atpg_reversible_circuits_sim_sat_pbo.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/bb/38/bb38ff38f58385a4fa2c850d061bc349d47b1aa2.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/isvlsi.2011.77"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

SAT-based ATPG for Path Delay Faults in Sequential Circuits

S. Eggersgluss, G. Fey, R. Drechsler
<span title="">2007</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/kucxvipvevedfgtsl3pnvxorse" style="color: black;">2007 IEEE International Symposium on Circuits and Systems</a> </i> &nbsp;
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in the last years.  ...  This paper describes an algorithm for generating robust and non-robust tests for PDFs based on Boolean Satisfiability (SAT).  ...  Several SAT-based approaches were presented in the field of ATPG, e.g. [8] for the stuck-at-fault model. For the PDF model, a SAT-based ATPG algorithm for robust tests has been presented in [1] .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/iscas.2007.378639">doi:10.1109/iscas.2007.378639</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/iscas/EggersglussFD07.html">dblp:conf/iscas/EggersglussFD07</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/fxdynpiqibcadnzra6vkzfel5y">fatcat:fxdynpiqibcadnzra6vkzfel5y</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20081206000810/http://www.informatik.uni-bremen.de/agra/doc/konf/07iscas_path_delay.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/6a/a0/6aa050cc8d591a86af7e739d67bee11be28ee372.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/iscas.2007.378639"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>
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