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Robust Automatic Line Scratch Detection in Films

Alasdair Newson, Andres Almansa, Yann Gousseau, Patrick Perez
2014 IEEE Transactions on Image Processing  
We propose a robust and automatic algorithm for frame-by-frame line scratch detection in old films, as well as a temporal algorithm for the filtering of false detections.  ...  Line scratch detection in old films is a particularly challenging problem due to the variable spatio-temporal characteristics of this defect.  ...  Some of the most common defects in films include dust/dirt, blotches, flicker and line scratches.  ... 
doi:10.1109/tip.2014.2300824 pmid:24723525 fatcat:hrdubon4dbe5hhclulsq5x56he

Scratches Removal in Digitised Aerial Photos Concerning Sicilian Territory

E. Ardizzone, H. Dindo, O. Gambino, G. Mazzola
2007 2007 14th International Workshop on Systems, Signals and Image Processing and 6th EURASIP Conference focused on Speech and Image Processing, Multimedia Communications and Services  
Scratch removal is a typical problem for old movie films but similar defects can be seen in still images.  ...  In this paper we propose a fast and effective method to detect and restore scratches in aerial photos from a photographic archive concerning Sicilian territory.  ...  The detected scratch line and the resulted binary mask are shown in fig. 1.d and 1 .e. The method has proven to be robust to noise and suitable for our purposes.  ... 
doi:10.1109/iwssip.2007.4381124 fatcat:cmzv6mvhz5bu7mfpgwyx6yxwtm

Temporal filtering of line scratch detections in degraded films

Alasdair Newson, Andres Almansa, Yann Gousseau, Patrick Perez
2013 2013 IEEE International Conference on Image Processing  
The film defect known as the line scratch is difficult to restore automatically due to the large number of false alarms present in scratch detection algorithms.  ...  We compare our algorithm with two other scratch detection methods from the literature.  ...  Finally, the authors thank Anil Kokaram for his image sequences, which may be found in [14] .  ... 
doi:10.1109/icip.2013.6738842 dblp:conf/icip/NewsonAGP13 fatcat:gj5t75emo5g4df5w65ciypg6yy

Analysis of Historical Artistic Documentaries

Matthias Zeppelzauer, Dalibor Mitrovic, Christian Breiteneder
2008 2008 Ninth International Workshop on Image Analysis for Multimedia Interactive Services  
We propose robust features and a method for shot cut detection for this material that outperforms established techniques.  ...  The paper introduces a novel interdisciplinary project addressing the analysis of historical artistic films. The type of employed material has not been subject to automatic analyses, so far.  ...  In the context of this project, film scientists provide the tasks and requirements for the automatic analysis.  ... 
doi:10.1109/wiamis.2008.11 dblp:conf/wiamis/ZeppelzauerMB08 fatcat:aq2isp3k3ratla7aq3satx47vi

An Approach for Scratch Removal from Digital Image using Image Reconstruction

Md. IqbalQuraishi, Mallike De, Goutam Das, Abhishek Srivastav
2013 International Journal of Computer Applications  
This approach not only detects scratches in an image but also removes them effectively.  ...  To remove these scratches and to generate a perfect noise and scratch free image, a novel method is presented in this paper.  ...  This scratch detection differs from classical approaches in the use of the distribution of the column variance of the grey levels, which allows a more robust detection. O. Kao, J.  ... 
doi:10.5120/10177-4940 fatcat:fs3ts5fxm5a77gxzmm6hup3ubq

Ten Years of Digital Visual Restoration Systems

Anil Kokaram
2007 2007 IEEE International Conference on Image Processing  
This paper reviews the development and impact of Digital Restoration Systems in the broadcast television and film industry over the last ten years.  ...  Some kind of touch-up or restoration is rapidly becoming a "must have" in the visual production cycle.  ...  MISSING DATA: LINE SCRATCHES Another very common form of degradation in film is Line Scratches.  ... 
doi:10.1109/icip.2007.4379939 dblp:conf/icip/Kokaram07 fatcat:46p5v4ytvrf47f2zj6iguqdnym

Novel Framework for Optical Film Defect Detection and Classification

Ngoc Tuyen Le, Jing-Wein Wang, Meng-Hsiang Shi, Chou-Chen Wang
2020 IEEE Access  
To overcome this problem, a novel framework based on machine vision known as the optical film defect detection and classification system is presented for use in the real-time inspection.  ...  INDEX TERMS Optical film, automatic optical inspection, color space, adaptive energy analysis, cross-projection, Kirsch operator, bit-plane slicing, support vector machine.  ...  early in the production line.  ... 
doi:10.1109/access.2020.2982250 fatcat:5idqzxa6wrcufpvwwijzvmqk4i

Automatic movie restoration based on wave atom transform and nonparametric model

Hongteng Xu, Guangtao Zhai, Li Chen, Xiaokang Yang
2012 EURASIP Journal on Advances in Signal Processing  
According to the analysis of the noise, scratches and blotches in the film, we establish a hybrid model for movie signal.  ...  On the other hand, blotch is described as multiplicative noise in the model, which can be restored by a "detecting and inpainting" strategy.  ...  As long as the contact surface between the projector and the film is not clean, scratches will appear in the film during displaying.  ... 
doi:10.1186/1687-6180-2012-132 fatcat:76soprch5zh55j2s6zpl6ps42a

A Digital Motion Picture Restoration System for Film Archives

L. Czuni, A. Hanis, L. Kovacs, B. Kranicz, A. Licsar, T. Sziranyi, I. Kas, G. Kovacs, S. Manno
2004 SMPTE Motion Imaging Journal  
Built-in film cor- rection includes stabilization, de-flicker, blotch detection, scratch removal, de-nois- ing, color manipulation, and de-fade effects.  ...  Shots are detected automatically by cut detection techniques. In the current stage, two types of content-based indexing can be used for find- ing similar shots within or between films.  ... 
doi:10.5594/j16286 fatcat:54tg3jmv4fg4phpdum5hsjkziu

An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses

Chung-Ho Noh, Seok-Lyong Lee, Deok-Hwan Kim, Chin-Wan Chung, Sang-Hee Kim
2009 International Journal of Production Research  
In order to detect these defects, it is essential to use an automated defect inspection system, which is a device used in the final step of the film manufacturing process that extracts defect regions automatically  ...  Our system detects film defects efficiently in a real-time environment with high effectiveness (precision ¼ 1.00, recall ¼ 0.99) without stopping the production line.  ... 
doi:10.1080/00207540903117899 fatcat:o3qmpgvekndyvbcc3egvo3prde

Automated Inspection of Defects in Optical Fiber Connector End Face Using Novel Morphology Approaches

Shuang Mei, Yudan Wang, Guojun Wen, Yang Hu
2018 Sensors  
defects, e.g., dirt, oil, contamination, pits, and chips, and a special model, a "linear enhancement inspector" (LEI), for the detection of scratches.  ...  As far as we know, this is the first time that complete defect detection methods for optical fiber end faces are available in the literature.  ...  Abbreviations The following abbreviations are used in this manuscript: AOI Automatic optical inspection ASM Adaptive segmentation method DO2MR Difference of min-max ranking filtering IEC International  ... 
doi:10.3390/s18051408 pmid:29751501 pmcid:PMC5982614 fatcat:lig3se4hubb3djq32tlnnnvo2i

Quantifying defects in thin films using machine vision

Nina Taherimakhsousi, Benjamin P. MacLeod, Fraser G. L. Parlane, Thomas D. Morrissey, Edward P. Booker, Kevan E. Dettelbach, Curtis P. Berlinguette
2020 npj Computational Materials  
Existing approaches to automatically analyzing film morphologies in optical images require application-specific customization by software experts and are not robust to changes in image content or imaging  ...  This CNN is readily adapted to new thin-film image analysis tasks and will facilitate the use of imaging in automated thin-film research systems. npj Computational Materials (2020) 6:111 ; https://doi.  ...  ACKNOWLEDGEMENTS Brightfield microscopy was performed in the Centre for High-Throughput Phenogenomics at the University of British Columbia, a facility supported by the Canada Foundation for Innovation  ... 
doi:10.1038/s41524-020-00380-w fatcat:nmmgjwwn3zgtzibo2f5soby62a

Characterization of Mold Surface Morphology to Achieve Optimum Scan Yield in a Complex Mark Format

Ernani Padilla, Emmanuel Birog
2019 Zenodo  
Laser technology is the widely used technology in marking semiconductor devices. However, the demand for more data content on marking like 2D code impose a big challenge in marking quality.  ...  parameters, this technical paper however will focus on the study on the correlation effects of mold surface morphology by identifying what surface roughness range that will yield optimum marking quality on an automatic  ...  Our family who serve as my inspiration to persevere in work. We also would like to acknowledge Jun Bernabe our Assy MT for his commitment to support us in the resolution of the problem.  ... 
doi:10.5281/zenodo.3460352 fatcat:jip7nr2kdrbihligfr5jcqp5oy

Digital Restoration Systems: Coping with Reality

A. Kokaram, R. Bornard, A. Rares, D. Sidorov, J. H. Chenot, L. Laborelli, J. Biemond
2003 SMPTE Motion Imaging Journal  
RESTORED VIDEO Motion Estimation || Shake Removal [| Flicker Correction | ee “a g. — DIAGNOSIS Blotch Removal j | Noise Reduction | | | Line Scratch Detection/Removal | x ~ Motion Correction 3 ee Blotch  ...  The same kind of dif- ficulty also arises for other defects such as line scratch- es that can damage the same data across several frames.  ... 
doi:10.5594/j12362 fatcat:rezq2ian6nf2fohmphmixh4kva

Automatic defect inspection for LCDs using singular value decomposition

Chi-Jie Lu, Du-Ming Tsai
2004 The International Journal of Advanced Manufacturing Technology  
In this paper, we propose a global approach for automatic visual inspection of micro defects on TFT panel surfaces.  ...  In the experiments, we have evaluated a variety of micro defects including pinholes, scratches, particles and fingerprints on TFT panel surfaces, and the result reveals that the proposed method is effective  ...  In order to test the robustness of the proposed method, the detection result of a faultless TFT panel surface is also evaluated.  ... 
doi:10.1007/s00170-003-1832-6 fatcat:7xoeqrcnlzcxfdka6ufea6b4ba
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