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Research on the Production Scheduling Method of a Semiconductor Packaging Test Based With the Clustering Method

Zhonghua Han, Quan Zhang, Yongqing Jiang, Bin Duan
<span title="">2019</span> <i title="IGI Global"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/yqoztlitizfgrhkzn43cfvqrme" style="color: black;">International Journal of Information Systems and Supply Chain Management (IJISSCM)</a> </i> &nbsp;
In this article, the scheduling of modern industrial production is studied. The research on scheduling of semiconductor packaging and testing is put forward.  ...  In view of the existing production scheduling theory, there is a big gap to a semiconductor packaging and testing enterprises for the actual research background.  ...  production of semiconductor package testing is extremely diverse, and the varieties are constantly updated and changed.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.4018/ijisscm.2019040103">doi:10.4018/ijisscm.2019040103</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/cewy2woz45gutbvgmreaskjyee">fatcat:cewy2woz45gutbvgmreaskjyee</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20200306213846/http://ir.sia.cn//bitstream/173321/25229/1/Research%20on%20the%20production%20scheduling%20method%20of%20a%20semiconductor%20packaging%20test%20based%20with%20the%20clustering%20method.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/11/5b/115baa3cbf30dbc558271e0ff1f131d7bbe6d7e3.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.4018/ijisscm.2019040103"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

A Review of Data Mining Applications in Semiconductor Manufacturing

Pedro Espadinha-Cruz, Radu Godina, Eduardo M. G. Rodrigues
<span title="2021-02-06">2021</span> <i title="MDPI AG"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/vt2hc3xcijfofb7cwnxv4hhszi" style="color: black;">Processes</a> </i> &nbsp;
The production of semiconductors is a highly complex process, which entails several subprocesses that employ a diverse array of equipment.  ...  The size of the semiconductors signifies a high number of units can be produced, which require huge amounts of data in order to be able to control and improve the semiconductor manufacturing process.  ...  test which estimates number of clusters in advance and separates both convex and non-convex defect clusters at the same time Decision trees, a method merging entropy fuzzy c means (EFCM) with Kernel  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.3390/pr9020305">doi:10.3390/pr9020305</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/jyxg4mt3gvbahnu3snh4i3rxvm">fatcat:jyxg4mt3gvbahnu3snh4i3rxvm</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20210212172639/https://res.mdpi.com/d_attachment/processes/processes-09-00305/article_deploy/processes-09-00305.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/f1/6e/f16e633336fdddf75c1874407e5a920f20827a0f.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.3390/pr9020305"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> mdpi.com </button> </a>

Editorial Introduction To The Special Section On Petri Nets In Semiconductor Manufacturing

Mu Der Jeng, MengChu Zhou
<span title="">1998</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/av4ywtbsqraufjuzm7w67pli4i" style="color: black;">IEEE transactions on semiconductor manufacturing</a> </i> &nbsp;
Zhou has organized and chaired over 40 technical and tutorial sessions and served on program committees for many international and regional conferences. He served as the Program  ...  has published over 110 international journal articles, book chapters, and conference proceeding papers in the above areas. Dr.  ...  BT-BF, for scheduling semiconductor test facility.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tsm.1998.705369">doi:10.1109/tsm.1998.705369</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/da5kwiururginoimspp4sikyqq">fatcat:da5kwiururginoimspp4sikyqq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20190225135259/http://pdfs.semanticscholar.org/6380/2b91e479b582bddbca7f791487c741d36e06.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/63/80/63802b91e479b582bddbca7f791487c741d36e06.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tsm.1998.705369"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Statistical Approach for Cycle Time Estimation in Semiconductor Packaging Factories

W.L. Pearn, Yu-Ting Tai, J.H. Lee
<span title="">2009</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/zizn4tgukvfobmgbqekcexvfka" style="color: black;">IEEE transactions on electronics packaging manufacturing (Print)</a> </i> &nbsp;
We demonstrate the applicability of the proposed cycle time estimation model incorporating the upper confidence bounds by presenting a real-world example taken from a PBGA packaging shop floor in a semiconductor  ...  packaging factory located in the Science-Based Industrial Park in Hsinchu, Taiwan.  ...  In the PBGA packaging shop floor, a job involves two cassettes comprising 20 substrate strips each, which are clustered according to their product types and processed on identical parallel machines.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tepm.2009.2022270">doi:10.1109/tepm.2009.2022270</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ooh2ynyayjhflaqsxjb3fvi244">fatcat:ooh2ynyayjhflaqsxjb3fvi244</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170815124142/https://ir.nctu.edu.tw/bitstream/11536/7032/1/000268039400010.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/ce/20/ce20014e904db7655bccc6b3ddccc96c9c6e7697.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tepm.2009.2022270"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Genetic Algorithm for Job Scheduling with Maintenance Consideration in Semiconductor Manufacturing Process

Seungchul Lee, Jun Ni
<span title="">2012</span> <i title="Hindawi Limited"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/wpareqynwbgqdfodcyhh36aqaq" style="color: black;">Mathematical Problems in Engineering</a> </i> &nbsp;
This paper presents wafer sequencing problems considering perceived chamber conditions and maintenance activities in a single cluster tool through the simulation-based optimization method.  ...  We develop optimization methods which would lead to the best wafer release policy in the chamber tool to maximize the overall yield of the wafers in semiconductor manufacturing system.  ...  Acknowledgments This work is partially supported by the Industry/University Cooperative Research for Intelligent Maintenance Systems NSF Grant no. 0639468 and Semiconductor Research Corporation SRC Task  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1155/2012/875641">doi:10.1155/2012/875641</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/4qprhrfccnhnvhkc5qnxuo2sni">fatcat:4qprhrfccnhnvhkc5qnxuo2sni</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170813165153/http://scholarworks.unist.ac.kr/bitstream/201301/8372/1/2-s2.0-84870183956.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/16/35/16353dc793b4fce2ec6ced53f828eebe03fb6bd3.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1155/2012/875641"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> hindawi.com </button> </a>

Using Partial Combination Models to Improve Prediction Quality and Transparency in Mixed Datasets

Yi-Hsin Wu, Yu-Hsin Chang, Yin-Jing Tien, Cheng-Juei Yu, Sheng-De Wang, Cheng-Hung Wu
<span title="">2020</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/q7qi7j4ckfac7ehf3mjbso4hne" style="color: black;">IEEE Access</a> </i> &nbsp;
Numerical results demonstrate the potential of the model selection approach in a mixed dataset from a semiconductor manufacturer.  ...  Moreover, the proposed model selection approach is compatible with other regression or ML prediction methods and can be used to improve the model's transparency of any existing methods on mixed datasets  ...  To overcome such issues, this study improves prediction quality based on the satisfactory performance of modern ML packages.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/access.2020.3008475">doi:10.1109/access.2020.3008475</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ylqbjd2g7rao5pu5wp6apreqjq">fatcat:ylqbjd2g7rao5pu5wp6apreqjq</a> </span>
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A Review Of Related Work On Machine Learning In Semiconductor Manufacturing And Assembly Lines

Darko Stanisavljevic, Michael Spitzer
<span title="2017-02-15">2017</span> <i title="Zenodo"> Zenodo </i> &nbsp;
The areas of interest of this paper are semiconductor manufacturing and production on assembly lines.  ...  Manufacturing is the production of merchandise by manual labour, machines and tools. The focus of this paper is on automatic production lines.  ...  , putting the integrated circuit into the package in order to produce ready to use product and testing.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.5281/zenodo.495135">doi:10.5281/zenodo.495135</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/nktnniflsbfanczl6lz4kzxena">fatcat:nktnniflsbfanczl6lz4kzxena</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20220202033746/https://zenodo.org/record/495135/files/A%20Review%20of%20Related%20Work%20on%20Machine%20Learning%20in%20Semiconductor%20Manufacturing%20and%20Assembly%20Lines.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/3c/24/3c241c3a94fdd81b2dc2ca497d73465cf01e050f.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.5281/zenodo.495135"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> zenodo.org </button> </a>

On the corrupting influence of variability in semiconductor manufacturing

Alexander K. Schoemig
<span title="">1999</span> <i title="ACM Press"> Proceedings of the 31st conference on Winter simulation Simulation---a bridge to the future - WSC &#39;99 </i> &nbsp;
This paper describes two simulation experiments using a model of a real medium sized multi-product semiconductor chip fabrication facility.  ...  The immediate conclusion out of the results is that reducing the inherent variability of a manufacturing system improves the overall system performance.  ...  In this study we do not consider wafer test, packaging/assembly, and final test.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/324138.324532">doi:10.1145/324138.324532</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ypgquyonpzhf3hvqk6cmpferce">fatcat:ypgquyonpzhf3hvqk6cmpferce</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170706113017/http://www.informs-sim.org/wsc99papers/121.PDF" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/74/7f/747fb234e32a9ffb8c72fae7364fc4be61bbdcea.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/324138.324532"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> acm.org </button> </a>

Data mining in manufacturing: a review based on the kind of knowledge

A. K. Choudhary, J. A. Harding, M. K. Tiwari
<span title="2008-07-15">2008</span> <i title="Springer Nature"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/l5t2k3nljjfgffyvysjiwytjae" style="color: black;">Journal of Intelligent Manufacturing</a> </i> &nbsp;
This paper reviews the literature dealing with knowledge discovery and data mining applications in the broad domain of manufacturing with an special emphasis on the type of functions to be performed on  ...  A novel text mining approach has also been applied to the abstracts and keywords of 150 identified literatures to identify the research gaps and find the linkages between knowledge area, knowledge type  ...  He made a proposal to extend these tools to improvement of reliability of products during wafer fabrication, packaging and final testing steps.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1007/s10845-008-0145-x">doi:10.1007/s10845-008-0145-x</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/rt4aytttffhe3fl7memlodiysa">fatcat:rt4aytttffhe3fl7memlodiysa</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20190305044038/https://core.ac.uk/download/pdf/8791333.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/2b/87/2b87cd9c2c8a127c1dca7f6f3ca45aba8a8ebe0e.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1007/s10845-008-0145-x"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> springer.com </button> </a>

Operational planning and control of semiconductor wafer production

J. N. D. Gupta, R. Ruiz, J. W. Fowler, S. J. Mason
<span title="">2006</span> <i title="Informa UK Limited"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/upxmfaq5rndnjht5qhlbvmqcqa" style="color: black;">Production planning &amp; control (Print)</a> </i> &nbsp;
This paper provides a glimpse into the evolution of the operational planning and control problems in semiconductor wafer production and possible approaches for their solution.  ...  The paper concludes with some fruitful directions for future research.  ...  Professor Stephen Childe, Editor-in-Chief of the Production Planning & Control journal originally invited one of the guest editors (Jatinder Gupta) to edit this special issue.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1080/09537280600900733">doi:10.1080/09537280600900733</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/wevunmvvubasfeql66bytsmeaq">fatcat:wevunmvvubasfeql66bytsmeaq</a> </span>
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A case study on the multistage IC final testing scheduling problem with reentry

W.L. Pearn, S.H. Chung, A.Y. Chen, M.H. Yang
<span title="">2004</span> <i title="Elsevier BV"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/g3swg5xvjjbr3mbsu5d4kdvvoa" style="color: black;">International Journal of Production Economics</a> </i> &nbsp;
The integrated-circuit final testing scheduling problem (ICFTSP) with reentry is a variation of the complex flow-shop scheduling problem, which is also a generalization of the classical reentrant flow  ...  In this paper, we present a case study on the ICFTSP with reentry, which is taken from a final testing shop floor in an integrated circuit manufacturing factory.  ...  Acknowledgements The authors would like to thank the anonymous referees for their helpful comments, which significantly improved the paper.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1016/s0925-5273(03)00186-5">doi:10.1016/s0925-5273(03)00186-5</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/kauradkit5gofmm4fulv2xu4x4">fatcat:kauradkit5gofmm4fulv2xu4x4</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170814163908/https://ir.nctu.edu.tw/bitstream/11536/26866/1/000220907500003.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/b1/1c/b11cfa51a85b37f2a5d70a54d0aed6e6f2eacceb.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1016/s0925-5273(03)00186-5"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> elsevier.com </button> </a>

Production Scheduling in Complex Job Shops from an Industrie 4.0 Perspective: A Review and Challenges in the Semiconductor Industry

Bernd Waschneck, Thomas Bauernhansl, Thomas Altenmüller, Andreas Kyek
<span title="2017-04-05">2017</span> <i title="Zenodo"> Zenodo </i> &nbsp;
On the other hand, production scheduling in a Complex Job Shop (CJS) environment, such as wafer fabrication facilities, has drawn interest of researchers dating back to the 1950s [65, 18].  ...  Based on the literature review, the authors' experience in the semiconductor industry and feedback and discussions with industry experts, this paper identies challenges in production control.  ...  ACKNOWLEDGEMENTS The authors would like to thank Norman Schmitz and the team from Elmos Semiconductor AG for the feedback and comments on industry challenges.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.5281/zenodo.495155">doi:10.5281/zenodo.495155</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/5yte6zygabc65clmevycufluma">fatcat:5yte6zygabc65clmevycufluma</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20201228192706/https://zenodo.org/record/495155/files/Production%20Scheduling%20in%20Complex%20Job%20Shops%20from%20an%20Industrie%204.0%20Perspective_A%20review%20and%20Challenges%20in%20the%20Semiconductor%20Industry.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/0e/46/0e468d978f1753d35e2372b5ddb255650b8dca51.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.5281/zenodo.495155"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> zenodo.org </button> </a>

Page 980 of Psychological Abstracts Vol. 64, Issue 5 [page]

<span title="">1980</span> <i title="American Psychological Association"> <a target="_blank" rel="noopener" href="https://archive.org/details/pub_psychological-abstracts" style="color: black;">Psychological Abstracts </a> </i> &nbsp;
—Calculates estimates of the product-moment correlation based on the polychoric series and on maximum likelihood.  ...  The BC TRY system of cluster and factor analysis includes many of the same descriptive and multivariate statistical analyses accomplished by the best of the packages reviewed by R. A.  ... 
<span class="external-identifiers"> </span>
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Predictive Models for Equipment Fault Detection in the Semiconductor Manufacturing Process

Sathyan Munirathinam, Balakrishnan Ramadoss
<span title="">2016</span> <i title="IACSIT Press"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/3zatj3ngx5g7ho7ki6fvv35s7m" style="color: black;">International Journal of Engineering and Technology</a> </i> &nbsp;
Semiconductor manufacturing is one of the most technologically and highly complicated manufacturing processes.  ...  process of the semiconductor industries.  ...  onto the raw bare silicon wafers, assembly by putting the integrated circuit inside a package to form a ready-to-use product, and testing of the finished products.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.7763/ijet.2016.v6.898">doi:10.7763/ijet.2016.v6.898</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/m5atpgota5fa3ennvinkucv6zy">fatcat:m5atpgota5fa3ennvinkucv6zy</a> </span>
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Predictive Models for Equipment Fault Detection in the Semiconductor Manufacturing Process

Sathyan Munirathinam, Balakrishnan Ramadoss
<span title="">2016</span> <i title="IACSIT Press"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/3zatj3ngx5g7ho7ki6fvv35s7m" style="color: black;">International Journal of Engineering and Technology</a> </i> &nbsp;
Semiconductor manufacturing is one of the most technologically and highly complicated manufacturing processes.  ...  process of the semiconductor industries.  ...  onto the raw bare silicon wafers, assembly by putting the integrated circuit inside a package to form a ready-to-use product, and testing of the finished products.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.7763/ijet.2016.v8.898">doi:10.7763/ijet.2016.v8.898</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/qrh2yg34ynhnba2s7nnbq2lhe4">fatcat:qrh2yg34ynhnba2s7nnbq2lhe4</a> </span>
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