1,143 Hits in 9.8 sec

Real-time Sub-pixel Cross Bar Position Metrology

D. Rivero, M. Paindavoine, S. Petit
2002 Real-time imaging  
The system we developed and that we present in this paper is an embedded system that measures cross bar positions with sub-pixel accuracy on 1024 Â 1024 pixel images delivered by a camera at a 50 MHz data  ...  rate in real time.  ...  Sub-pixel Cross Bar Position Metrology Algorithm Figure 1 describes the measurement system which uses a 1024 Â 1024 CCD camera in order to accomplish TV screen adjustments.  ... 
doi:10.1006/rtim.2001.0259 fatcat:bar6epccmzeyje7s4ve27x6y4y

Advances in Modeling of Scanning Charged-Particle-Microscopy Images [article]

Petr Cizmar, Andras E. Vladar, Michael T. Postek
2010 arXiv   pre-print
Modeled artificial images are highly useful in the evaluation of new imaging and metrological techniques, like image-sharpness calculation, or drift-corrected image composition (DCIC).  ...  The intensity function is a superposition of a real signal and noise: ξ( r, t) = ξ s ( r) + ξ n (t), (10) where ξ s is the position-dependent real signal and ξ n is the time-dependent noise. ξ n is a superposition  ...  The dependence on blur indicates that the sub-pixel accuracy is sustained up to σ b = 14.  ... 
arXiv:1006.0171v1 fatcat:bnnmevov6nhljggo5dejqxzzru

Fast and accurate metrology of multi-layered ceramic materials by an automated boundary detection algorithm developed for optical coherence tomography data

Peter Ekberg, Rong Su, Ernest W. Chang, Seok Hyun Yun, Lars Mattsson
2014 Optical Society of America. Journal A: Optics, Image Science, and Vision  
Optical coherence tomography (OCT) is useful for materials defect analysis and inspection with the additional possibility of quantitative dimensional metrology.  ...  The samples are positioned under the OCT probe to get cross-sectional B-scan images.  ...  The top surfaces are extracted using the described algorithm with sub-pixel precision, and represented by many small crosses.  ... 
doi:10.1364/josaa.31.000217 pmid:24562018 pmcid:PMC4092166 fatcat:mp2mgc5e5rgvlaqo7fazic3vwy

Observation of spatial quantum correlations in the macroscopic regime

Ashok Kumar, Hayden Nunley, A. M. Marino
2017 Physical Review A  
In particular, the ability to observe these spatial quantum correlations in a single shot will enable such enhancements in applications that require real time imaging, such as particle tracking and in-situ  ...  This makes bright twin-beams ideal for real-time imaging applications.  ...  While these initial experiments provided an indication that spatial quantum correlations can lead to significant enhancements, many applications in quantum imaging and quantum metrology require real time  ... 
doi:10.1103/physreva.95.053849 fatcat:speed2gijzbmbbfyaprx6hg64u

Fast and accurate: high-speed metrological large-range AFM for surface and nanometrology

Gaoliang Dai, Ludger Koenders, Jens Fluegge, Matthias Hemmleb
2018 Measurement science and technology  
LR-AFM significantly reduces the measurement time while maintains (or even improves) the metrological performance than the previous Met.  ...  The AFM output signal is combined with the position readouts of the piezo stage and the NMM to derive the surface topography.  ...  After the bending and torsion of the cantilever is detected and demodulated, a real-time signal zc(t) representing the tip sample distance is obtained.  ... 
doi:10.1088/1361-6501/aaaf8a fatcat:nw7kgudcyfgb3lzvfbocsns4qu

External visual interface for a Nikon 6D autocollimator

Guillermo Bergues, Guillermo Ames, Luis Canali, Clemar Schurrer, Ana Georgina Flesia
2014 2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings  
This example shows that the value of 0.02 pixels for the uncertainty associated with sub-pixel position of reticle lines is realistic, allowing for continue working on a robust interface for all angle  ...  The whole system is used to analyze the reticle image to detect both the scale and the measuring crosshair lines at sub-pixel level.  ...  Centroids of these functions allow to determine the position of each line of the scale with sub-pixel resolution.  ... 
doi:10.1109/i2mtc.2014.6860518 dblp:conf/i2mtc/BerguesACSF14 fatcat:5kicjb675fhhbixoic7odalosm

Anomaly detection in random circuit patterns using autoencoder

Hiroshi Fukuda, Tsuyoshi Kondo
2021 Journal of Micro/Nanopatterning, Materials, and Metrology  
shorter than the typical image acquisition time of SEMs.  ...  Approach: We decompose SEM images into small sub-images and apply an identical autoencoder to each of them to detect anomalies.  ...  pixel in a sub-image and corresponding output intensity I out ðiÞ divided by the total pixel number n pxl in a sub-image as shown in Fig. 1 ).  ... 
doi:10.1117/1.jmm.20.4.044001 fatcat:5zdpkuqhqvhsxcyxkhubdvdfle

Real-Time Detection Method for Center and Attitude Precise Positioning of Cross Laser-Pattern

Haopeng Li, Zurong Qiu, Haodan Jiang
2021 Applied Sciences  
To improve the real-time performance of the algorithm, the four cross laser edge pixels are obtained by line search, and then fitted by least square.  ...  processing speed is better than 0.1 s, which meets the real-time requirements of the project.  ...  Besides, it cannot meet the cross-attitude positioning requirements. Dong Dai et al. [16] proposed a sub-pixel cross microscopic image positioning algorithm based on Hough transform.  ... 
doi:10.3390/app11209362 fatcat:y5nbbb43hnba3i5iu4o7r5dp6u

Metrological and Critical Characterization of the Intel D415 Stereo Depth Camera

Monica Carfagni, Rocco Furferi, Lapo Governi, Chiara Santarelli, Michaela Servi, Francesca Uccheddu, Yary Volpe
2019 Sensors  
Given the unexplored potential of this new device, especially when used as a 3D scanner, the present work aims to characterize and to provide metrological considerations for the RealSense D415.  ...  The RealSense Vision D4 is a vision processor based on 28-nanometer (nm) process technology for real-time calculation of stereo depth data.  ...  The RealSense Vision D4 is a vision processor based on 28nanometer (nm) process technology for real-time calculation of stereo depth data.  ... 
doi:10.3390/s19030489 fatcat:7uu5jezpzrfltfxvhkwnp4lnpi

Gaia on-board metrology: basic angle and best focus [article]

A. Mora, M. Biermann, A.G.A. Brown, D. Busonero, L. Carminati, J.M. Carrasco, F. Chassat, M. Erdmann, W.L.M. Gielesen, C. Jordi, D. Katz, R. Kohley (+12 others)
2014 arXiv   pre-print
Dedicated metrology instruments are, however, required to carry out two functions: monitoring the basic angle and refocusing the telescope.  ...  The amplitude goes from the pixel level (∼50 mas) to sub-mas.  ...  The dependence on sub-pixel stellar location and colour is also small.  ... 
arXiv:1407.3729v1 fatcat:t3omkecrm5bflcvhqsdxwkgbxa

A detector interferometric calibration experiment for high precision astrometry

A. Crouzier, F. Malbet, F. Henault, A. Léger, C. Cara, J. M. LeDuigou, O. Preis, P. Kern, A. Delboulbe, G. Martin, P. Feautrier, E. Stadler (+14 others)
2016 Astronomy and Astrophysics  
Results: The calibration system yielded the pixel positions to an accuracy estimated at 4e-4 pixel.  ...  The Young fringes were parametrized as products of time and space dependent functions, based on various pixel parameters.  ...  the metrology sub-section.  ... 
doi:10.1051/0004-6361/201526321 fatcat:leytter6nbdldfnrrqei5famuu

Bringing optical metrology to testing and inspection activities in civil engineering

Luis Martins, Álvaro Ribeiro, Maria Do Céu Almeida, João Alves e Sousa
<p class="Abstract">Optical metrology has an increasing impact on observation and experimental activities in Civil Engineering, contributing to the Research and development of innovative, non-invasive  ...  ., in sub-nanometer interferometry and scanning microscopy.  ...  Hydraulic experimental activities are frequently carried out in a dynamic regime; however, conventional invasive instrumentation is often unsuitable for real-time observations, making these experiments  ... 
doi:10.21014/acta_imeko.v10i3.1059 fatcat:bpxt5i43tjeqdns6n4iivncssm

High precision astrometry mission for the detection and characterization of nearby habitable planetary systems with the Nearby Earth Astrometric Telescope (NEAT)

Fabien Malbet, Alain Léger, Michael Shao, Renaud Goullioud, Pierre-Olivier Lagage, Anthony G. A. Brown, Christophe Cara, Gilles Durand, Carlos Eiroa, Philippe Feautrier, Björn Jakobsson, Emmanuel Hinglais (+40 others)
2011 Experimental astronomy (Print)  
The remaining time might be allocated to improve the characterization of the architecture of selected planetary systems around nearby targets of specific interest (low-mass stars, young stars, etc.) discovered  ...  off-axis parabola single-mirror telescope, a detector with a large field of view made of small movable CCDs located around a fixed central CCD, and an interferometric calibration system originating from metrology  ...  Inter-pixel response variations exist in real CCDs, which we calibrate by measuring the pixel response of each pixel in Fourier space 11 .  ... 
doi:10.1007/s10686-011-9246-1 fatcat:im5rvse63jb25lwrno64eqfj3e

Can we get 3D-CD metrology right?

András E. Vladár, Petr Cizmar, John S. Villarrubia, Michael T. Postek, Alexander Starikov
2012 Metrology, Inspection, and Process Control for Microlithography XXVI  
This includes modeling and compensation for various errors in the lithography process down to sub-nanometer, essentially atomic levels.  ...  metrology tool.  ...  The 5 nm by 50 nm size bar helps to assess the size of the various sample features, some of the smallest ones are less than 5 nm is size, meaning even details of sub-ten nm size features can be imaged,  ... 
doi:10.1117/12.916537 fatcat:dbyph73q3rhwneqdkk427lnhhu

Development of a transparent optical telescope for absolute positioning with respect to a reference laser beam

J.-Ch. Barriere, O. Cloue, C. Guyot, P. Ponsot, J.-C. Saudemont, J.-P. Schuller, Phillippe Schune, S. Sube, Hans J. Tiziani, Pramod K. Rastogi
1999 Laser Metrology and Inspection  
We have developed an optical system which permits the absolute positioning of an element with respect to a reference laser beam.  ...  We have chosen remote driven pixel CCDs in order to control time exposure, clock speed transfer and real spatial sampling. A special VME electronic board has been designed for this application.  ...  The relative positioning of the bars is done via a laser beam and transparent telescope precisely mounted on the bars.  ... 
doi:10.1117/12.360991 fatcat:dvpacfedora5fpknx4we54slvy
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