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Simplified Reliable Online Essay Test Marking for Massive Open Online Course (MOOC) using Rasch Model Analysis

Mohdnor Mohd, Zawawi Temyati, Siti Fatahiyah Mahamood, Hanifah Musa
2018 Social and Management Research Journal  
This procedurecontains measuring score of accurate student's ability in LOGIT unit,providing of student's result profile, and measuring reliability of the testset and the student's answers.  ...  The procedure is designed for massive openonline learning and paperless essay-based test which is more difficult tobe analysed.  ...  In our current practice, the reliability of question paper and student's answers are seldom checked or analysed.  ... 
doi:10.24191/smrj.v15i2.4968 fatcat:lvlvpmwymvb6vouwrfmk3cc6ny

HANDS

Davide Zoni, Simone Corbetta, William Fornaciari
2012 Proceedings of the 2012 ACM/IEEE international symposium on Low power electronics and design - ISLPED '12  
In current multi-core scenario, Networks-on-Chip (NoC) represent a suitable choice to face the increasing communication and performance requirements, however introducing additional design challenges to  ...  We present the Heterogeneous Architectures and Networks-on-Chip Design and Simulation framework for large-scale highperformance computer simulation, integrating performance, power, thermal and reliability  ...  The flexibility of the proposed work allows to perform accurate and detailed joint analysis on power, performance, thermal and reliability metrics.  ... 
doi:10.1145/2333660.2333721 dblp:conf/islped/ZoniCF12 fatcat:6amhn54rubfbblq57kalvntio4

Design and analysis of the reference cells for STT-MRAM

Li Zhang, Weisheng Zhao, Yiqi Zhuang, Junlin Bao, Hualian Tang, Cong Li, Xin Xiang
2013 IEICE Electronics Express  
By using an accurate compact model of STT-MRAM cell, we analyze and compare their performances in terms of power, reliability and area.  ...  This letter presents three designs of reference cell for STT-MRAM sensing.  ...  Acknowledgments The authors wish to acknowledge support from "the Wide band gap semiconductor and Micro/Nano Electronics 111 project" of Xidian Univ. and support from "the Fundamental Research Funds for  ... 
doi:10.1587/elex.10.20130352 fatcat:t665bfaj3va4beszw7gy4slmma

CONCEPT OF ALLOWABLE LOAD SET AND ITS APPLICATION FOR EVALUATION OF STRUCTURAL INTEGRITY*

Byung Man Kwak, Jae Hyun Kim
2002 Mechanics of structures and machines (Print)  
This paper presents an efficient technique to estimate the load tolerance, which shows a capacity of the current design, a future reference for design upgrade, maintenance and control.  ...  When the relationship between the reliability measure of the system and applied loads is linear or mildly nonlinear, a linear assumption turns out to be accurate and effective.  ...  This paper presents an efficient technique to estimate the load tolerance, which shows a capacity of the current design, a future reference for design upgrade, maintenance and control.  ... 
doi:10.1081/sme-120003017 fatcat:zqaiucd47jbq3gafvrgxcratta

Power, Thermal, and Reliability Modeling in Nanometer-Scale Microprocessors

D. Brooks, R.P. Dick, R. Joseph, Li Shang
2007 IEEE Micro  
Acknowledgments This work was supported in part by the US National Science Foundation under awards CCF-0048313 and CNS-0347941, in part by Intel, in part by IBM, and in part by the Natural Sciences and  ...  Engineering Research Council of Canada under Discovery Grant 388694-01.  ...  The circuits on highperformance chips place stringent demands on the power delivery infrastructure responsible for satisfying current demands and maintaining reference voltages.  ... 
doi:10.1109/mm.2007.58 fatcat:gebuecbksrgthitqhcvrd2mp2e

A New SPICE Reliability Simulation Method for Deep Submicrometer CMOS VLSI Circuits

X. Li, J. Qin, B. Huang, X. Zhang, J.B. Bernstein
2006 IEEE transactions on device and materials reliability  
These tools are able to accurately simulate the device's wearout process and predict its impact on the circuit performance.  ...  These advantages will allow the circuit designers to perform a quick and efficient circuit reliability analysis and to develop practical guidelines for reliable electronic designs.  ...  ACKNOWLEDGMENT The authors would like to thank the reviewers and the editors of this paper for their insightful comments and practical suggestions on this work.  ... 
doi:10.1109/tdmr.2006.876572 fatcat:wadkzglzi5a4rc73wo7cmthsge

"CT Angiography Source-Images and CT Perfusion: Are They Complementary Tools for Ischemic Stroke Evaluation?"

José Eduardo Alves, Ângelo Carneiro, João Xavier
2014 The Neuroradiology Journal  
CTA-SI) but the accurate delineation of the ischaemic penumbra.  ...  Finally, we feel that, nowadays, the main challenge in the initial evaluation of acute ischaemic stroke patients is not the assessment of the ischaemic core (which can reliably be done by DWI, CTP and  ...  CTA-SI) but the accurate delineation of the ischaemic penumbra.  ... 
doi:10.15274/nrj-2014-10044 pmid:25207915 pmcid:PMC4187447 fatcat:haivrxnrubek3awthpigeouv5y

Page 354 of AJR, American Journal of Roentgenology Vol. 38, Issue 2 [page]

1937 AJR, American Journal of Roentgenology  
Filtering by a film of tungsten and/or copper on the tube wall vaporized from overloading the target. Tube design with reference to the relationship of saturation voltage at various current loads.  ...  Thus if one has a good mil- liammeter of proper type and accurate calibration mounted close to the roentgen tube, he may be assured that many of the differences caused by high tension current losses are  ... 

Page 354 of AJR, American Journal of Roentgenology Vol. 38, Issue 2 [page]

1937 AJR, American Journal of Roentgenology  
Filtering by a film of tungsten and /or copper on the tube wall vaporized from overloading the target. Tube design with reference to the relationship of saturation voltage at various current loads.  ...  Thus if one has a good mil- liammeter of proper type and accurate calibration mounted close to the roentgen tube, he may be assured that many of the differences caused by high tension current losses are  ... 

Physics-based numerical simulation for design of high-voltage, extremely-high current density SiC power devices

Leonardo M. Hillkirk, Allen R. Hefner, Robert W. Dutton
2007 2007 International Semiconductor Device Research Symposium  
of voltage and current at turn-on, and the extremely high current density gradients (Fig. 3 b) .  ...  Reduction of reverse recovery time and peak current in SiC PiN power diodes are essential to decrease power losses and to improve reliability for the diode and the complementary switching device, as well  ...  of voltage and current at turn-on, and the extremely high current density gradients (Fig. 3 b) .  ... 
doi:10.1109/isdrs.2007.4422305 fatcat:pkpnng5cf5abjj43ezbwa24dai

A System-Level Methodology for the Design of Reliable Low-Power Wireless Sensor Networks

Oussama Brini, Dominic Deslandes, Frederic Nabki
2019 Sensors  
In the process of building a SN and in the absence of a clear and well-rounded methodology, the designer can easily make unfounded and suboptimal decisions about the right hardware components, their configuration  ...  In this paper, a methodology to design, configure, and deploy a reliable ultra-low power WSNs is proposed.  ...  Conflicts of Interest: The authors declare no conflict of interest.  ... 
doi:10.3390/s19081800 fatcat:43vrfvqobzfxnio7ikiucdtkqq

Reliability of the Structured Clinical Interview for DSM-5 Sleep Disorders Module

Daniel J. Taylor, Allison K. Wilkerson, Kristi E. Pruiksma, Jacob M. Williams, Camilo J. Ruggero, Willie Hale, Jim Mintz, Katherine Marczyk Organek, Karin L. Nicholson, Brett T. Litz, Stacey Young-McCaughan, Katherine A. Dondanville (+3 others)
2018 Journal of Clinical Sleep Medicine (JCSM)  
Methods: The SCISD was designed to be a brief, reliable, and valid interview assessment of adult sleep disorders as defined by the DSM-5.  ...  /ct2/show/NCT01549899 on behalf of the STRONG STAR Consortium.  ...  Similar to the IIS, reliability and validity of the Duke SIS was never established, and it, too, is based on outdated diagnostic criteria.  ... 
doi:10.5664/jcsm.7000 pmid:29458705 pmcid:PMC5837848 fatcat:kueviv75czgifg4e2z3bbwf3xu

Ultra stable semiconductor laser current source

Francoys Aubee, Martin Quenneville, Martin Chamberland, John Tessitore
2006 2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference  
This paper presents the design and assessment of performance.  ...  Life-test for high reliability laser pumps demands highly stable current sources. Telops has engineered a novel current source that meets stabilities of 200 ppm/1000hr.  ...  The listed requirements are those mandatory to make the difference between accurate long term aging analysis of a pump laser versus the effect of the current variation on the associated optical power.  ... 
doi:10.1109/cleo.2006.4628848 fatcat:pisu4hzasbgf7jo5mgfrcmk7dm

Toward reliable and accurate evaluation of polymer solar cells based on low band gap polymers

Long Ye, Chengyue Zhou, Haifeng Meng, Heng-Hsin Wu, Chi-Ching Lin, Hua-Hsien Liao, Shaoqing Zhang, Jianhui Hou
2015 Journal of Materials Chemistry C  
To accurately evaluate the power conversion efficiencies, a general set of procedures were provided for low band gap polymers.  ...  Acknowledgements The authors would like to acknowledge the nancial support Notes and references  ...  Conclusions In the current work, we have focused on the accurate measurements of PSCs based on some of the most efficient and well-known LBG polymers such as PDPP3T, PSBTBT, PBDTTPD and PTB7-Th, and a  ... 
doi:10.1039/c4tc02449d fatcat:xcb4a4zu5ncwvfg6mvsbhxvifi

On-state voltage drop based power limit detection of IGBT inverters

Ionut Trintis, Pramod Ghimire, Stig Munk-Nielsen, Bjorn Rannestad
2015 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe)  
Conclusions A power converter with on-state voltage measurement of power devices was designed and tested.  ...  Furthermore, a long term reliability test is under investigation to increase the viability of the proposed method.  ...  Adjusting the current and power factor references the test can emulate the operation in any of the four quadrants.  ... 
doi:10.1109/epe.2015.7311673 fatcat:whwb2oz6unbixhgdlxnm3snv4m
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