144,294 Hits in 7.4 sec

Module size distribution and defect density

Y.K. Malaiya, J. Denton
Proceedings 11th International Symposium on Software Reliability Engineering. ISSRE 2000  
We examine the available data sets and propose a model relating module size and defect density.  ...  Does the overall defect density of a software project vary with its module size distribution?  ...  Since we know both the module size distribution and the dependence of defect density on module size, we can calculate the total number of defects N given by the following equation.  ... 
doi:10.1109/issre.2000.885861 dblp:conf/issre/MalaiyaD00 fatcat:lqm7oisrbjavxb3cfer7wor5p4

An Improved Approach for Reduction of Defect Density Using Optimal Module Sizes

Dinesh Verma, Shishir Kumar
2014 Advances in Software Engineering  
The defect density can be optimized by effective distribution of size of modules.  ...  This relationship could be used for optimization of overall defect density using an effective distribution of modules sizes.  ...  the effect of module size distribution of the overall defect density.  ... 
doi:10.1155/2014/803530 fatcat:iirnhblucjeyrkvevfd63lc4ra

On the effect of floorplanning on the yield of large area integrated circuits

Z. Koren, I. Koren
1997 IEEE Transactions on Very Large Scale Integration (vlsi) Systems  
We study several general floorplan structures, make some specific recommendations, and apply them to actual VLSI chips.  ...  Let the number of defects have a medium-area distribution with an average of defects per module, a clustering parameter of (per block), and a block size of two modules.  ...  Assuming that is a random variable with a density function, i.e., (4) and integrating (3) with respect to this density yields no defects in an area of size (5) which corresponds to the large-area distribution  ... 
doi:10.1109/92.555982 fatcat:t3hcugsofnbu3kqo4gwndiz6ue

Defect tolerance in VLSI circuits: techniques and yield analysis

I. Koren, Z. Koren
1998 Proceedings of the IEEE  
However, imperfections in the fabrication process result in yield-reducing manufacturing defects, whose severity grows proportionally with the size and density of the chip.  ...  This paper reviews the currently used statistical yield-prediction models and their application to defect-tolerant designs.  ...  ., the densities and the size distributions of the different types of defects in the various layers of the layout.  ... 
doi:10.1109/5.705525 fatcat:h5h2ubz3jvaztc7jp46rauinbe

An integrated framework for yield management and defect/fault reduction

C. Weber, B. Moslehi, M. Dutta
1995 IEEE transactions on semiconductor manufacturing  
and manufacturing activities  ...  Crossfunctional teams of process, equipment, operations, and materials personnel proactively explore this space, and provide process engineers with a stable and capable environment for process development  ...  Special recognition goes to Patrick Chang and Jeff Rosner for their leadership role in establishing module focus  ... 
doi:10.1109/66.382274 fatcat:j4pa44jnu5fsdkznzsqdyjx2ny

Evaluating damage in optical elements using an amplified spontaneous emission beam

Qiong Zhou, Jiangfeng Wang, Yajing Guo, Dean Liu, Jianqiang Zhu
2015 High Power Laser Science and Engineering  
Furthermore, the ASE beam has great potential for the detection of defects over a large area and the conditioning of optical elements.  ...  Small-scale intensity modulations can be smoothed out rapidly within the time of a pulse width.  ...  But the beam size is very small. When a 1-to-1 test is used, there is a clear dependence on the beam size, and not all the defects are revealed [5] .  ... 
doi:10.1017/hpl.2015.31 fatcat:jsu5nqyc2fhjtfmzaoy2zar27q

Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs

Mangir, Avizienis
1982 IEEE transactions on computers  
A mathematical model for yield is developed, and the effects of interconnect densities and logic module complexities in yield improvement are investigated for regularly designed VLSI circuits.  ...  The chip contains redundant modules which can be substituted for flawed modules at the probe testing stage.  ...  This occurs when a Poisson distribution of defect densities is assumed.  ... 
doi:10.1109/tc.1982.1676058 fatcat:xxyx5bwnuffmdjtjvxmqe3jggi

Defect Estimation of a Crack in Underground Pipelines by CMFL Type NDT System

Hui Min Kim, Gwan Soo Park
2014 Journal of Electrical Engineering and Technology  
This article is mainly focused on the decomposing method of the size and shape of the axially oriented cracks by using inspection signal data for defect.  ...  It is necessary to decompose the size and shapes of cracks for the maintenance of underground pipelines.  ...  Fig. 4 . 4 The distribution of magnetic flux density on the PIG and pipe.  ... 
doi:10.5370/jeet.2014.9.6.2218 fatcat:fi36xvwtwjgoloqpll6bl32cxa

A critique of software defect prediction models

N.E. Fenton, M. Neil
1999 IEEE Transactions on Software Engineering  
To illustrate these points the "Goldilock's Conjecture," that there is an optimum module size, is used to show the considerable problems inherent in current defect prediction approaches.  ...  We provide a critical review of this literature and the state-of-the-art. Most of the wide range of prediction models use size and complexity metrics to predict defects.  ...  The authors are indebted to Niclas Ohlsson and Peter Popov for comments that influenced this work and also to the anonymous reviewers for their helpful and incisive contributions.  ... 
doi:10.1109/32.815326 fatcat:xp7sjmgfirhfphoduy54u7u75u

The Electric Field Modulation by Hemisphere Damage Sites in Fused Silica Subsurface

Shaobo He, Liang Yang, Li Li, Xiao-Tao Zu
2014 Advances in Condensed Matter Physics  
The simulated results reveal that the modulation becomes more remarkable with the increase of defects density firstly and then decrease.  ...  The effect of defect density on the electric field modulation to incident laser is investigated in this work.  ...  ZYGX2010J045) and by the National Natural Science Foundation of China (61178018) and the Ph.D. Funding Support Program of Education Ministry of China (20110185110007).  ... 
doi:10.1155/2014/843261 fatcat:2zs5tgyomvaupiuxu5fvahxq5m

A Case Study of Defect Introduction Mechanisms [chapter]

Arbi Ghazarian
2009 Lecture Notes in Computer Science  
In line with this objective, we conducted a case study of defect introduction mechanisms on three major components of an industrial enterprise resource planning software system, and observed that external  ...  factors including incomplete requirements specifications, adopting new, unfamiliar technologies, lack of requirements traceability, and the lack of proactive and explicit definition and enforcement of  ...  Withrow [24] A minimum defect density for modules with sizes between 161 and 250 LOC, after which the defect density starts increasing with module size.  ... 
doi:10.1007/978-3-642-02144-2_16 fatcat:pjcexgm46bhtzap2rpl234otli

Transcranial direct current stimulation in patients with skull defects and skull plates: High-resolution computational FEM study of factors altering cortical current flow

Abhishek Datta, Marom Bikson, Felipe Fregni
2010 NeuroImage  
Cortical electric field (current density) peak intensities and distributions were compared with the healthy (skull intact) case.  ...  The factors of electrode position (C3-supraorbital or O1-supraorbital), electrode size skull defect size, skull defect state (acute and chronic) or skull plate (titanium and acrylic) were analyzed.  ...  .; and Varun Bansal and Davide Reato of The City College of New York. Felipe Fregni is partially funded by CIMIT (Center for Integration of Medicine and Innovative Technology).  ... 
doi:10.1016/j.neuroimage.2010.04.252 pmid:20435146 pmcid:PMC2910315 fatcat:agh3yvkkovecjot5fwqwlu7ys4

Incorporating yield enhancement into the floorplanning process

I. Koren, Z. Koren
2000 IEEE transactions on computers  
The goal of this paper is to investigate the two seemingly unrelated, and often conflicting, objectives of yield enhancement and routing complexity minimization.  ...  AbstractÐThe traditional goals of the floorplanning process for a new integrated circuit have been minimizing the total chip area and reducing the routing cost, i.e., the total length of the interconnecting  ...  Parts of this work were presented at the 1998 IEEE Symposium on Defect and Fault Tolerance in VLSI Systems, Austin, Texas [9] and the 1999 Symposium on Microelectronic Manufacturing TechnologiesÐYield  ... 
doi:10.1109/12.862213 fatcat:u7psr5ieuzbtzhkelkorlxsyvq

Defects-Induced Hot Spots in TATB

Zhonghua Yan, Chuanchao Zhang, Hongwei Yan, Zhijie Li, Li Li, Ming Huang, Bisheng Tan, Xiaodong Yuan
2014 Advances in Condensed Matter Physics  
Furthermore, TATB materials with spherical pore defects and crater defects are easier to form hot spots than those with narrow crack defects.  ...  We investigate the interaction between the laser and energetic materials with different defects.  ...  Acknowledgments This study was financially supported by the National Natural Science Foundation of China (Grant no. 11372289) and the NSAF Joint Foundation of China (Grant no. U1330108).  ... 
doi:10.1155/2014/219547 fatcat:fwz7plzd7fcj5ebpgmuyorbpza

Effects of defect propagation/growth on in-line defect-based yield prediction

W. Shindo, R.K. Nurani, A.J. Strojwas
1998 IEEE transactions on semiconductor manufacturing  
In order to improve the prediction accuracy, impact of defect propagation and growth phenomena needs to be modeled and incorporated into yield prediction system.  ...  This paper presents the importance of understanding defect propagation/growth and its impact on in-line yield prediction.  ...  By using the defect density and defect size distribution per defect type, it is possible to predict yield impact of each defect type.  ... 
doi:10.1109/66.728550 fatcat:rqfxt33tsvbuhcrjf3tiqcws7i
« Previous Showing results 1 — 15 out of 144,294 results