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Linear light source reflectometry

Andrew Gardner, Chris Tchou, Tim Hawkins, Paul Debevec
2003 ACM Transactions on Graphics  
The reflectometry apparatus we use is simple and inexpensive to build, requiring a single direction of motion for the light source and a fixed camera viewpoint.  ...  Using two passes of the linear light source at different angles, we can also estimate per-pixel surface normals as well as the reflectance parameters.  ...  We especially thank Alexander and Judy Singer for providing manuscript reproductions for testing the apparatus, Martin Gundersen and Charles Knowlton for helpful light source discussions, Greg Ward for  ... 
doi:10.1145/882262.882342 fatcat:f46elpg4pzgdbiq3xhliljlrie

Linear light source reflectometry

Andrew Gardner, Chris Tchou, Tim Hawkins, Paul Debevec
2003 ACM SIGGRAPH 2003 Papers on - SIGGRAPH '03  
The reflectometry apparatus we use is simple and inexpensive to build, requiring a single direction of motion for the light source and a fixed camera viewpoint.  ...  Using two passes of the linear light source at different angles, we can also estimate per-pixel surface normals as well as the reflectance parameters.  ...  We especially thank Alexander and Judy Singer for providing manuscript reproductions for testing the apparatus, Martin Gundersen and Charles Knowlton for helpful light source discussions, Greg Ward for  ... 
doi:10.1145/1201775.882342 fatcat:avlr65txwvgvbhndee3zddqhdi

Linearizing optical frequency-sweep of a laser diode for FMCW reflectometry

K. Iiyama, Lu-Tang Wang, Ken-Ichi Hayashi
1996 Journal of Lightwave Technology  
The backscattered light in optical waveguide devices is measured by the FMCW reflectometry using the proposed light source, and the propagation loss of a single-mode glass waveguide is successfully evaluated  ...  We propose and demonstrate a novel linearizing method of optical frequency-sweep of a laser diode for frequencymodulated continuous-wave (FMCW) reflectometry.  ...  The backscattered light in optical waveguide devices is measured by the FMCW reflectometry using the proposed light source, and the propagation loss of a single-mode glass waveguide is successfully evaluated  ... 
doi:10.1109/50.482260 fatcat:uki5xhpnjzabrfuo72xwf3qc4e

Mobile surface reflectometry

Jérémy Riviere, Pieter Peers, Abhijeet Ghosh
2014 ACM SIGGRAPH 2014 Posters on - SIGGRAPH '14  
We demonstrate the accuracy and versatility of the proposed mobile reflectometry methods on a wide variety of spatially varying materials.  ...  Finally, we introduce a novel surface detail enhancement method that adds fine scale surface mesostructure from close-up observations under uncontrolled natural lighting.  ...  [CDP*14] extend linear light source reflectometry to anisotropic materials, and present a handheld version that integrates camera and light source in a single device.  ... 
doi:10.1145/2614217.2630589 dblp:conf/siggraph/RivierePG14 fatcat:aqlao2e44rez5mcpuuw6llhs5u

Video reflectometry to specify optical properties of tissue in vivo

Steven Jacques, Gerhard J. Mueller
1993 Medical Optical Tomography: Functional Imaging and Monitoring  
The positive source pushes light out of the tissue and the negative source pulls light out of the tissue.  ...  The positive source pushes light out of the tissue and the negative source pulls light out of the tissue.  ... 
doi:10.1117/12.2283758 fatcat:uzlsf2gpv5egxgpd4gr3jzuifm

High-Resolution FMCW Reflectometry Using a Single-Mode Vertical-Cavity Surface-Emitting Laser

Koichi Iiyama, Shin-ichiro Matsui, Takao Kobayashi, Takeo Maruyama
2011 IEEE Photonics Technology Letters  
High-resolution frequency-modulated continuous-wave (FMCW) reflectometry is realized by using a single-mode vertical-cavity surface-emitting laser (VCSEL) as a frequency-swept light source for the first  ...  The experimental spatial resolution of 250 m was achieved, which is the best value when an injection current tuned laser diode is used as a frequency-swept light source.  ...  The measurement range is restricted by the coherence length of the light source because the FMCW reflectometry utilizes interference of lights.  ... 
doi:10.1109/lpt.2011.2131124 fatcat:i7ocbtjudfbctb6j22b5atzd64

Nonlinearity-Compensation-Free Optical Frequency Domain Reflectometry Based on Electrically-Controlled Optical Frequency Sweep

Fan Yang, Ling-Jie Zhang, Zhi-Yao Zhang, Xiao-Jun Zhou, Yong Liu
2020 Journal of Electronic Science and Technology  
The fiber laser source employed above also can generate a linear frequency sweep light. In the experiment, the frequency sweep rate and sweep time were set to 400 GHz/s and 20 ms, respectively.  ...  In the experiment, the linear frequency sweep light with the linearity of 1.57% is generated and used to achieve OFDR.  ... 
doi:10.1016/j.jnlest.2020.100025 fatcat:rbpfp3brafah5ooz3fvqibr2bm

Measurement of absorption and scattering spectra of chicken breast with oblique incidence reflectometry

Guillermo Marquez, Lihong V. Wang, Shao-Pow Lin, Steven L. Jacques, Frank K. Tittel, Sharon L. Thomsen, Jon A. Schwartz, Tuan Vo-Dinh, Robert A. Lieberman, Gerald G. Vurek, Abraham Katzir
1997 Biomedical Sensing, Imaging, and Tracking Technologies II  
We used this technique to deduce absorption and reduced scattering spectra from wavelength resolved measurements of the relative diffuse reflectance profile of white light.  ...  Oblique incidence reflectometry is a simple and accurate method for measuring the absorption and reduced scattering coefficients of turbid media.  ...  The source fiber is oriented at 45°a ngle, and nine (9) collection fibers in a linear array collected the diffuse reflectance ( Figure 2 ).  ... 
doi:10.1117/12.275539 fatcat:3m7jz4dkn5dctph6zbhm52nrly

Thickness and Surface Measurement of Transparent Thin-Film Layers using White Light Scanning Interferometry Combined with Reflectometry

Taeyong Jo, KwangRak Kim, SeongRyong Kim, HeuiJae Pahk
2014 Journal of the Optical Society of Korea  
Recently, reflectometry and white light scanning interferometry were combined to measure the film thickness and surface profile.  ...  In this paper we propose combing reflectometry and white light scanning interferometry to measure the thin-film thickness and surface profile.  ...  F k and dk are, respectively, the central wave number and the bandwidth of the white-light source. In Eq. (9), the integral is related to the broad spectral distribution of the source light.  ... 
doi:10.3807/josk.2014.18.3.236 fatcat:shejwxh7q5hyxntsi6d2wgeree

Development of an Infrared Direct Viewer Based on a MEMS Focal Plane Array [chapter]

Garth M. Blocher, Morteza Khaleghi, Ivo Dobrev, Cosme Furlong
2014 MEMS and Nanotechnology, Volume 8  
A visible light camera was used with custom software to determine a temperature sensitivity of 137 mK for the reflectometry readout, and thermal images of scenes at human body temperature were demonstrated  ...  Three optical readout mechanisms were ii identified for transducing the nanometer scale deformations of the MEMS structures in the FPA into a directly observable visible light image.  ...  Applications specific to the currently developed IR direct viewing technology would include harsh environments where electronics and computer system are not suitable and low power illumination sources  ... 
doi:10.1007/978-3-319-07004-9_5 fatcat:xcxme4uw65fejmjm5xgpcfwl5m

Anisotropic absorption and reduced scattering spectra of chicken breast tissue measured using oblique incidence reflectometry

Lihong V. Wang, Guillermo Marquez, Sharon L. Thomsen, Robert R. Alfano
1998 Optical Biopsy II  
We used this technique to deduce absorption and reduced scattering spectra from wavelength-resolved measurements of the relative diffuse reflectance profile of white light as a function of source-detector  ...  absorption and reduced scattering spectra of chicken breast tissue measured using oblique incidence reflectometry," Abstract Oblique incidence reflectometry is a simple and accurate method for measuring  ...  The source fiber is oriented at 45 angle, and nine (9) collection fibers in a linear array collected the diffuse reflectance ( Figure 2 ).  ... 
doi:10.1117/12.305386 fatcat:prljuu2ihzcutl5iyihibendfq

Early Development of Optical Low-Coherence Reflectometry and Some Recent Biomedical Applications

Barry R. Masters
1999 Journal of Biomedical Optics  
This paper explains the term low-coherence interferometry, reviews the early development of optical lowcoherence reflectometry, and shows some of the paths that led to the field of biomedical optics.  ...  These techniques differed from the methods of optical time-domain reflectometry by the use of continuous wave light sources.  ...  Interferometric techniques based on reflectometry with low coherence light sources, such as superluminescent diodes (SLD) and light emitting diodes (LED), permit measurements of optical distance and imaging  ... 
doi:10.1117/1.429914 pmid:23015210 fatcat:ibactugjnrdazotmkjcw3gc7bm

Long range and high resolution reflectometry by synthesis of optical coherence function at region beyond the coherence length

Masahiro Kashiwagi, Kazuo Hotate
2009 IEICE Electronics Express  
We discuss and simulate the principle of the reflectometry system.  ...  A long-range and high-resolution reflectometry by synthesis of optical coherence function at region beyond the coherence length is proposed.  ...  However, the measurement range was limited by the coherence length of the light source.  ... 
doi:10.1587/elex.6.497 fatcat:xhy3om52pjeclk3cj4szdzv67u

Long range and high resolution reflectometry by synthesis of optical coherence function at region beyond the coherence length

Masahiro Kashiwagi, Kazuo Hotate
2005 17th International Conference on Optical Fibre Sensors  
We discuss and simulate the principle of the reflectometry system.  ...  A long-range and high-resolution reflectometry by synthesis of optical coherence function at region beyond the coherence length is proposed.  ...  However, the measurement range was limited by the coherence length of the light source.  ... 
doi:10.1117/12.624246 fatcat:su4xcljp7nfcpfhoxbastba36e

Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters

Lihong V. Wang, Shao-Pow Lin, Steven L. Jacques, Frank K. Tittel, Jennifer Harder, John Jancarik, Beth M. Mammini, Ward Small IV, Luiz B. Da Silva, Rinaldo Cubeddu, Serge R. Mordon, Katarina Svanberg
1995 Optical Biopsies  
Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters," Abstract A new, simple and quick approach, oblique-incidence reflectometry, was  ...  An obliquely incident light beam causes the center of the far diffuse reflectance to shift from the point of incidence, where the far diffuse reflectance refers to the diffuse reflectance that is several  ...  One optical fiber was used as the source to deliver laser light (632.8 nm wavelength, He-Ne laser) to the turbid media, and the other ten were used as the detection fibers to collect light from the turbid  ... 
doi:10.1117/12.228887 fatcat:mg4c34haafhg7oaiwxv7pkdpcq
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