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Revisiting Symptom-Based Fault Tolerant Techniques against Soft Errors

Hwisoo So, Moslem Didehban, Yohan Ko, Reiley Jeyapaul, Jongho Kim, Youngbin Kim, Kyoungwoo Lee, Aviral Shrivastava
2021 Electronics  
Symptom-based protection schemes have been suggested as shortcuts to achieve acceptable reliability with comparable overheads.  ...  Aggressive technology scaling and near-threshold computing have made soft error reliability one of the leading design considerations in modern embedded microprocessors.  ...  In Proceedings of the IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 1923 April 2015. 31. Hubert, G.; Artola, L.; Regis, D.  ... 
doi:10.3390/electronics10233028 fatcat:6xmgwau25bgxpjm2jdhjop623y

Bending Setups for Reliability Investigation of Flexible Electronics

Rafat Saleh, Maximilian Barth, Wolfgang Eberhardt, André Zimmermann
2021 Micromachines  
This is done to provide an overview of the types of tests that can be performed to investigate the bending reliability.  ...  In this paper, the frequently used methods for investigating the bending reliability of flexible electronics are presented.  ...  In Proceedings of the 2019 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 31 March–4 April 2019; pp. 1–5. [Google Scholar] Matthewson, M.J.; Nelson, G.J.  ... 
doi:10.3390/mi12010078 pmid:33451151 fatcat:iumrdr6zkjcdfprhluiswjnqvm

Dependability Analysis of Data Storage Systems in Presence of Soft Errors

Mostafa Kishani, Mehdi Tahoori, Hossein Asadi
2019 IEEE Transactions on Reliability  
To our knowledge, no previous study has examined the system-level effects of soft errors on the availability and reliability of data storage systems.  ...  In recent years, high availability and reliability of Data Storage Systems (DSS) have been significantly threatened by soft errors occurring in storage controllers.  ...  (DFTS), IEEE International Symposium on. Amherst, MA, USA: IEEE, [19] A. Dasgupta and M. Pecht, “Material failure mechanisms and damage 2015, pp. 47–52.  ... 
doi:10.1109/tr.2018.2888515 fatcat:ycwhs5d4frbl5dvfrdvolrjhge