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Symptom-based protection schemes have been suggested as shortcuts to achieve acceptable reliability with comparable overheads. ... Aggressive technology scaling and near-threshold computing have made soft error reliability one of the leading design considerations in modern embedded microprocessors. ... In Proceedings of the IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 19–23 April 2015. 31. Hubert, G.; Artola, L.; Regis, D. ...doi:10.3390/electronics10233028 fatcat:6xmgwau25bgxpjm2jdhjop623y
This is done to provide an overview of the types of tests that can be performed to investigate the bending reliability. ... In this paper, the frequently used methods for investigating the bending reliability of flexible electronics are presented. ... In Proceedings of the 2019 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 31 March–4 April 2019; pp. 1–5. [Google Scholar] Matthewson, M.J.; Nelson, G.J. ...doi:10.3390/mi12010078 pmid:33451151 fatcat:iumrdr6zkjcdfprhluiswjnqvm
To our knowledge, no previous study has examined the system-level effects of soft errors on the availability and reliability of data storage systems. ... In recent years, high availability and reliability of Data Storage Systems (DSS) have been significantly threatened by soft errors occurring in storage controllers. ... (DFTS), IEEE International Symposium on. Amherst, MA, USA: IEEE,  A. Dasgupta and M. Pecht, “Material failure mechanisms and damage 2015, pp. 47–52. ...doi:10.1109/tr.2018.2888515 fatcat:ycwhs5d4frbl5dvfrdvolrjhge