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2021 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  
Ranjan 364 Physical Design GAN-SRAF: Subresolution Assist Feature Generation Using Generative Adversarial Networks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  ...  Pan 373 Test Black-Box Test-Cost Reduction Based on Bayesian Network Models . . . . . . . R. Pan, Z. Zhang, X. Li, K. Chakrabarty, and X.  ... 
doi:10.1109/tcad.2020.3048772 fatcat:iukas433mffgpdtkkhuzjv3im4