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Calibration of Integrated CMOS Hall Sensors Using Coil-on-Chip in ATE Environment
2008
2008 Design, Automation and Test in Europe
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Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more important. On the other hand, options for test and characterization of hall sensors in manufacturing environment are very limited. In most cases external field generators are used in order to characterize the hall sensors on a small set of production samples. In this paper, we present our Coilon-Chip (CoC) calibration
doi:10.1109/date.2008.4484784
dblp:conf/date/BadarogluDLC08
fatcat:pjrymxmkjbckpo3ad3djtvttgy
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... ogy where there is no need for a dedicated setup/assembly. Our methodology is also immune to self-heating. Our methodology enables reduced costs in test equipment, 100% screening of hall sensors in manufacturing tests, and reliable trimming of sensitivity spread over temperature from -40 o C to 150 o C. Measurement results before trimming show less than 20% six-sigma spread for normalized sensitivity across 120 samples of different hall sensor structures processed in a 0.35 µm high-voltage CMOS process.
Calibration of integrated CMOS hall sensors using coil-on-chip in ATE environment
2008
Proceedings of the conference on Design, automation and test in Europe - DATE '08
Preserved Fulltext
A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2016; you can also visit the original URL.
The file type is application/pdf.
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more important. On the other hand, options for test and characterization of hall sensors in manufacturing environment are very limited. In most cases external field generators are used in order to characterize the hall sensors on a small set of production samples. In this paper, we present our Coilon-Chip (CoC) calibration
doi:10.1145/1403375.1403587
fatcat:rkv77qz2v5fnblmljecgq2ecii