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Quadratic Statistical $MAX$ Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits

Xin Li, Yaping Zhan, Lawrence T. Pileggi
2008 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  
In this paper, we propose an efficient numerical algorithm for estimating the parametric yield of analog/RF circuits, considering large-scale process variations.  ...  Starting from a set of quadratic performance models, the proposed parametric yield estimation conceptually maps multiple correlated performance constraints to a single auxiliary constraint by using a M  ...  The APEX approach, however, can only be applied to a single performance metric, whereas the parametric yield of most analog/RF circuits is defined by multiple performance constraints.  ... 
doi:10.1109/tcad.2008.917582 fatcat:75g7ve2vwrazpoltgtuqlx6gcy

Table of contents

2020 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  
Yakovlev 952 Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  ...  Emerging Technologies and Applications Modeling and Analysis of Optical Modulators Based on Free-Carrier Plasma Dispersion Effect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  ... 
doi:10.1109/tcad.2020.2985607 fatcat:ppmomnva5bftfm5gb6szlo3gki

An extension of the RiMAX multipath estimation algorithm for ultra-wideband channel modeling

Brecht Hanssens, Emmeric Tanghe, Davy P. Gaillot, Martine Liénard, Claude Oestges, David Plets, Luc Martens, Wout Joseph
2018 EURASIP Journal on Wireless Communications and Networking  
(MCD) metric and that the DMC reverberation time known from the theory of room electromagnetics can be estimated on average with an error margin of less than 2 ns throughout the UWB frequency band.  ...  This work presents an extension of the high-resolution RiMAX multipath estimation algorithm, enabling the analysis of frequency-dependent propagation parameters for ultra-wideband (UWB) channel modeling  ...  Emmeric Tanghe is a Post-Doctoral fellow of the Research Foundation Flanders (FWO).  ... 
doi:10.1186/s13638-018-1177-3 pmid:30008737 pmcid:PMC6019467 fatcat:pwj237qe6fachb5qkex3kii4bi

Predicting die-level process variations from wafer test data for analog devices: A feasibility study

S. Devarakond, J. McCoy, A. Nahar, J.M. Carulli, S. Bhattacharya, A. Chatterjee
2013 2013 14th Latin American Test Workshop - LATW  
A methodology to predict the process e-test parameters corresponding to each die (even in regions of the die where e-test structures are not available) from die test measurements for analog/RF systems  ...  on the wafer as opposed to measurements of e test parameters at only specific wafer locations.  ...  In the case of analog/RF circuits implemented in advanced nanometer nodes, attaining high yield is a challenge.  ... 
doi:10.1109/latw.2013.6562658 dblp:conf/latw/DevarakondMNCBC13 fatcat:xs2fxq3onvc73cvoribf7m7bb4

Statistical Performance Modeling and Optimization

Xin Li, Jiayong Le, Lawrence T Pileggi
2006 Foundations and Trends® in Electronic Design Automation  
analysis, probability distribution extraction, parametric yield estimation and robust IC optimization.  ...  The following topics will be discussed in detail: sources of process variations, variation characterization and modeling, Monte Carlo analysis, response surface modeling, statistical timing and leakage  ...  Acknowledgments We wish to thank all anonymous reviewers for their excellent comments, resulting in a significant improvement in the quality of this paper.  ... 
doi:10.1561/1000000008 fatcat:wrfrfutwjbdx3lc4cp3fj6djay

Exploring Relationships among Tree-Ring Growth, Climate Variability, and Seasonal Leaf Activity on Varying Timescales and Spatial Resolutions

Upasana Bhuyan, Christian Zang, Sergio Vicente-Serrano, Annette Menzel
2017 Remote Sensing  
The results are as following (a) The model using high-spatial-resolution NDVI time series explained a higher proportion of the variance in RWI than that of the model using coarse-spatial-resolution NDVI  ...  Remote sensing of phenology using time series of vegetation indices is based on the intra-annual changes of canopy greenness [25] .  ...  Conflicts of Interest: The authors declare no conflict of interest.  ... 
doi:10.3390/rs9060526 fatcat:4y5taap4jrgnloaw5toax6ahfy

Co-Learning Bayesian Model Fusion: Efficient performance modeling of analog and mixed-signal circuits using side information

Fa Wang, Manzil Zaheer, Xin Li, Jean-Olivier Plouchart, Alberto Valdes-Garcia
2015 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)  
In particular, CL-BMF combines the coefficient side information, the performance side information and a small number of training samples through Bayesian inference based on a graphical model.  ...  Different from the traditional performance modeling approaches which focus on the prior information of model coefficients (i.e. the coefficient side information) only, CL-BMF takes advantage of another  ...  In practice, these performance metrics can be selected by an analog/RF designer according to his design experience, as will be illustrated by our circuit examples in Section 5.  ... 
doi:10.1109/iccad.2015.7372621 dblp:conf/iccad/WangZLPV15 fatcat:zcsio2kodjgrliiortvrgszd3q

Limitations and challenges of computer-aided design technology for CMOS VLSI

R.E. Bryant, Kwang-Ting Cheng, A.B. Kahng, K. Keutzer, W. Maly, R. Newton, L. Pileggi, J.M. Rabaey, A. Sangiovanni-Vincentelli
2001 Proceedings of the IEEE  
Design technology (DT) is concerned with the automated or semiautomated conception, synthesis, verification, and eventual testing of microelectronic systems.  ...  For example, there is a need to design correct and testable chips in a very short time frame and for these chips to meet a competitive requirement.  ...  : Test Technologies for Analog/RF Circuits: For most mixed-signal high-end ICs, the analog circuitry accounts for only a small fraction of the total silicon area while a major fraction of the test equipment  ... 
doi:10.1109/5.915378 fatcat:jocv62sorfbnjp53u7b76j4mdi

PoBO: A Polynomial Bounding Method for Chance-Constrained Yield-Aware Optimization of Photonic ICs [article]

Zichang He, Zheng Zhang
2021 arXiv   pre-print
Many other advanced problems of yield-aware optimization and more general safety-critical design/control can be solved based on this work in the future.  ...  These methods often obtain a high yield but reach a design performance that is far from the optimal value.  ...  Roy, “Sparse linear regression (SPLINER) approximation for parametric yield estimation of analog/rf in- approach for efficient multidimensional uncertainty quantifica- tegrated circuits  ... 
arXiv:2107.12593v2 fatcat:3z7qbbkehnephlkylxpbyu6u7u

2020 Index IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Vol. 39

2020 IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  
., +, TCAD Aug. 2020 1699-1710 Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model.  ...  ., TCAD April 2020 936-945 Circuit testing Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware.  ... 
doi:10.1109/tcad.2021.3054536 fatcat:wsw3olpxzbeclenhex3f73qlw4

A Review of Data Mining Applications in Semiconductor Manufacturing

Pedro Espadinha-Cruz, Radu Godina, Eduardo M. G. Rodrigues
2021 Processes  
The production of semiconductors is a highly complex process, which entails several subprocesses that employ a diverse array of equipment.  ...  Therefore, in this paper a structured review is made through a sample of 137 papers of the published articles in the scientific community regarding data mining applications in semiconductor manufacturing  ...  regression (k-NN) A data mining method for automatically identifying and exploring correlations between inline Multi-objective genetic algorithm measurements and final test outcomes in analog/RF devices  ... 
doi:10.3390/pr9020305 fatcat:jyxg4mt3gvbahnu3snh4i3rxvm

Polarization and Index Modulations: a Theoretical and Practical Perspective [article]

Pol Henarejos
2018 arXiv   pre-print
In this context, this thesis advocates for the use of polarization as a dimension to be exploited in radiocommunications.  ...  In addition to the use of polarization, index modulations help increase transmission rates whilst improving robustness against errors and imperfections with a low computational complexity.  ...  a estimation of a arg max a f (a) value of a that maximizes f (a) arg min a f (a) value of a that minimizes f (a) max a f (a)maximum value of f (a)xxxii min a f (a) minimum value of f (a) ℜ(a), ℑ(a) real  ... 
arXiv:1803.07297v1 fatcat:ly4yswxmtzfdtixjpxrf522aqe

Research Summit 2021- Book of Abstracts [article]

Artur Silva, António Teixeira
031828, Partnership n. 94 / Initiative n. 189) through national funds, co-financed by PDR2020, and FEADER, within the PT2020 Partnership Agreement This exploratory mixed-method research that includes a  ...  Acknowledgments: This work was developed within the scope of the project CICECO-Aveiro Institute of Materials, UIDB/50011/2020 & UIDP/50011/2020, financed by national funds through the FCT/MEC and when  ...  The innovative features will be focused on the development of input analog RF front-ends that are adaptable in frequency and power, which may vary according to input power, and of ferroelectrics that have  ... 
doi:10.48528/qdpf-e229 fatcat:o6eqjoqg65arljzd4agsarc4uq