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System-on-chip testability using LSSD scan structures

K. Zarrineh, S.J. Upadhyaya, V. Chickermane
<span title="">2001</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/hkpx3vsnhrfb7jh6hlwads7olq" style="color: black;">IEEE Design &amp; Test of Computers</a> </i> &nbsp;
These test patterns could be loaded in the tester by themselves or as a part of the test patterns for the entire chip. Once this step is complete, test patterns for the entire design are generated.  ...  The test patterns and addresses are loaded into the scan cells of the data input and address ports of the embedded memory.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/54.922805">doi:10.1109/54.922805</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/h5dpo2aoqrddxdqtfxvvevoe3a">fatcat:h5dpo2aoqrddxdqtfxvvevoe3a</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20060914222946/http://www.cse.buffalo.edu:80/~shambhu/documents/pdf/ieeednt01.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/1f/b4/1fb4cc2656fc4c4da7a1c573ee88ad23a23c5f1b.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/54.922805"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Bit-fixing in pseudorandom sequences for scan BIST

N.A. Touba, E.J. McCluskey
<span title="">2001</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/rl7xk4fwazdrred2difr6v3lii" style="color: black;">IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems</a> </i> &nbsp;
Deterministic test cubes that detect the random-pattern-resistant (r.p.r.) faults are embedded in a pseudorandom sequence of bits generated by a linear feedback shift register (LFSR).  ...  Further reduction in overhead is possible by using a special correlating automatic test pattern generation procedure that is described for finding test cubes for the r.p.r. faults in a way that maximizes  ...  A bit-fixing sequence generator will be designed to provide 100% fault coverage for a test length of 12 patterns generated by a five-stage LFSR .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/43.918212">doi:10.1109/43.918212</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/mmdgpra3yvcrfgr3vx5xykkowq">fatcat:mmdgpra3yvcrfgr3vx5xykkowq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170809093200/http://crc.stanford.edu/crc_papers/Touba_bs.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/2a/8d/2a8d270b71d32c4d7449ead7e8694d454c735f9a.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/43.918212"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

A tutorial on built-in self-test. 2. Applications

V.D. Agrawal, C.R. Kime, K.K. Saluja
<span title="">1993</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/hkpx3vsnhrfb7jh6hlwads7olq" style="color: black;">IEEE Design &amp; Test of Computers</a> </i> &nbsp;
For the application of BIST to embedded RAMs, the pattern generator contains an address generator and a data generator.  ...  combinational test generator, fault simulator DFT rule checker, testability hardware insertion, automatic full-scan design and scan chain routing, test control block generator, combinational test pattern  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/54.211530">doi:10.1109/54.211530</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/qudfuz5lf5dsre6er623la34nu">fatcat:qudfuz5lf5dsre6er623la34nu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170829230201/http://www.dejazzer.com/ece470/papers/bist_tutorial_2.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/7c/e8/7ce8b84d52556c7cec1f3b718ee94c737d6838b3.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/54.211530"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Deterministic logic BIST for transition fault testing

V. Gherman, H.-J. Wunderlich, J. Schloeffel, M. Garbers
<span title="">2007</span> <i title="Institution of Engineering and Technology (IET)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/34xrdbeizvba5cnrxymhir5cxi" style="color: black;">IET Computers &amp; Digital Techniques</a> </i> &nbsp;
Functional justification is used to generate the required pattern pairs. The efficiency of the extended scheme is investigated using difficult-to-test industrial designs.  ...  However, an extension to delay fault testing is not trivial as this necessitates the application of pattern pairs.  ...  The activation pattern is generated by the CUT as a response to the first pattern and only single test cubes have to be embedded into the pseudo-random sequence (just like in the case of stuck-at fault  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1049/iet-cdt:20060131">doi:10.1049/iet-cdt:20060131</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/s7xinwsiuvan5ode77kmvrshsq">fatcat:s7xinwsiuvan5ode77kmvrshsq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170829201213/http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2006/ETS_GhermWSG2006.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/2f/de/2fde96c4ff2d9c0f1e2f54695539d4de868385a6.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1049/iet-cdt:20060131"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> Publisher / doi.org </button> </a>

Watermarking for intellectual property protection

Y.C. Fan, H.W. Tsao
<span title="">2003</span> <i title="Institution of Engineering and Technology (IET)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/5njumqonprdi3jwzrhnh22m7pm" style="color: black;">Electronics Letters</a> </i> &nbsp;
The proposed method uses a uniquely generated stream of bits, known as a watermark, embedded into the self-test circuit to represent ownership.  ...  Experimental results show the proposed embedding technique can survive synthesis, placement and routing. The experimental results are given to demonstrate the proposed method.  ...  A watermark generating circuit is designed to generate the watermark as a binary pattern. Next, the test circuit is combined with the watermark generating circuit.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1049/el:20030874">doi:10.1049/el:20030874</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/w7fkgfu6dvgmtejcmvshmjds7i">fatcat:w7fkgfu6dvgmtejcmvshmjds7i</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170829023033/http://www.univ-st-etienne.fr/salware/Bibliography_Salware/IP%20Watermarking/Article/Fan2003.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/4d/ce/4dce744d904778fdaedbacbf70092664614f7340.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1049/el:20030874"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> Publisher / doi.org </button> </a>

FPGA-based universal embedded digital instrument

Joshua Ferry
<span title="">2013</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/c6t4qycpy5haxkpjvywsoox6dq" style="color: black;">2013 IEEE International Test Conference (ITC)</a> </i> &nbsp;
The applications of the embedded instrument can include design verification, production test, and fault diagnostics in a simple and low resource implementation.  ...  To increase usability, pattern generation and protocol-aware features are included within its small footprint.  ...  For the sourcing device: • Invoke the pattern generator to load test patterns into the channel RAM across all channels. • Run the pattern.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/test.2013.6651917">doi:10.1109/test.2013.6651917</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/itc/Ferry13.html">dblp:conf/itc/Ferry13</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/7wkowxc3xfgwvglfuspg6yw5am">fatcat:7wkowxc3xfgwvglfuspg6yw5am</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170818220020/https://www.computer.org/csdl/proceedings/itc/2013/9999/00/06651917.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/32/a8/32a88131354e82fd3d3dd24fb818a951bff15b23.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/test.2013.6651917"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Embedded software-based self-test for programmable core-based designs

A. Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, L. Chen, S. Dey
<span title="">2002</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/hkpx3vsnhrfb7jh6hlwads7olq" style="color: black;">IEEE Design &amp; Test of Computers</a> </i> &nbsp;
Because digital logic testers cannot do precise analog testing, externally testing mixed-Embedded Software-Based Self-Test for Programmable Core-Based Designs Embedded Systems 18 The programmable cores  ...  on SoCs can perform on-chip test generation, measurement, response analysis, and even diagnosis.  ...  Figure 3 shows the test flow based on the embedded software self-testing methodology, divided into preprocessing and testing phases.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/mdt.2002.1018130">doi:10.1109/mdt.2002.1018130</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/fyyiaiaoj5dvzf6otfkzjqx25m">fatcat:fyyiaiaoj5dvzf6otfkzjqx25m</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20030907051248/http://www.gigascale.org:80/pubs/210/d&amp;t2002.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/e0/11/e011ee69bca2b22c13891004bf986a9462786683.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/mdt.2002.1018130"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

An Architecture of Embedded Decompressor with Reconfigurability for Test Compression

H. ICHIHARA, T. SAIKI, T. INOUE
<span title="2008-03-01">2008</span> <i title="Institute of Electronics, Information and Communications Engineers (IEICE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/xosmgvetnbf4zpplikelekmdqe" style="color: black;">IEICE transactions on information and systems</a> </i> &nbsp;
In this paper, we introduce an embedded decompressor that is re configurable according to coding algorithms and given test data.  ...  ., the coding algorithm is ineffective in extra test data except for the given test data.  ...  One is that the coding algorithm and the corresponding decompressor must be designed after test generation, which is performed downstream of the design flow.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1093/ietisy/e91-d.3.713">doi:10.1093/ietisy/e91-d.3.713</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/457p5jwturbtnluykttdqz5kzu">fatcat:457p5jwturbtnluykttdqz5kzu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20181102211116/https://www.jstage.jst.go.jp/article/transinf/E91.D/3/E91.D_3_713/_pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/da/c1/dac19a222832ae77d1ab8bafb16daf2e049311b7.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1093/ietisy/e91-d.3.713"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

Testing embedded-core-based system chips

Y. Zorian, E.J. Marinissen, S. Dey
<span title="">1999</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/dsrvu6bllzai7oj3hktnc5yf4q" style="color: black;">Computer</a> </i> &nbsp;
This core-based design poses a series of new challenges, especially in the domains of manufacturing test and design validation and debug.  ...  Traditional IC design, in which every circuit is designed from scratch and reuse is limited to standard-cell libraries, is more and more replaced by a design style based on embedding large reusable modules  ...  Test Pattern Source and Sink The test pattern source generates the test stimuli for the embedded core. The test pattern sink compares the response(s) to the expected response(s).  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/2.769444">doi:10.1109/2.769444</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/vd7nx4xhwvglnfiqnu7fpiczku">fatcat:vd7nx4xhwvglnfiqnu7fpiczku</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170809093247/http://dit.upc.es/lpdntt/biblio/BREUS/ZOR99a.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/da/22/da225196946de6d99670e7fa109f51cdcb4ca228.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/2.769444"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers

Christos Papameletis, Brion Keller, Vivek Chickermane, Erik Jan Marinissen, Said Hamdioui
<span title="">2013</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/yb4g5d6aszdj7coou6jp5dreee" style="color: black;">2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)</a> </i> &nbsp;
However, the logic dies comprising a 3D-SIC typically are complex System-on-Chip (SoC) designs that include embedded intellectual property (IP) cores, wrapped for modular test.  ...  Previously, we defined, implemented, and automated a 3D-DfT (Design-for-Test) architecture that provides modular test access for 3D-SICs containing monolithic logic dies in a single-tower stack.  ...  3D-DfT architecture and the generation of test patterns.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ets.2013.6569350">doi:10.1109/ets.2013.6569350</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/ets/PapameletisKCMH13.html">dblp:conf/ets/PapameletisKCMH13</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ln36ida2tvanfiz7h6xlnuxxhi">fatcat:ln36ida2tvanfiz7h6xlnuxxhi</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170808204023/http://ce-publications.et.tudelft.nl/publications/1419_automated_dft_insertion_and_test_generation_for_3dsics_wit.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/87/6e/876e940c43d97d7800cadd99b8a8be73b016e9a8.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ets.2013.6569350"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Testing framework for embedded languages

Dániel Leskó, Máté Tejfel
<span title="">2013</span> <i title="National Library of Serbia"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/rhtuh2ifczhapmhplqzald63za" style="color: black;">Computer Science and Information Systems</a> </i> &nbsp;
Other important aspects of our model are the test data generation, the oracle problem and the customizability of the whole testing phase.  ...  Embedding a new programming language into an existing one is a widely used technique, because it fastens the development process and gives a part of a language infrastructure for free (e.g. lexical, syntactical  ...  While in case of Haskell and languages embedded into Haskell we could statically type-check the assembled test cases.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.2298/csis130115069l">doi:10.2298/csis130115069l</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/4pxkwodxwbc7fg6ozrvdmqvu74">fatcat:4pxkwodxwbc7fg6ozrvdmqvu74</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20190222143538/http://pdfs.semanticscholar.org/3969/739d5287745d185fe926f23bc35446b9ba09.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/39/69/3969739d5287745d185fe926f23bc35446b9ba09.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.2298/csis130115069l"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> Publisher / doi.org </button> </a>

Microcontroller Based Testing of Digital IP-Core

Amandeep Singh
<span title="2012-04-30">2012</span> <i title="Academy and Industry Research Collaboration Center (AIRCC)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/dpfavoemqbeinduj3yjynh557i" style="color: black;">International Journal of VLSI Design &amp; Communication Systems</a> </i> &nbsp;
The novel feature is that there is no need of test pattern generator and output response analyzer as microcontroller performs the function of both.  ...  Testing core based System on Chip is a challenge for the test engineers. To test the complete SOC at one time with maximum fault coverage, test engineers prefer to test each IP-core separately.  ...  Here ATE is loaded into the memory and test program is generated and processor core can execute it whenever necessary.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.5121/vlsic.2012.3205">doi:10.5121/vlsic.2012.3205</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/kh627wxg3fd67fotzhobdhhs4a">fatcat:kh627wxg3fd67fotzhobdhhs4a</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20180603230245/http://www.aircconline.com/vlsics/V3N2/3212vlsics05.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/97/44/97447dcfc33841df9ca42048969672e7007c5711.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.5121/vlsic.2012.3205"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

BIST hardware synthesis for RTL data paths based on test compatibility classes

N. Nicolici, B.M. Al-Hashimi, A.D. Brown, A.C. Williams
<span title="">2000</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/rl7xk4fwazdrred2difr6v3lii" style="color: black;">IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems</a> </i> &nbsp;
During testing, compatible modules share a small number of test pattern generators at the same test time leading to significant reductions in BIST area overhead, performance degradation and test application  ...  This paper shows how the proposed TCC grouping methodology is a general case of the traditional BIST embedding methodology for RTL data paths with both uniform and variable bit width.  ...  only one test pattern generator.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/43.892861">doi:10.1109/43.892861</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/6wiwohdxofbfrmncichd2duxya">fatcat:6wiwohdxofbfrmncichd2duxya</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170815190657/https://eprints.soton.ac.uk/253684/1/ieeetcad00.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/3f/ff/3fffdc940fc373e44c822f74c7b2db4e0ac666c0.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/43.892861"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores

M.H. Tehranipour, S.M. Fakhraie, Z. Navabi, M.R. Movahedin
<span title="">2004</span> <i title="Springer Nature"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/dt5ooavfurcrfbcz432scm5wcu" style="color: black;">Journal of electronic testing</a> </i> &nbsp;
In our proposed architecture, a self test program called BIST Program is stored in an embedded ROM as a vehicle for applying tests.  ...  We first start with testing processor core using our proposed architedture. Once the testing of the processor core is completed, this core is used to test the embedded SRAMs.  ...  One of the most widely researched self-testing techniques is Built-In Self-Test (BIST), which uses embedded hardware test generators and test response analyzers to generate and apply test patterns on-chip  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1023/b:jett.0000023679.08518.bf">doi:10.1023/b:jett.0000023679.08518.bf</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ps3ege2h65cojbbtfoux5opp7a">fatcat:ps3ege2h65cojbbtfoux5opp7a</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20140402132452/http://www.engr.uconn.edu:80/~tehrani/publications/jetta04.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/70/00/70002f44d822e3ecfb3d09cb3214e7b8466cce12.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1023/b:jett.0000023679.08518.bf"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

Ioannis Voyiatzis
<span title="">2008</span> <i title="Hindawi Limited"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/dgruxbbpd5bedpkwsg4wfnroya" style="color: black;">VLSI design (Print)</a> </i> &nbsp;
Test set embedding built-in self test (BIST) schemes are a class of pseudorandom BIST techniques where the test set is embedded into the sequence generated by the BIST pattern generator, and they displace  ...  Single-seed embedding schemes embed the test set into a single sequence and demand extremely small hardware overhead since no additional control or memory to reconfigure the test pattern generator is required  ...  With test vector embedding, a precomputed (deterministic) test set is embedded into a sequence generated by a pseudorandom generator.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1155/2008/680157">doi:10.1155/2008/680157</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/td4wrgyenzfhrku3enfk4oqm2e">fatcat:td4wrgyenzfhrku3enfk4oqm2e</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20200211165830/http://downloads.hindawi.com/archive/2008/680157.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/0c/02/0c02655f2658e33169cd7e2aabe8f0aa08ee4cdc.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1155/2008/680157"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> hindawi.com </button> </a>
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