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Transistor Degradations in Very Large-Scale-Integrated CMOS Technologies [chapter]

Chang Yeol Lee
2018 Very-Large-Scale Integration  
Keywords: hot carrier injection (HCI), hot carrier degradation (HCD), hot carrier-resistant design, negative bias temperature instability (NBTI), reaction-diffusion (R-D) of hydrogen  ...  The historical evolution of hot carrier degradation mechanisms and their physical models are reviewed and an energy-driven hot carrier aging model is verified that can reproduce 62-nm-gate-long hot carrier  ...  Acknowledgements The author would like to express his appreciation for the device modeling and reliability group and the DRAM device group of SK hynix for providing valuable measurement data and discussions  ... 
doi:10.5772/intechopen.68825 fatcat:k7plbtzeyvamvi3rzof6btr4ne

SOI for digital CMOS VLSI: design considerations and advances

Ching-Te Chuang, Pong-Fe Lu, C.J. Anderson
1998 Proceedings of the IEEE  
The impact of floating-body in partially depleted devices on the circuit operation, stability, and functionality are addressed.  ...  This paper reviews the recent advances of silicon-on-insulator (SOI) technology for complementary metal-oxide-semiconductor (CMOS) very-large-scale-integration memory and logic applications.  ...  The parasitic bipolar effect also worsens while CMOS devices are degraded at an elevated temperature.  ... 
doi:10.1109/5.663545 fatcat:6lcb6y72k5hphoahsmutzgytbi

Superimposed In-Circuit Fault Mitigation for Dynamically Reconfigurable FPGAs

Alexandra Kourfali, David Merodio Codinachs, Dirk Stroobandt
2017 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)  
total ionizing dose effects.  ...  Tomsk Polytechnic University, 6 National Research Nuclear University "MEPhI", 7 Novosibirsk State University Radiation hardened bandgap voltage reference was designed using Verilog-A physical modeling of  ...  Radiation induced degradation of widely used bipolar voltage comparators was investigated in wide temperature range from high to liquid nitrogen temperatures.  ... 
doi:10.1109/radecs.2017.8696242 fatcat:frcrfuza2fdstitbsjoda5sn4y

Ultra-thin nanograin polysilicon devices for hybrid CMOS-NANO integrated circuits

Serge Ecoffey
2007
Of course my first thought goes to Prof. Adrian Ionescu, who gave me the opportunity and the privilege to realize my PhD in his laboratory.  ...  Laboratoire d'électronique générale 2 SECTION DE GÉNIE ÉLECTRONIQUE A mes parents Acknowledgements I would have been surely unable to finish my PhD without the great help of the numerous people that contributed  ...  Room temperature electrical characterization". The co-integration of polySiNW and nMOSFET has no effect on the polySiNW electrical characteritics.  ... 
doi:10.5075/epfl-thesis-3722 fatcat:hqyihx5rubabxpudmenmitjo34