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IFIP Advances in Information and Communication Technology
We describe a new method for design error diagnosis in digital circuits that doesn't use any error model. ... This allows to adopt the methods and tools of fault diagnosis used in hardware testing for the use in design error diagnosis. ... CONCLUSIONS In this paper, a new approach to design error diagnosis in combinational circuits without error model is proposed. ...doi:10.1007/978-0-387-35498-9_25 fatcat:3ncqtkm4uvblhd65qv7ghpqaeq
Causes and symptoms of logic faults in digital systems. ... Fault detection in digital circuits is implemented either by periodic or by concurrent diagnosis. ... The alternate diagnosis method is concurrent diagnosis in which error-detecting codes and monitoring circuits are employed to show the presence of faults. ...doi:10.1145/1465611.1465708 dblp:conf/afips/Avizienis67 fatcat:wtu2n5wp2vdxpe2acea6rbj4zi
Proceedings. 42nd Design Automation Conference, 2005.
Random errors according to the fault model are introduced in the virtual test environment on top of the process variations and it is shown that diagnosis of a fault is possible with high accuracy with ... A design for test (DFT) hardware is proposed to increase the controllability of a thermometer coded current steering digital to analog converter. ... INTRODUCTION Digital to analog converters are used quite often in mixed signal circuits. ...doi:10.1109/dac.2005.193934 fatcat:cdd3tclwvfdchik2axrabpjrmu
Random errors according to the fault model are introduced in the virtual test environment on top of the process variations and it is shown that diagnosis of a fault is possible with high accuracy with ... A design for test (DFT) hardware is proposed to increase the controllability of a thermometer coded current steering digital to analog converter. ... INTRODUCTION Digital to analog converters are used quite often in mixed signal circuits. ...doi:10.1145/1065579.1065803 dblp:conf/dac/TopalogluO05 fatcat:yfeyl4s7abd3vm2y67qqtbfoam
Automation and Remote Control
FAULT DIAGNOSIS IN DIGITAL DEVICES BASED ON INTEGRATED CIRCUITS M. A. Orlyuk and Yu. G. ... In what follows we shall consider one approach to diagnosing IC devices, making use of the analogy between the problems of error correction in digital devices and of fault diagnosis. ...
With the increase in the complexity of digital VLSI circuit design, logic design errors can occur during synthesis. ... Experiments also indicate that test vector simulation is indeed an attractive technique for multiple design error diagnosis and correction in digital VLSI circuits. ... INTRODUCTION D URING the design cycle of a VLSI digital circuit, functional mismatches between the specification and the gate-level implementation (design) can occur. ...doi:10.1109/43.811329 fatcat:5chjpsuv5jf3de7bc5xkeq6g2i
the analog components in the converter. ... In the flash ADC, a fault causes deviation of DNL data from the ideal one. Hence, DNL data can be considered as a functional signature of the ADC. This property is employed for fault diagnosis. ... (IMS) for supporting the experiments reported in this paper. ...doi:10.1109/82.502317 fatcat:kbp65vw4tvdsnjs4cnt2e5xnp4
With the advancement of digital microfluidics technology, applications such as on-chip DNA analysis, point of care diagnosis and automated drug discovery are common nowadays. ... Errors found in these biochips are mainly due to the defects developed during droplet manipulation, chip degradation and inaccuracies in the bio-assay experiments. ... The first breakthrough in designing digital microfluidics was reported by Fan et al. ...doi:10.3390/s17081719 pmid:28749411 pmcid:PMC5579529 fatcat:rfvqq2xhybdupgxwsb73mos2xy
Due to the limitation of circuit observability and testing vectors, the diagnosis program can not accurately locate the fault just once in the process of diagnosis because the circuit is complex and users ... In this study, LASAR is used to carry out the logic circuit simulation so as to create such documents as fault dictionary, node truth value table, etc. for the preparation of fault detection. ... Yang (2000) has a research of the digital system fault diagnosis and reliability design. ...doi:10.19026/rjaset.5.4272 fatcat:65l57q7w45bwfkukbcgtszy2wa
The Best of ICCAD
In particular, no enumeration of the faulty patterns is necessary to find out the incorrect gates in the circuit. The diagnosis system can handle any circuit that can be verified by PRIAM. ... This paper presents the original extensions brought to PRIAM to automate both the diagnoses and the rectification of the design errors detected by this tool. ... Automating the Diagnosis of Design Errors This section shows that diagnosing design errors is a simpler problem than diagnosing faults in real circuits. ...doi:10.1007/978-1-4615-0292-0_2 fatcat:4px4lvafifc53jyyisn5pb77zi
diagnosis. ... This paper deals with a new transformation and fusion of digital input patterns used to train and test feed-forward neural network for a wound rotor three-phase induction machine windings short-circuits ... machine windings short-circuits diagnosis. ...doi:10.1109/tie.2012.2229675 fatcat:jhviilfmw5hpdhvfrwgv5v7jwa
Signals and Communication Technology
built-in self-correction circuits. ... Moreover, BIST can generate test simulations and analyze test responses without outside support, making tests and diagnoses of digital systems quick and effective. ... In other words, the self-detection capability uses the detector circuit in DAS. Third, the selector circuit in DAS delivers the error signal to SAC for error correction. ...doi:10.1007/978-94-007-6742-3_2 fatcat:jpobqitiyfgk5akn23ssvmf76m
Hierarchical application of Triple-Modular Redundancy (TMR) increases fault tolerance of digital Integrated Circuit (IC). ... In this paper, a simple probabilistic model was proposed for analysis of fault masking performance of hierarchical TMR networks. ... Performance Analysis Of Hierarchical TMR Network By Error Probability Models: Error probability model was developed for the analysis of fault masking performance of TMR network in a faulty digital system ...arXiv:0902.0241v2 fatcat:hhdatzclzjfgrljjt3rilywe5q
the error of nonlinearity with our model and it can be implement in biomedical signal which are low power signal ... In this paper we propose a neural ADC-SAR capable of detecting low power and low voltage signals and capable of converting these analogue signals to digital signals for less power consuming diagnostic ... Thus, they design an 8-bit arithmetic circuit with a digital input and digital output artificial neural network with a computational speed of 33.3 MHz and a computational efficiency of 2.21 TOPS / W. - ...doi:10.5281/zenodo.6513248 fatcat:5agxqgaawjdpzgnhoydw7dv2du
built-in self-correction circuits. ... The extended techniques of BIST are built-in self-diagnosis and built-in self-repair (BISR). ... In other words, the self-detection capability uses the detector circuit in DAS. Third, the selector circuit in DAS delivers the error signal to SAC for error correction. ...doi:10.9790/2834-0823639 fatcat:hvkjgqrecrdzphl4kkkrvc3zsq
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