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Defect classification and defect types revisited

Stefan Wagner
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
to quality models -better integrate the classification in the QA process -Convince practicioners of the value of defect classification  ...  • Useful quality assurance optimisation only possible using defect classifications intensively • We need to -find the important dimensions -for different artefacts -provide empirical data -relate classifications  ... 
doi:10.1145/1390817.1390829 dblp:conf/issta/Wagner08 fatcat:l3wwcyb7hbdmnlnacvq534lxj4

SZZ revisited

Chadd Williams, Jaime Spacco
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
Also, the SZZ algorithm relies on annotation graphs, which are imprecise in the face of large blocks of modified code, for back-tracking through previous revisions to the fix-inducing change.  ...  However, as of yet no one has verified that the fix-inducing lines identified by SZZ are in fact responsible for introducing the fixed bug.  ...  To copy otherwise, to republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. DEFECTS'08, July 20, 2008, Seattle, Washington, USA.  ... 
doi:10.1145/1390817.1390826 dblp:conf/issta/WilliamsS08 fatcat:gxnwlroprrfx7o5zexk2kiq5s4

The impact of product development on the lifecycle of defects

Rudolf Ramler
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
This paper investigates the defects of a large embedded software development project over a period of about two years.  ...  in software development.  ...  In this paper we investigate the development of a large embedded software system in the context of product development.  ... 
doi:10.1145/1390817.1390823 dblp:conf/issta/Ramler08 fatcat:nd42hnu3q5bdtlwpogi2mkidwy

Exploring the relationship of history characteristics and defect count

Timea Illes-Seifert, Barbara Paech
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
In this paper, we present the results of an empirical study, exploring the relationship between history characteristics of software entities and their defects.  ...  During the lifetime of a project, a huge amount of information is generated, e.g. in versioning systems or bug data bases.  ...  INTRODUCTION Versioning control and defect tracking systems contain a large amount of information documenting the evolution of a software project.  ... 
doi:10.1145/1390817.1390821 dblp:conf/issta/Illes-SeifertP08 fatcat:2p7cvscthvab3njht2rpj675uy

Retrieving similar code fragments based on identifier similarity for defect detection

Norihiro Yoshida, Takashi Ishio, Makoto Matsushita, Katsuro Inoue
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
We present two case studies of similar defects in open source systems.  ...  To support developers who would like to detect such defects, we propose a method to retrieve similar code fragments in source code based on the similarity of identifiers between a query and a target code  ...  Especially, large-scale software systems, such as Linux and JDK(Java Development Kit), often involves a large number of similar code fragments [4] .  ... 
doi:10.1145/1390817.1390830 dblp:conf/issta/YoshidaIMI08 fatcat:3vybmr5gp5af3mesyylhnt7x3m

Predicting fault-prone modules based on metrics transitions

Yoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
Metrics transitions should be an good indicator of software quality because they reflect how the software system has evolved.  ...  Metrics transitions are measured from the source code of consecutive versions, which is archived in software repositories.  ...  To copy otherwise, to republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. DEFECTS'08, July 20, 2008, Seattle, Washington, USA.  ... 
doi:10.1145/1390817.1390820 dblp:conf/issta/HigoMKI08 fatcat:ii3ulsgirvanbczrenzedo5vl4

A criterion for filtering code clone related bugs

Yasuhiro Hayase, Yii Yong Lee, Katsuro Inoue
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
Software reviews are time-consuming task especially for large software systems.  ...  In our experiments, filtering with the proposed criterion removed 30% of the false-positive candidates and no true-positive candidates.  ...  Acknowledgment This work was supported by Japan Society for the Promotion of Science under Grant-in-Aid for Scientific Research (A) (17200001).  ... 
doi:10.1145/1390817.1390828 dblp:conf/issta/HayaseLI08 fatcat:mpplunob6fax5mb2ufyqlk4dkm

A report on a survey and study of static analysis users

Nathaniel Ayewah, William Pugh
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
As static analysis tools mature and attract more users, vendors and researchers have an increased interest in understanding how users interact with them, and how they impact the software development process  ...  into their software processes.  ...  To copy otherwise, to republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. DEFECTS'08, July 20, 2008, Seattle, Washington, USA.  ... 
doi:10.1145/1390817.1390819 dblp:conf/issta/AyewahP08 fatcat:cizbmmd6ynbpxeiydheoyynxta

Can data transformation help in the detection of fault-prone modules?

Yue Jiang, Bojan Cukic, Tim Menzies
2008 Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08  
Data preprocessing (transformation) plays an important role in data mining and machine learning.  ...  In this study, we investigate the effect of four different preprocessing methods to fault-proneness prediction using nine datasets from NASA Metrics Data Programs (MDP) and ten classification algorithms  ...  To copy otherwise, to republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. DEFECTS'08, July 20, 2008, Seattle, Washington, USA.  ... 
doi:10.1145/1390817.1390822 dblp:conf/issta/JiangCM08 fatcat:edbyqgno75a3jd42k3uiktwxy4

ITC 2008 Highlights

Nur A. Touba
2008 IEEE Design & Test of Computers  
&THE 2008 INTERNATIONAL Test Conference will be held in Santa Clara, California on 28-30 October.  ...  Lydon will discuss the role of test in managing very large end-to-end supply chains.  ... 
doi:10.1109/mdt.2008.144 fatcat:mvfee3wxrnhl3oy6cezu4afobm

Improving the readability of defect reports

Bogdan Dit, Andrian Marcus
2008 Proceedings of the 2008 international workshop on Recommendation systems for software engineering - RSSE '08  
We propose a system, which recommends developers a set of comments related to their own comment, such that developers can explicitly make connections between the new comment and existing ones.  ...  In order to keep discussions coherent and easy to understand, comments should specify if they contain responses to previously posted comments and should not refer to more than one topic.  ...  ACKNOWLEDGMENTS This work is supported in part by grants from the US National Science Foundation (CCF-0438970 and CCF-0820133).  ... 
doi:10.1145/1454247.1454265 dblp:conf/sigsoft/DitM08 fatcat:3kdzh2qrxban3hwh6aqhpp7dsq

Predicting Defect Content and Quality Assurance Effectiveness by Combining Expert Judgment and Defect Data - A Case Study

Michael Kläs, Haruka Nakao, Frank Elberzhager, Jürgen Münch
2008 2008 19th International Symposium on Software Reliability Engineering (ISSRE)  
Planning quality assurance (QA) activities in a systematic way and controlling their execution are challenging tasks for companies that develop software or software-intensive systems.  ...  To evaluate the method's applicability and usefulness, we conducted a case study in the context of independent verification and validation activities for critical software in the space domain.  ...  A calculation of the effectiveness and the estimated number of remaining defects can be done based on the assumption that a large amount of defects found by only one inspector results in a high overall  ... 
doi:10.1109/issre.2008.43 dblp:conf/issre/KlasNEM08 fatcat:fppz6hb2fzfdrnwqd3gz3l5jwe

Finding synchronization defects in java programs

Frank Otto, Thomas Moschny
2008 Proceedings of the 1st international workshop on Multicore software engineering - IWMSE '08  
Our approach uses static analysis techniques combined with points-to and may-happen-in-parallel (MHP) information to reduce the number of false positives.  ...  Our tool was tested with small code examples, an open source web server, and commercial software. First results show that the number of false positives is reduced significantly.  ...  INTRODUCTION Software systems often perform several tasks in parallel, operating on shared data. It is well-known that correct synchronization of parallel applications is difficult.  ... 
doi:10.1145/1370082.1370093 fatcat:xxacazgchjgwjfgb4tf4x2xw3y

Implications of ceiling effects in defect predictors

Tim Menzies, Burak Turhan, Ayse Bener, Gregory Gay, Bojan Cukic, Yue Jiang
2008 Proceedings of the 4th international workshop on Predictor models in software engineering - PROMISE '08  
Further progress in learning defect predictors may not come from better algorithms.  ...  Method: An initial literature review documents the ceiling effect in other work.  ...  As far back as 1999, software metrics experts Fenton and Neil [12] postulated that such human-machines-based system might out-perform systems based on on static code measures (since other features/metrics  ... 
doi:10.1145/1370788.1370801 fatcat:pmjx3fyggnftbaahmi3rmghhha

Automating defects simulation and fault modeling for SRAMs

Stefano Di Carlo, Paolo Prinetto, Alberto Scionti, Zaid Al-Ars
2008 2008 IEEE International High Level Design Validation and Test Workshop  
The continuos improvement in manufacturing process density for Very Deep Sub Micron technologies constantly leads to new classes of defects in memory devices.  ...  Target defects are modeled at the electrical level in order to optimize the results to the specific technology and memory architecture. 169 978-1-4244-2922-6/08/$25.00  ...  one of the most time consuming tasks in defect-oriented testing.  ... 
doi:10.1109/hldvt.2008.4695898 dblp:conf/hldvt/CarloPSA08 fatcat:o3w5ptht3bdmljl2ifebrlcrlq
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