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Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation

Sheng Yang, Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Geoff V. Merrett
<span title="">2013</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/l6r6h4xpzvh6jkuzrx565pgwgu" style="color: black;">IEEE Transactions on Circuits and Systems Part 1: Regular Papers</a> </i> &nbsp;
In case of error detection, it dynamically adjusts MRV per die to avoid subsequent errors.  ...  The proposed technique consists of characterization algorithm to determine minimum state retention voltage (MRV) of each die, and employs horizontal and vertical parity for error detection and single bit  ...  Secondly, a control flow is proposed for state monitoring and protection of flip-flops, which uses parity for multi-bit error detection and single bit error correction.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcsi.2013.2252640">doi:10.1109/tcsi.2013.2252640</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/htlw64q2tbgn3g6xp3dp2jfwxm">fatcat:htlw64q2tbgn3g6xp3dp2jfwxm</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20180719172247/https://eprints.soton.ac.uk/348727/1/LVSI_eprint.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/60/94/60941b44e93a2f9b9a40fb17a2858ad3895c430d.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcsi.2013.2252640"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Scan based methodology for reliable state retention power gating designs

Sheng Yang, Bashir M Al-Hashimi, David Flynn, Saqib Khursheed
<span title="">2010</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/qjrrvry5ubgdlarkymvlxuip6m" style="color: black;">2010 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE 2010)</a> </i> &nbsp;
The methodology is compatible with EDA tools design and power gating control flows.  ...  The methodology is validate using FPGA and show that it is possible to correct all single errors with Hamming code and detect all multiple errors with CRC-16 code.  ...  Fig. 3 3 (a) shows the conventional power gating control flow.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/date.2010.5457233">doi:10.1109/date.2010.5457233</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/date/YangAFK10.html">dblp:conf/date/YangAFK10</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/lrxb3e6tdne3rdcuk7h6o73swe">fatcat:lrxb3e6tdne3rdcuk7h6o73swe</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170706095353/https://eprints.soton.ac.uk/268275/1/Scan_Based_Methodology_for_Reliable_State_Retention_Power_Gating_Design.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/ab/7b/ab7b18675fdd3f070d5ce47270f24868678f923c.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/date.2010.5457233"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Hardware assisted pre-emptive control flow checking for embedded processors to improve reliability

Roshan G. Ragel, Sri Parameswaran
<span title="">2006</span> <i title="ACM Press"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/h4zelo33ojdfzbwajaf5qlthey" style="color: black;">Proceedings of the 4th international conference on Hardware/software codesign and system synthesis - CODES+ISSS &#39;06</a> </i> &nbsp;
T hi s paper pr esent s a scalable, cost effective and novel fault detection technique, to ensure proper control flow of a program.  ...  Reliability in embedded processors can be improved by control flow checking and such checking can be conducted using software or hardware.  ...  The technique propsoed in this paper detects bit flips in instruction memory by duplicating the control flow instruction (CFI) and performing a hardware checking.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/1176254.1176280">doi:10.1145/1176254.1176280</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/codes/RagelP06.html">dblp:conf/codes/RagelP06</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/7egq7itj4bez3kw6ymeepuylbm">fatcat:7egq7itj4bez3kw6ymeepuylbm</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170812055031/http://cecs.uci.edu/~papers/esweek06/codes/p100.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/e8/96/e8965cc1925bd824a51e214e069e68d11703ec75.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/1176254.1176280"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> acm.org </button> </a>

NBTI/PBTI-Aware WWL Voltage Control for Half-Selected Cell Stability Improvement

Zhao Chuan Lee, Kam Chew Leong, Zhi Hui Kong, Tony Tae-Hyoung Kim
<span title="">2013</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/c352rf3zizflhbzkvxrawww7mu" style="color: black;">IEEE Transactions on Circuits and Systems - II - Express Briefs</a> </i> &nbsp;
This brief presents a negative bias temperature instability (BTI)/positive BTI-aware write-wordline (WWL) voltage control technique for improving degraded cell stability of halfselected cells without extra  ...  Finally, we also present a sample circuit implementation of the proposed WWL voltage control scheme.  ...  Fig. 11 . 11 Simplified diagram of the proposed WWL control scheme. Fig. 12 . 12 WWL driver with voltage control. Fig. 13 . 13 Margin control for detecting data flip in the near future.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcsii.2013.2273731">doi:10.1109/tcsii.2013.2273731</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/lkzv4zzirzh6fjgxud6iassfcu">fatcat:lkzv4zzirzh6fjgxud6iassfcu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170809113756/http://www3.ntu.edu.sg/home/thkim/publication_files/TCAS-II13_NBTI.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/33/10/3310ea35a36b2bea900a51ba1cddb3f04bc22461.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcsii.2013.2273731"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Hardware Trojan Detection Using Controlled Circuit Aging [article]

Virinchi Roy Surabhi, Prashanth Krishnamurthy, Hussam Amrouch, Kanad Basu, Jörg Henkel, Ramesh Karri, Farshad Khorrami
<span title="2020-04-21">2020</span> <i > arXiv </i> &nbsp; <span class="release-stage" >pre-print</span>
We present experiments using aging-aware standard cell libraries to illustrate the usefulness of the technique in detecting hardware Trojans.  ...  We use machine learning to learn the bit error distribution at the output of a clean IC.  ...  Figure 5 shows the tool flow. C. SVM-based Machine Learning A one-class SVM is trained to learn bit error patterns produced at the outputs (details in Section 2); therefore, detecting Trojans.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener" href="https://arxiv.org/abs/2004.02997v3">arXiv:2004.02997v3</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/s6ky3xitlnanjn7mnbjdihu32i">fatcat:s6ky3xitlnanjn7mnbjdihu32i</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20200502131244/https://arxiv.org/pdf/2004.02997v3.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] </button> </a> <a target="_blank" rel="external noopener" href="https://arxiv.org/abs/2004.02997v3" title="arxiv.org access"> <button class="ui compact blue labeled icon button serp-button"> <i class="file alternate outline icon"></i> arxiv.org </button> </a>

Instruction Level Duplication and Comparison for Data Error Detection: a First Experiment

Venu Babu Thati, Jens Vankeirsbilck, Davy Pissoort, Jeroen Boydens
<span title="">2018</span> <i title="IEEE"> 2018 IEEE XXVII International Scientific Conference Electronics - ET </i> &nbsp;
The results show that ILDC detects more errors than VAR3+ and SWIFT at a lower overhead.  ...  In this paper, we present a new software approach Instruction Level Duplication and Comparison (ILDC) for data error detection. We implemented ILDC in five different case studies.  ...  An overview of control flow error detection techniques is given by Vankeirsbilck et al. [8] .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/et.2018.8549589">doi:10.1109/et.2018.8549589</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/c7ahu47l4ndlvf3n5fqzbuig3e">fatcat:c7ahu47l4ndlvf3n5fqzbuig3e</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20210716212518/https://lirias2repo.kuleuven.be/bitstream/handle/123456789/630376/ET%202018_Venu%20Babu%20Thati.pdf;jsessionid=AE6D3D30C8F9A4B1E3C3E6AED0891BDE?sequence=2" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/75/a7/75a773c013bde897f7e63f6f3d4aa28091e40799.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/et.2018.8549589"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Hardware Trojan Detection Using Controlled Circuit Aging

Virinchi Roy Surabhi, Prashanth Krishnamurthy, Hussam Amrouch, Kanad Basu, Jorg Henkel, Ramesh Karri, Farshad Khorrami
<span title="">2020</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/q7qi7j4ckfac7ehf3mjbso4hne" style="color: black;">IEEE Access</a> </i> &nbsp;
CONCLUSION This study shows effectiveness of controlled aging in detecting Trojans.  ...  Figure 5 shows the tool flow. C. SVM-BASED MACHINE LEARNING A one-class SVM is trained to learn bit error patterns produced at the outputs (details in Section 2); therefore, detecting Trojans.  ...  systems and decentralized control.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/access.2020.2989735">doi:10.1109/access.2020.2989735</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/lefwri5cqjeh7ghi3vk3jpoaku">fatcat:lefwri5cqjeh7ghi3vk3jpoaku</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20200429063323/https://ieeexplore.ieee.org/ielx7/6287639/6514899/09076619.pdf?tp=&amp;arnumber=9076619&amp;isnumber=6514899&amp;ref=" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/access.2020.2989735"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> ieee.com </button> </a>

An Improved Data Error Detection Technique for Dependable Embedded Software

Venu Babu Thati, Jens Vankeirsbilck, Niels Penneman, Davy Pissoort, Jeroen Boydens
<span title="">2018</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/x5uwpbdsencsdhvhuklwktaocy" style="color: black;">2018 IEEE 23rd Pacific Rim International Symposium on Dependable Computing (PRDC)</a> </i> &nbsp;
This paper presents a new software-implemented data error detection technique called Full Duplication and Selective Comparison.  ...  Next, we compared the obtained results to the parameters of three established techniques: Error Detection by Diverse Data and Duplicated Instructions, Critical Block Duplication and Software Implemented  ...  Such bit-flips have a further effect on the program during execution. The effect can be mainly in terms of data errors and control flow errors.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/prdc.2018.00037">doi:10.1109/prdc.2018.00037</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/prdc/ThatiVPPB18.html">dblp:conf/prdc/ThatiVPPB18</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/k224dmkulbeljcjdipm6gi74w4">fatcat:k224dmkulbeljcjdipm6gi74w4</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20210718000039/https://lirias2repo.kuleuven.be/bitstream/handle/123456789/635796/08639681.pdf;jsessionid=C136715B296F6A0F47EF92A4798EDB68?sequence=2" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/4d/4b/4d4bacb95c664ed7edf117d54952fa0a612115a7.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/prdc.2018.00037"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

A Practitioner's Guide to Software-Based Soft-Error Mitigation Using AN-Codes

Martin Hoffmann, Peter Ulbrich, Christian Dietrich, Horst Schirmeier, Daniel Lohmann, Wolfgang Schroder-Preikschat
<span title="">2014</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/tkpuwbdq2jbvrc3gixguxikkci" style="color: black;">2014 IEEE 15th International Symposium on High-Assurance Systems Engineering</a> </i> &nbsp;
Our measures eliminate all remaining SDCs in the CoRed voter, which is validated by an extensive fault-injection campaign that covers 100 percent of the fault space for 1-bit and 2-bit errors. I .  ...  Arithmetic error coding schemes (AN codes 1 ) are a well known and effective technique for soft error mitigation.  ...  Injecting single-bit flips in the PC resulted in random jumps by an offset of power of two, leading to an incorrect control flow. Most of those jumps are detected by the MMU-based isolation.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/hase.2014.14">doi:10.1109/hase.2014.14</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/hase/HoffmannUDSLS14.html">dblp:conf/hase/HoffmannUDSLS14</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/bgefm5eyfjew3au2utiw3acxdi">fatcat:bgefm5eyfjew3au2utiw3acxdi</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20140717134704/https://www4.cs.fau.de/Publications/2014/hoffmann_14_hase.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/8f/81/8f812bacbb05a5149fc7492a2200833e63dc8fe0.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/hase.2014.14"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

A Case Study in Reliability-Aware Design: A Resilient LDPC Code Decoder

Matthias May, Matthias Alles, Norbert Wehn
<span title="">2008</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/qjrrvry5ubgdlarkymvlxuip6m" style="color: black;">2008 Design, Automation and Test in Europe</a> </i> &nbsp;
In this paper we present a case study in reliability-aware design tolerating transient errors.  ...  Hence increasing the robustness of chip implementations in terms of error tolerance becomes an important issue.  ...  To detect not only bit flip but also timing errors the duplicated sign signal is flipped every second clock cycle, see Figure 5 .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/date.2008.4484723">doi:10.1109/date.2008.4484723</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/date/MayAW08.html">dblp:conf/date/MayAW08</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/up77lmvwzjcejgrl3et23oqkmq">fatcat:up77lmvwzjcejgrl3et23oqkmq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170705063843/https://ems.eit.uni-kl.de/fileadmin/ems/pdf/04.4_3_0164.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/19/b0/19b0c67879b66dfbc507137cd0844f8842a326e4.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/date.2008.4484723"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

A case study in reliability-aware design

Matthias May, Matthias Alles, Norbert Wehn
<span title="">2008</span> <i title="ACM Press"> Proceedings of the conference on Design, automation and test in Europe - DATE &#39;08 </i> &nbsp;
In this paper we present a case study in reliability-aware design tolerating transient errors.  ...  Hence increasing the robustness of chip implementations in terms of error tolerance becomes an important issue.  ...  To detect not only bit flip but also timing errors the duplicated sign signal is flipped every second clock cycle, see Figure 5 .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/1403375.1403484">doi:10.1145/1403375.1403484</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/lctos32yd5cbfayyc7qmovffua">fatcat:lctos32yd5cbfayyc7qmovffua</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170705063843/https://ems.eit.uni-kl.de/fileadmin/ems/pdf/04.4_3_0164.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/19/b0/19b0c67879b66dfbc507137cd0844f8842a326e4.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/1403375.1403484"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> acm.org </button> </a>

RAP Model—Enabling Cross-Layer Analysis and Optimization for System-on-Chip Resilience [chapter]

Andreas Herkersdorf, Michael Engel, Michael Glaß, Jörg Henkel, Veit B. Kleeberger, Johannes M. Kühn, Peter Marwedel, Daniel Mueller-Gritschneder, Sani R. Nassif, Semeen Rehman, Wolfgang Rosenstiel, Ulf Schlichtmann (+4 others)
<span title="2020-12-10">2020</span> <i title="Springer International Publishing"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/jchr2ocdj5hfhk4vv3g3huukfi" style="color: black;">Embedded Systems</a> </i> &nbsp;
When probabilistic error functions for specific fault origins are known at the bit or signal level, knowledge about the unit of design and its environment allow the transformation of the bit-related error  ...  Furthermore, we show by different examples how probabilistic bit flips are systematically abstracted and propagated towards instruction and data vulnerability at MPSoC architecture level, and how RAP can  ...  propagation and error masking due to data flow; (c) Example for error masking due to control flow Fig. 14 14 Horizontal propagation of an error in the RAP model execution while allowing a system designer  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1007/978-3-030-52017-5_1">doi:10.1007/978-3-030-52017-5_1</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ip3awa6v6bfrbbciabmtwuxl7a">fatcat:ip3awa6v6bfrbbciabmtwuxl7a</a> </span>
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Compiler Optimizations Do Impact the Reliability of Control-Flow Radiation Hardened Embedded Software [chapter]

Rafael B. Parizi, Ronaldo R. Ferreira, Luigi Carro, Álvaro F. Moreira
<span title="">2013</span> <i title="Springer Berlin Heidelberg"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/kss7mrolvja63k4rmix3iynkzi" style="color: black;">IFIP Advances in Information and Communication Technology</a> </i> &nbsp;
This paper characterizes how compiler optimizations impact software control-flow reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct  ...  Automatic Correction of Control-flow Errors ACCE [9] is a software technique for reliability that detects and corrects control-flow errors (CFE) due to random and arbitrary bit flips that might occur  ...  Since ACCE is a SIHFT technique to detect and correct control-flow errors, the adopted fault model simulates three distinct control flow disruptions that might occur due to a control flow error.  ... 
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Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML Systems [article]

Shail Dave, Alberto Marchisio, Muhammad Abdullah Hanif, Amira Guesmi, Aviral Shrivastava, Ihsen Alouani, Muhammad Shafique
<span title="2022-04-18">2022</span> <i > arXiv </i> &nbsp; <span class="release-stage" >pre-print</span>
The technique employs razor flip-flops for detecting timing errors in MAC units.  ...  The design is based on the observation that 0-to-1 bit-flips in DNNs result in a higher accuracy drop compared to 1-to-0 bit-flips.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener" href="https://arxiv.org/abs/2204.09514v1">arXiv:2204.09514v1</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ho7auszvmferrn36evs7oqdpt4">fatcat:ho7auszvmferrn36evs7oqdpt4</a> </span>
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Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience)

Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra
<span title="">2018</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/rl7xk4fwazdrred2difr6v3lii" style="color: black;">IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems</a> </i> &nbsp;
However, (application-aware) selective circuit-level hardening alone, guided by a thorough analysis of the effects of soft errors on application benchmarks, provides a cost-effective soft error resilience  ...  In this paper, we focus on radiation-induced soft errors in processor cores. We address both single-event upsets (SEUs) and single-event multiple upsets (SEMUs) in terrestrial environments.  ...  Architecture: Our implementation of Data Flow Checking (DFC), which checks static dataflow graphs, includes Control Flow Checking (CFC), which checks static control-flow graphs.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/tcad.2017.2752705">doi:10.1109/tcad.2017.2752705</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/z32wkurqzvgfto6ajctiynkenq">fatcat:z32wkurqzvgfto6ajctiynkenq</a> </span>
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