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Development of in situ Imaging Capabilities in SEM and Their Applications

Y Hashimoto, A Muto, K Shigeto, H Ito, H Itabashi, M Ohno, T Saito, S Tachibana
2019 Microscopy and Microanalysis  
Figure 2 shows frame-by-frame images of a movie which recorded real time SEM image of the specimen with the new PD-BSED while tensile force was applied.  ...  Scanning electron microscope (SEM)s are widely used to observe fine structures of various types of materials, and recently demands of in situ observation with the SEM have been increasing to elucidate  ...  Scanning electron microscope (SEM)s are widely used to observe fine structures of various types of materials, and recently demands of in situ observation with the SEM have been increasing to elucidate  ... 
doi:10.1017/s1431927619003556 fatcat:2q6xoyo6wjh3ln2mkunifj5yli

Microscopy Methods for Biofilm Imaging: Focus on SEM and VP-SEM Pros and Cons

Michela Relucenti, Giuseppe Familiari, Orlando Donfrancesco, Maurizio Taurino, Xiaobo Li, Rui Chen, Marco Artini, Rosanna Papa, Laura Selan
2021 Biology  
This review illustrates the most widely used microscopy techniques in biofilm investigations, focusing on traditional and innovative scanning electron microscopy techniques such as scanning electron microscopy  ...  and cons of several methods with particular emphasis on conventional SEM and VP-SEM.  ...  Conflicts of Interest: The authors declare no conflict of interest.  ... 
doi:10.3390/biology10010051 pmid:33445707 fatcat:4wlles3c5rdkhbv3g3c7ktfx6y

Curvelet Based Offline Analysis of SEM Images

Syed Hamad Shirazi, Nuhman ul Haq, Khizar Hayat, Saeeda Naz, Ihsan ul Haque, Konradin Metze
2014 PLoS ONE  
Manual offline analysis, of a scanning electron microscopy (SEM) image, is a time consuming process and requires continuous human intervention and efforts.  ...  This paper presents an image processing based method for automated offline analyses of SEM images. To this end, our strategy relies on a two-stage process, viz. texture analysis and quantification.  ...  Scanning electron microscope (SEM), Atomic force microscope (AFM) and X-ray microscope are some of the main instruments used for the characterization of materials at microand nano-levels.  ... 
doi:10.1371/journal.pone.0103942 pmid:25089617 pmcid:PMC4121203 fatcat:7tbaru6pgnah3hvhpfa3ugr6ei

Real-time Image Processing and Restoration Prototype for the SEM: Initial Steps

G. Chilton, B.C. Breton, D.M. Holburn, N.H.M. Caldwell
2018 Microscopy and Microanalysis  
microscope (SEM) autofocusing [1], autofocusing and astigmatism correction using Fourier domain algorithms [2] , specific SEM-related image processing techniques [3], and automated gun alignment for tungsten  ...  In previous work, we have reported on a series of projects utilizing GPGPUs (General Purpose Graphics Processing Units) to improve instrument performance, notably preliminary work in scanning electron  ...  Real-time image processing and image restoration techniques enabled through GPGPU computation offer the potential to improve SEM images on all instruments, both in terms of improving upon what is attainable  ... 
doi:10.1017/s1431927618003070 fatcat:lhy34i5tsrebletanadz7ktwt4

Secondary Electron Count Imaging in SEM [article]

Akshay Agarwal, John Simonaitis, Vivek K. Goyal, Karl K. Berggren
2021 arXiv   pre-print
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale.  ...  Conventional imaging by this technique relies on finding the average intensity of the signal generated on a detector by secondary electrons (SEs) emitted from the sample and is subject to noise due to  ...  Here, an image frame refers to one scan of the incident electron beam over every pixel on the sample area being imaged.  ... 
arXiv:2111.01862v1 fatcat:3sglt7pdk5c6jdyzyj247usyai

Monte Carlo Simulation of SEM and SAM Images [chapter]

Y.G. Li, S.F. Mao, Z.J. Ding
2011 Applications of Monte Carlo Method in Science and Engineering  
Introduction Monte Carlo method and its applications to electron microscopic and spectroscopic techniques Electron microscopic and spectroscopic techniques The electron microscopic and spectroscopic techniques  ...  The principle of these techniques relies on electron-solid interaction.  ...  The CPU time can be reduced from ( ) ON to ( ) 13 ON by introducing the spatial subdividing technique.  ... 
doi:10.5772/16171 fatcat:l32fuz7txnhflbtiuzcxc4ld7e

Extracting Three-dimensional Information from SEM Images by Means of Photogrammetry

Paweł Kozikowski
2020 Micron  
Optical photogrammetry software has been applied to scanning electron microscope images to obtain 3D models and quantitative data on carbon particles and graphite nanoparticles.  ...  Image acquisition has been automated by the use of external macro software.  ...  Introduction Images obtained in a scanning electron microscope are two-dimensional and information about the third dimension is hidden.  ... 
doi:10.1016/j.micron.2020.102873 pmid:32339977 fatcat:wjesviuylbgu7e2df2dkf3nuqa

A New Image Restoration Technique for SEM

Kenji Nakahira, Atsushi Miyamoto, Toshifumi Honda
2008 IFAC Proceedings Volumes  
This paper proposes a new fast and effective method of image restoration to improve the resolution of SEM images.  ...  In our approach, image resolution is improved by deconvolution with the point spread function modeled as the intensity distribution of the electron beam at the specimen's surface.  ...  INTRODUCTION Scanning electron microscopes (SEM) have been widely used for observing microstructures in many fields, such as in semiconductor manufacturing, medical diagnostics, and biotechnology because  ... 
doi:10.3182/20080706-5-kr-1001.01385 fatcat:3de3yzrmkbfk7pgyn6dsy6hu44

Enhanced EDX images by fusion of multimodal SEM images using pansharpening techniques

2017 Journal of Microscopy  
The goal of this paper is to explore the potential interest of image fusion in the context of multimodal scanning electron microscope (SEM) imaging.  ...  Quantitative assessment is obtained by means of two SEM images and a simulated dataset produced by a software based on PENELOPE.  ...  Acknownledgement Florent Moreau is gratefully acknowledged for the acquisition of experimental SEM-EDX maps.  ... 
doi:10.1111/jmi.12612 pmid:28815605 fatcat:2ef6ggg4vjc2li6gfo5exws75m

Sequential SEM imaging of microbial calcite precipitation consolidation treatment

Nadim C. Scherrer, Matthias Kocsis, Petra Dariz, Claire Gervais
2021 The European Physical Journal Plus  
The presented method is capable of producing time-sequenced images on the same test area on natural rock surface samples without manipulation for imaging purposes.  ...  In order to achieve this on a tungsten SEM, we employed a beam deceleration accessory that allowed low kV imaging on non-conductive surfaces at a sufficiently high image resolution with a modified sample  ...  Surface topographic and compositional contrast images were generated on a standard Zeiss EVO MA10 tungsten emission scanning electron microscope (SEM) equipped with variable pressure (VP) air admittance  ... 
doi:10.1140/epjp/s13360-021-01497-7 fatcat:qn3uwqrklzc7ddfqluhc5t6vz4

Enhanced FIB-SEM systems for large-volume 3D imaging

C Shan Xu, Kenneth J Hayworth, Zhiyuan Lu, Patricia Grob, Ahmed M Hassan, José G García-Cerdán, Krishna K Niyogi, Eva Nogales, Richard J Weinberg, Harald F Hess
2017 eLife  
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can automatically generate 3D images with superior z-axis resolution, yielding data that needs minimal image registration and related post-processing  ...  Obstacles blocking wider adoption of FIB-SEM include slow imaging speed and lack of long-term system stability, which caps the maximum possible acquisition volume.  ...  We also thank Richard D Fetter for preparation and provision of various SEM samples, as wells as Kent McDonald for consultation on C. reinhardtii sample preparation.  ... 
doi:10.7554/elife.25916 pmid:28500755 pmcid:PMC5476429 fatcat:fx6tlulba5hvlpjvttfr6g4f5i

Combining confocal and BSE SEM imaging for bone block surfaces

A Boyde, L Lovicar, J Zamecnik
2005 European Cells and Materials  
The combination images enhance our understanding of what is going on -and re-establish the need for good cellular preservation.  ...  The present report presents a method for the correlation of qualitative and quantitative BSE SEM imaging with confocal scanning light microscopy (CSLM) imaging modes applied to bone samples embedded in  ...  The SEM facility for the determination of bone mineralisation density at the microscopic scale was funded by the MRC.  ... 
doi:10.22203/ecm.v009a05 fatcat:rhq74sn5ozc55azalmddlztrem

Quantitative Analysis of X-ray Lithographic Pores by SEM Image Processing

Udomchok Phromsuwan, Yaowarat Sirisathitkul, Chitnarong Sirisathitkul, Paisarn Muneesawang, Bunyarit Uyyanonvara
2013 MAPAN  
In this work, a pattern inspection by intensity-based digital image processing procedure is proposed and tested on scanning electron microscopy images of porous SU-8 polymer resist.  ...  Arrays of regular macropores in electronic, magnetic, photonic and sensing devices can be patterned by X-ray lithography.  ...  Acknowledgments This work was financially supported by the Industry/University Cooperative Research Center (I/UCRC) in HDD Component, the Faculty of Engineering, Khon Kaen University and National Electronics  ... 
doi:10.1007/s12647-013-0089-2 fatcat:2llafq2cn5binarcdfkyq7ndpe

Fundamentals of Scanning Electron Microscopy (SEM) [chapter]

Weilie Zhou, Robert Apkarian, Zhong Lin Wang, David Joy
2006 Scanning Microscopy for Nanotechnology  
The specimen stage, electron beam scanning coils, signal detection, and processing system provide real-time observation and image recording of the specimen surface.  ...  (a) Schematic of emission enhancement on the tip of a peak; and (b) SEM image of ZnO nanoneedles (emission is enhanced on the tips of the needles).  ...  It can help SEM users and nanomaterials researchers to master the basic techniques to study nanomaterials in a short time.  ... 
doi:10.1007/978-0-387-39620-0_1 fatcat:o6f2avu32fdc5asyu7cdweoj2u

High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles

Steffi Rades, Vasile-Dan Hodoroaba, Tobias Salge, Thomas Wirth, M. Pilar Lobera, Roberto Hanoi Labrador, Kishore Natte, Thomas Behnke, Thomas Gross, Wolfgang E. S. Unger
2014 RSC Advances  
The combination of complementary characterization techniques such as SEM (Scanning Electron Microscopy), T-SEM (Scanning Electron Microscopy in Transmission Mode), EDX (Energy Dispersive X-ray Spectroscopy  ...  Imaging by high resolution SEM and in the transmission mode by T-SEM allows almost simultaneous surface and in-depth inspection of the same particle using the same instrument.  ...  Acknowledgements We acknowledge the help of S. Benemann for operating the SEM.  ... 
doi:10.1039/c4ra05092d fatcat:pmmx2atn6zc3rhzuaqaz2jz6n4
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