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Design optimization of ESD protection and latchup prevention for a serial I/O IC

Chih-Yao Huang, Wei-Fang Chen, Song-Yu Chuan, Fu-Chien Chiu, Jeng-Chou Tseng, I-Cheng Lin, Chuan-Jane Chao, Len-Yi Leu, Ming-Dou Ker
<span title="">2004</span> <i title="Elsevier BV"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/wifafrwnbje2nhefblix5i3tcq" style="color: black;">Microelectronics and reliability</a> </i> &nbsp;
In the initial development phase, ignorance of latchup susceptibility resulted in severe Electrical Overstress (EOS) damage during latchup tests, and also gave a false over estimate of ESD protection threshold  ...  The latchup origin is an output PMOS and floating-well ESD triggering NMOS beside the PMOS, and the main fatal link is this high-voltage (HV) NMOS connecting to a bi-directional SCR cell.  ...  Yang of QRA for ESD/ latchup testing support; and to product department for arranging the tape-out, FA support and package procedure.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1016/j.microrel.2003.09.008">doi:10.1016/j.microrel.2003.09.008</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/pk2urphtxrcdbkdm4busj4jloy">fatcat:pk2urphtxrcdbkdm4busj4jloy</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170810032024/http://www.ics.ee.nctu.edu.tw/~mdker/Referred%20Journal%20Papers/2003-Design%20optimization%20of%20ESD%20protection%20and%20latchup%20prevention%20for%20a%20serial%20I%3DO%20IC.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/a1/3b/a13ba0a55b7f477ebb9e4cb377b39074e2cb15c0.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1016/j.microrel.2003.09.008"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> elsevier.com </button> </a>

Understanding Smart Sensors

Randy Frank
<span title="2000-11-20">2000</span> <i title="IOP Publishing"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/xsl2g2kf3fex5bolkcos2ua2ae" style="color: black;">Measurement science and technology</a> </i> &nbsp;
Furthermore, safety and reliability concerns, such as the potential failure modes from a system failure-mode-and-effect analysis (FMEA) can lead to more distributed intelligence when single-point failures  ...  The circuit, shown in Figure 11 .4(a), includes a voltage regulator, an oscillator, and a charge pump to provide a high-side switch with an N-channel power MOSFET.  ...  the external electrical voltage and/or current applied to a sensor for its proper operation (often referred to as the supply circuit or voltage).  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1088/0957-0233/11/12/711">doi:10.1088/0957-0233/11/12/711</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/inet5t3lzbecrczd2f5tdevkzq">fatcat:inet5t3lzbecrczd2f5tdevkzq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20160615181014/http://www.nomads.usp.br:80/pesquisas/design/dos/Capacitacao/arquivos/Understanding%20Smart%20Sensors,%202nd%20Ed.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/e5/62/e56283e1d554c082ba97b52ba3f5128e45cd3fd3.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1088/0957-0233/11/12/711"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> iop.org </button> </a>

Developing a transient induced latch-up standard for testing integrated circuits

M. Kelly, L.G. Henry, J. Barth, G. Weiss, M. Chaine, H. Gieser, D. Bonfert, T. Meuse, V. Gross, C. Hatchard, I. Morgan
<i title="ESD Assoc"> Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) </i> &nbsp;
Different transient stimuli and amplitudes were found to have varying effectiveness in creating a latch event.  ...  This paper presents the results of a search for a more effective stimulus suitable for assessing the latch-up susceptibility of integrated circuits.  ...  ESDA Device Testing WG-5.0 is acknowledged for their technical support and contributions during many meetings and teleconferences.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/eosesd.1999.819004">doi:10.1109/eosesd.1999.819004</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/u3vbjyaszvacxeuzm3gjoaq5zq">fatcat:u3vbjyaszvacxeuzm3gjoaq5zq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170809153933/http://www.aecouncil.com/Papers/aec9.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/01/81/0181b005aff348984b596d2b64bb66664a19d479.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/eosesd.1999.819004"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

Charging of composites in the space environment

Steven Czepiela, Daniel Hastings, Hugh McManus, Steven Czepiela, Daniel Hastings, Hugh McManus
<span title="1997-01-06">1997</span> <i title="American Institute of Aeronautics and Astronautics"> 35th Aerospace Sciences Meeting and Exhibit </i> &nbsp; <span class="release-stage">unpublished</span>
These deposited particles induce an electric field in the material, which causes the particles to move and thus changes the electric field.  ...  Deep dielectric charging occurs when high energy particles penetrate and deposit themselves in the insulating material of spacecraft components.  ...  The first constant is solved as: A, =-E o (50) Therefore the voltage solution is: V(r,) = -Eo( r - cos() (51) To calculate the electric field equation 9 is used in radial coordinates: av\ I, I 1 E(r,0)  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.2514/6.1997-629">doi:10.2514/6.1997-629</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ehlx2xacl5cijbiklcfi5piury">fatcat:ehlx2xacl5cijbiklcfi5piury</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20180724225631/http://dspace.mit.edu/bitstream/handle/1721.1/36090/38271534-MIT.pdf;jsessionid=4AE46BA22855933A1FB5421F6B3B1341?sequence=2" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/ac/d9/acd9a900e19ae64d74745dd45170351f3021c3bd.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.2514/6.1997-629"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

Submicron Systems Architecture Project : Semiannual Technical Report

Computer Science Technical Reports
<span title="">1992</span>
The MI.l chips passed HP's ESD tests at a higher voltage than production HP chips, but HP was able to induce a latchup in the Schmitt-trigger pads used for the request and acknowledge signals.  ...  Since the circuits are hazard-free by construction, there is no need to test for hazards in the circuit.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.7907/z9ws8rf5">doi:10.7907/z9ws8rf5</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/cslip4xltvgpzbzua2isz3catm">fatcat:cslip4xltvgpzbzua2isz3catm</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20181103092744/https://authors.library.caltech.edu/26759/1/CS_TR_92_17.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/6e/6e/6e6e9d05238ac8e4a84831bb66a41933c0419615.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.7907/z9ws8rf5"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> Publisher / doi.org </button> </a>

Micro-integrated diode laser modules for quantum optical sensors in space [article]

Anja Kohfeldt, Technische Universität Berlin, Technische Universität Berlin, Günther Tränkle
<span title="2017-12-27">2017</span>
To overcome these issues, a master oscillator power amplifier (MOPA) configuration, embedded in a hybrid micro-integrated design was chosen.  ...  In addition to high frequency stability at specific wavelengths and sufficient optical output power, the laser modules have to be small in size, lightweight, mechanically robust and energy efficient to  ...  I would like to acknowledge his support, professional supervising, and helpful discussions.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.14279/depositonce-6584">doi:10.14279/depositonce-6584</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/wkhagfz66ngg7c6mn2hm2gf4ma">fatcat:wkhagfz66ngg7c6mn2hm2gf4ma</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20200109230834/https://depositonce.tu-berlin.de/bitstream/11303/7311/6/kohfeldt_anja.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/aa/46/aa464e7ef30067f99564bb6800539e3e18cd71ad.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.14279/depositonce-6584"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="unlock alternate icon" style="background-color: #fb971f;"></i> Publisher / doi.org </button> </a>