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An effective fault ordering heuristic for SAT-based dynamic test compaction techniques

Stephan Eggersglüß, Rolf Drechsler
<span title="2014-01-28">2014</span> <i title="Walter de Gruyter GmbH"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/zhpjayiyj5gf5fycnlwue3krte" style="color: black;">it - Information Technology</a> </i> &nbsp;
counts of highly compacted test sets generated by a SAT-based dynamic test compaction approach.  ...  The effectiveness of these technique is significantly influenced by fault ordering.  ...  The technique was implemented as an extension of the effective SAT-based dynamic test compaction technique presented in [20] .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1515/itit-2013-1041">doi:10.1515/itit-2013-1041</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/pkekmjjya5fwhpbf6pnvj6ptnu">fatcat:pkekmjjya5fwhpbf6pnvj6ptnu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20180725014731/https://www.degruyter.com/downloadpdf/j/itit.2014.56.issue-4/itit-2013-1041/itit-2013-1041.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/ff/b2/ffb2da006638772b63ef0c1afb1d954559ac8468.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1515/itit-2013-1041"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> degruyter.com </button> </a>

A new SAT-based ATPG for generating highly compacted test sets

Stephan Eggersglu, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
<span title="">2012</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/6zmpupdvf5fhhnjefe33o3wvm4" style="color: black;">2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits &amp; Systems (DDECS)</a> </i> &nbsp;
In contrast to previous SAT-based ATPG techniques which were focused on dealing with hard single faults, the proposed approach employs the robustness of SAT-solvers to primarily push test compaction.  ...  Experimental results on large industrial circuits show that the approach is able to reduce the pattern count of up to 63% compared to state-of-the-art dynamic compaction techniques.  ...  In spite of this limitation, effective techniques and heuristics were developed based on this principle, e.g. [6] - [8] .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ddecs.2012.6219063">doi:10.1109/ddecs.2012.6219063</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/ddecs/EggersglussKGHD12.html">dblp:conf/ddecs/EggersglussKGHD12</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/4zpcdgwokfb3tgo2turwginwby">fatcat:4zpcdgwokfb3tgo2turwginwby</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20190828205440/http://www.informatik.uni-bremen.de:80/agra/doc/konf/12DDECS-MultipleTarget.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/62/ce/62ce43a7d0bbc9fcabbbbd1b6520f793f5f3cf7f.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ddecs.2012.6219063"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Improved SAT-based ATPG: More constraints, better compaction

Stephan Eggersgluss, Robert Wille, Rolf Drechsler
<span title="">2013</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/ffbycmiwjfgqbewnyare6s37ru" style="color: black;">2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)</a> </i> &nbsp;
In this paper, we propose an enhanced dynamic test compaction approach which leverages the high implicative power of modern SAT solvers.  ...  However, a drawback of SAT-based ATPG is the test compaction ability.  ...  ACKNOWLEDGEMENTS The authors would like to thank Melanie Diepenbeck for her support during the implementation of this work.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/iccad.2013.6691102">doi:10.1109/iccad.2013.6691102</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/iccad/EggersglussWD13.html">dblp:conf/iccad/EggersglussWD13</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/prt4idv75nbebguztgnbuatlre">fatcat:prt4idv75nbebguztgnbuatlre</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170705101845/http://www.informatik.uni-bremen.de/agra/doc/konf/13ICCAD-SAT-FDC.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/cf/01/cf01f3881c2201ddb690c9d1d8411ac381444644.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/iccad.2013.6691102"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Dynamic Compaction in SAT-Based ATPG

Alexander Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker
<span title="">2009</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/tquv56q3mbb3zbshmluyl4dp7a" style="color: black;">2009 Asian Test Symposium</a> </i> &nbsp;
We present a dynamic compaction procedure for SAT-based ATPG which utilizes internal data structures of the SAT solver to extract essential fault detection conditions and to generate patterns which cover  ...  SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets.  ...  A SAT-based ATPG searches for a test pattern based on the SAT engine's decision heuristics, which may or may not reflect the circuit's structure.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2009.31">doi:10.1109/ats.2009.31</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/ats/CzutroPERB09.html">dblp:conf/ats/CzutroPERB09</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/ntl3vnb62bh7lp2xqf5eminp3i">fatcat:ntl3vnb62bh7lp2xqf5eminp3i</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170808094351/https://ira.informatik.uni-freiburg.de/nanoscale/2009-Czutro-Dynamic_compaction.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/92/a6/92a66d04b14ab5b1d20c70f93e40845b0e2e309c.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2009.31"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Optimization-based multiple target test generation for highly compacted test sets

Stephan Eggersglub, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler
<span title="">2014</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/yb4g5d6aszdj7coou6jp5dreee" style="color: black;">2014 19th IEEE European Test Symposium (ETS)</a> </i> &nbsp;
Current ATPG methods treat all faults independently from each other which limits the test compaction capability. This paper proposes a new optimization based SAT-ATPG for compact test set generation.  ...  The proposed technique can be used during initial compact test generation as well as a post-process to increase the compactness of existing test sets, e.g. generated by commercial tools, in an iterative  ...  Additionally, formal solving engines have been applied to improve test compaction. Dynamic compaction for SAT-based ATPG has been proposed in [10] .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ets.2014.6847807">doi:10.1109/ets.2014.6847807</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/ets/EggersglussSKD14.html">dblp:conf/ets/EggersglussSKD14</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/rr4rraq5qbay3orgvzmpb3mqri">fatcat:rr4rraq5qbay3orgvzmpb3mqri</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20190828232003/http://www.informatik.uni-bremen.de:80/agra/doc/konf/14ETS-OMTTG.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/18/89/1889085ce300de56066bb71dd0be37f78c3f3732.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ets.2014.6847807"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

Feijun Zheng, Kwang-Ting Cheng, Xiaolang Yan, John Moondanos, Ziyad Hanna
<span title="">2007</span> <i title="IEEE"> 16th Asian Test Symposium (ATS 2007) </i> &nbsp;
The model can also be used to generate diagnostic tests for distinguishing faults of different fault types. Based on this model, we propose a diagnostic pattern compaction strategy.  ...  We first propose an enhanced miter-based model for distinguishing fault candidates that can achieve greater efficiency as well as can prove a group of un-differentiable faults.  ...  The results again demonstrate the effectiveness of the proposed compaction technique for diagnostic tests. Fig.12 .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2007.80">doi:10.1109/ats.2007.80</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/g32cfzjsefb57lgqtnzghipwje">fatcat:g32cfzjsefb57lgqtnzghipwje</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20100706140313/http://cadlab.ece.ucsb.edu/~web_adim/publication/2007/TestPattern_ATS07_FZheng.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/d0/80/d0801eb8de9210782e558f09cc4d1db994d56a14.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2007.80"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

Feijun Zheng, Kwang-Ting Cheng, Xiaolang Yan, John Moondanos, Ziyad Hanna
<span title="">2007</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/f4u6etjcf5cufivspci6m6pfg4" style="color: black;">Proceedings of the Asian Test Symposium</a> </i> &nbsp;
The model can also be used to generate diagnostic tests for distinguishing faults of different fault types. Based on this model, we propose a diagnostic pattern compaction strategy.  ...  We first propose an enhanced miter-based model for distinguishing fault candidates that can achieve greater efficiency as well as can prove a group of un-differentiable faults.  ...  The results again demonstrate the effectiveness of the proposed compaction technique for diagnostic tests. Fig.12 .  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2007.4388027">doi:10.1109/ats.2007.4388027</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/hyx2cxa7fzbpvgqtpsaxfujy5a">fatcat:hyx2cxa7fzbpvgqtpsaxfujy5a</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20100706140313/http://cadlab.ece.ucsb.edu/~web_adim/publication/2007/TestPattern_ATS07_FZheng.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/d0/80/d0801eb8de9210782e558f09cc4d1db994d56a14.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2007.4388027"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill

Stephan Eggersgluss
<span title="">2013</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/tquv56q3mbb3zbshmluyl4dp7a" style="color: black;">2013 22nd Asian Test Symposium</a> </i> &nbsp;
This method is tightly integrated into a dynamic compaction flow to create silent test cubes with high compaction ability.  ...  By this, X-filling for fault detection and reducing switching activity is balanced.  ...  In a dynamic compaction flow, a test cube t p for a primary target fault f p is generated first.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2013.16">doi:10.1109/ats.2013.16</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/ats/Eggersglussv13.html">dblp:conf/ats/Eggersglussv13</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/2izxrxb7y5a27b6zttk6v2cjle">fatcat:2izxrxb7y5a27b6zttk6v2cjle</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170922002940/http://www.informatik.uni-bremen.de/agra/doc/konf/13ATS-LSA.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/8a/82/8a820b334fd150b22cc62c4dc5d14b566a1029ac.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2013.16"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Recent advances in SAT-based ATPG: Non-standard fault models, multi constraints and optimization

Bernd Becker, Rolf Drechsler, Stephan Eggersgluss, Matthias Sauer
<span title="">2014</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/zg5te5xuqjc3pciymmuk7f7e6e" style="color: black;">2014 9th IEEE International Conference on Design &amp; Technology of Integrated Systems in Nanoscale Era (DTIS)</a> </i> &nbsp;
a so-called SAT solver to compute a test.  ...  It is well-known that in principle automatic test pattern generation (ATPG) can be solved by transforming the circuit and the fault considered into a Boolean satisfiability (SAT) instance and then calling  ...  In order to use SAT-based ATPG for MTTG for fault set F = {f 1 , . . . , f n }, the SAT instance has to be extended as follows.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/dtis.2014.6850674">doi:10.1109/dtis.2014.6850674</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/dtis/BeckerDES14.html">dblp:conf/dtis/BeckerDES14</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/xwlu3jwerjhjtdkq26cjdildpu">fatcat:xwlu3jwerjhjtdkq26cjdildpu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170705102043/http://www.informatik.uni-bremen.de/agra/doc/konf/14DTIS-SAT-ATPG.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/57/70/57706ba8a8455081b5ac6c0f2d7f4657afa6b4ed.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/dtis.2014.6850674"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

RTL Test Point Insertion to Reduce Delay Test Volume

Kedarnath J. Balakrishnan, Lei Fang
<span title="">2007</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/wphiaiyfqjbldfalpeh6fwdfey" style="color: black;">Proceedings of the ... IEEE VLSI Test Symposium</a> </i> &nbsp;
Using the proposed methodology, the number of specified bits required to test transition faults is reduced thus improving test set compaction.  ...  In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests.  ...  Scan-based delay testing (esp. transition fault testing) has become an integral part of the structural Design-for-Test (DFT) flow.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/vts.2007.55">doi:10.1109/vts.2007.55</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/vts/BalakrishnanF07.html">dblp:conf/vts/BalakrishnanF07</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/fajjycheqbf3flou7cdrofkwgq">fatcat:fajjycheqbf3flou7cdrofkwgq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170830190239/https://www.computer.org/web/csdl/index/-/csdl/proceedings/vts/2007/2812/00/28120325.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/b0/a3/b0a3fc33c072aba5d39594ce2b7deaf94718af7e.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/vts.2007.55"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Techniques for SAT-based constrained test pattern generation

Jiri Balcarek, Petr Fiser, Jan Schmidt
<span title="">2013</span> <i title="Elsevier BV"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/brvj2ugukfgvhevdy5lwzvdy6m" style="color: black;">Microprocessors and microsystems</a> </i> &nbsp;
These techniques are experimentally evaluated on a real SAT-based algorithm performing a constrained test patterns compression based on overlapping of test patterns.  ...  Results of the experiments are discussed and recommendations for a further development of similar SAT-based tools for constrained test patterns generation are given.  ...  Our experimental evaluation proved that it can be a power-full technique for speedup of the SAT-based constrained test patterns generation.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1016/j.micpro.2012.09.010">doi:10.1016/j.micpro.2012.09.010</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/44tynvx4svf3tj33u6d5aleqmq">fatcat:44tynvx4svf3tj33u6d5aleqmq</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170706050858/http://users.fit.cvut.cz/%7Efiserp/papers/dsd11.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/46/b5/46b56cbd05bc8260c35e4b9ff7ccf3e9bc61bc2f.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1016/j.micpro.2012.09.010"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> elsevier.com </button> </a>

Variation-Aware Fault Grading

A. Czutro, M.E. Imhof, J. Jiang, A. Mumtaz, M. Sauer, B. Becker, I. Polian, H.-J. Wunderlich
<span title="">2012</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/tquv56q3mbb3zbshmluyl4dp7a" style="color: black;">2012 IEEE 21st Asian Test Symposium</a> </i> &nbsp;
An iterative flow to generate test sets providing high fault coverage under extreme parameter variations is presented.  ...  Experiments show that the statistical fault coverage of the generated test sets exceeds by far that achieved by standard approaches.  ...  The authors would like to thank Stefan Holst and Eric Schneider for their support regarding the GPGPU simulator.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2012.14">doi:10.1109/ats.2012.14</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/ats/CzutroIJMSBPW12.html">dblp:conf/ats/CzutroIJMSBPW12</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/tl3q36vilvddvjsaqolourvkcu">fatcat:tl3q36vilvddvjsaqolourvkcu</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20201106101859/http://www.meimhof.de/publications/conference/2012_ATS_CzutroIJMSBPW2012.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/27/50/27502ac85f45e8e20d89568df463ca693b101821.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/ats.2012.14"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

A circular pipeline processing based deterministic parallel test pattern generator

Kuen-Wei Yeh, Jiun-Lang Huang, Hao-Jan Chao, Laung-Terng Wang
<span title="">2013</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/c6t4qycpy5haxkpjvywsoox6dq" style="color: black;">2013 IEEE International Test Conference (ITC)</a> </i> &nbsp;
Parallel programming is an attractive solution to accelerate test pattern generation (TPG); however, the associated non-determinism often leads to non-reproducible test pattern sets.  ...  Based on CPP, a deterministic parallel test pattern generator is developed; it guarantees to produce the same test pattern set regardless of the thread timing and the thread count.  ...  The dynamic compaction scheme in s-TPG is very effective in reducing the test set size; however, parallelized dynamic compaction often suffers test inflation and non-determinism. • Test inflation.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/test.2013.6651913">doi:10.1109/test.2013.6651913</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/itc/YehHCW13.html">dblp:conf/itc/YehHCW13</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/2jityn4ak5bl5navtpvdwgypfa">fatcat:2jityn4ak5bl5navtpvdwgypfa</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20170819203732/https://www.computer.org/csdl/proceedings/itc/2013/9999/00/06651913.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/58/ac/58ac38a3052cca6454882dbbdeaa6def74867c45.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/test.2013.6651913"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>

Stepping forward with interpolants in unbounded model checking

Gianpiero Cabodi, Marco Murciano, Sergio Nocco, Stefano Quer
<span title="">2006</span> <i title="ACM Press"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/tadj4kfdtfdjfhulrlnjm4vb4i" style="color: black;">Computer-Aided Design (ICCAD), IEEE International Conference on</a> </i> &nbsp;
Both techniques rely on an effective application of the incremental SAT paradigm.  ...  Based on refutation proofs generated by SAT solvers, interpolants provide compact circuit representations of state sets, and abstract away several details non relevant for proofs.  ...  McMillan for the source descriptions of the Sun PicoJava II microprocessor, and the VTT group of the STMicroelectronics, Agrate, Italy, for their industrial benchmarks.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/1233501.1233661">doi:10.1145/1233501.1233661</a> <a target="_blank" rel="external noopener" href="https://dblp.org/rec/conf/iccad/CabodiMNQ06.html">dblp:conf/iccad/CabodiMNQ06</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/2rekd42g75gtlc5ca5lbf7avam">fatcat:2rekd42g75gtlc5ca5lbf7avam</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20100621061819/http://www.cecs.uci.edu/~papers/iccad06/papers/10B_1.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/d6/e7/d6e7fe06f1c4377aa9985a15e3ff758419084aeb.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1145/1233501.1233661"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> acm.org </button> </a>

Stepping Forward with Interpolants in Unbounded Model Checking

Gianpiero Cabodi, Marco Murciano, Sergio Nocco, Stefano Quer
<span title="">2006</span> <i title="IEEE"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/tadj4kfdtfdjfhulrlnjm4vb4i" style="color: black;">Computer-Aided Design (ICCAD), IEEE International Conference on</a> </i> &nbsp;
Both techniques rely on an effective application of the incremental SAT paradigm.  ...  Based on refutation proofs generated by SAT solvers, interpolants provide compact circuit representations of state sets, and abstract away several details non relevant for proofs.  ...  McMillan for the source descriptions of the Sun PicoJava II microprocessor, and the VTT group of the STMicroelectronics, Agrate, Italy, for their industrial benchmarks.  ... 
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/iccad.2006.320119">doi:10.1109/iccad.2006.320119</a> <a target="_blank" rel="external noopener" href="https://fatcat.wiki/release/np5rt5pqhbdtbjkzwtvkl46kfy">fatcat:np5rt5pqhbdtbjkzwtvkl46kfy</a> </span>
<a target="_blank" rel="noopener" href="https://web.archive.org/web/20100621061819/http://www.cecs.uci.edu/~papers/iccad06/papers/10B_1.pdf" title="fulltext PDF download" data-goatcounter-click="serp-fulltext" data-goatcounter-title="serp-fulltext"> <button class="ui simple right pointing dropdown compact black labeled icon button serp-button"> <i class="icon ia-icon"></i> Web Archive [PDF] <div class="menu fulltext-thumbnail"> <img src="https://blobs.fatcat.wiki/thumbnail/pdf/d6/e7/d6e7fe06f1c4377aa9985a15e3ff758419084aeb.180px.jpg" alt="fulltext thumbnail" loading="lazy"> </div> </button> </a> <a target="_blank" rel="external noopener noreferrer" href="https://doi.org/10.1109/iccad.2006.320119"> <button class="ui left aligned compact blue labeled icon button serp-button"> <i class="external alternate icon"></i> ieee.com </button> </a>
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