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Fault Diagnosis in Analog Circuits via Symbolic Analysis Techniques [chapter]

Fawzi M, Bessam Z
2013 Analog Circuits  
Also for ambiguity group determination the symbolic approach gives excellent results [ ].  ...  Obviously all this is applicable to linear analog circuits or to nonlinear circuits suitably linearized.  ...  The necessary condition for an ambiguity group F of the linear combination matrix C to contain the set of all faults in the tested circuit is that the rank of the corresponding columns in matrix X b MP  ... 
doi:10.5772/53643 fatcat:jbgq7pyvtrg7rnrbedq2pokeum

Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits

G. Fedi, S. Manetti, M.C. Piccirilli, J. Starzyk
1999 IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications  
A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented.  ...  The proposed method has its theoretical foundation in the testability concept and in the canonical ambiguity group concept.  ...  been considered by exploiting a software package, based on symbolic analysis techniques, for the determination of both testability and canonical ambiguity groups in analog linear circuits.  ... 
doi:10.1109/81.774222 fatcat:e52fisfzxrawpahb4nomysriru

Analog Fault Diagnosis with Failure Bounds

Chiwan-Chia Wu, K. Nakajima, Chin-Long Wey, R. Saeks
1982 IEEE Transactions on Circuits and Systems  
component may be "in tolerance" but not nominal. (3) The simulation of analog circuit is usually slow and costly because:..analog systems are frequently nonlinear.  ...  An alternative multifailure decision algorithm uses an heuristic approach, in which one adopts an "analog heuristic" to the effect that two independent analog failures will never cancel.  ... 
doi:10.1109/tcs.1982.1085154 fatcat:kkxixud2cnbdhj4z3dyonuqx5q

Synchronizing hyperchaotic systems by observer design

G. Grassi, S. Mascoio
1999 IEEE transactions on circuits and systems - 2, Analog and digital signal processing  
By developing this approach, a linear time-invariant synchronization error system is obtained, for which a necessary and sufficient condition is given in order to asymptotically stabilize its dynamics  ...  The suggested tool proves to be effective and systematic in achieving global synchronization.  ...  ACKNOWLEDGMENT The authors would like to express their sincere gratitude to Associate Editor P.  ... 
doi:10.1109/82.755422 fatcat:h5m7u6izevfv7ja3l54i2qvc7u

Finding ambiguity groups in low testability analog circuits

J.A. Starzyk, J. Pang, S. Manetti, M.C. Piccirilli, G. Fedi
2000 IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications  
This paper discusses a numerically efficient approach to identify complex ambiguity groups for the purpose of analog fault diagnosis in low-testability circuits.  ...  This work extends results reported earlier in literature, where QR factorization was used in low-testability circuits, significantly increasing efficiency to determine ambiguity groups.  ...  All ambiguity groups in this circuit were determined in 0.19 s.  ... 
doi:10.1109/81.873868 fatcat:i6e5tjwtcnejjdecdv7vcrj6b4

A Neural Network Classifier with Multi-Valued Neurons for Analog Circuit Fault Diagnosis

Igor Aizenberg, Riccardo Belardi, Marco Bindi, Francesco Grasso, Stefano Manetti, Antonio Luchetta, Maria Cristina Piccirilli
2021 Electronics  
In this paper, we present a new method designed to recognize single parametric faults in analog circuits.  ...  The technique follows a rigorous approach constituted by three sequential steps: calculating the testability and extracting the ambiguity groups of the circuit under test (CUT); localizing the failure  ...  A major drawback is due to the nonlinear nature of the problem, also for linear circuits.  ... 
doi:10.3390/electronics10030349 fatcat:m4qq23w2z5e2xdabyh2sfxha4a

New Aspects of Fault Diagnosis of Nonlinear Analog Circuits

Michał Tadeusiewicz, Stanisław Hałgas, Andrzej Kuczyński
2015 International Journal of Electronics and Telecommunications  
The paper is focused on nonlinear analog circuits, with the special attention paid to circuits comprising bipolar and MOS transistors manufactured in micrometer and submicrometer technology.  ...  The discussed methods are based on diagnostic test, leading to a system of nonlinear algebraic type equations, which are not given in explicit analytical form.  ...  circuit elements form ambiguity groups.  ... 
doi:10.1515/eletel-2015-0011 fatcat:bc7f42bip5aofazewe6htffcme

Analog system modeling based on a double modified complex valued neural network

Antonio Luchetta, Stefano Manetti, Maria Cristina Piccirilli
2013 The 2013 International Joint Conference on Neural Networks (IJCNN)  
The method follows the Frequency Response Analysis (FRA) approach for elaborating the data presented to the network. * 1  ...  The aim of this work is to present a novel technique for the identification of lumped circuit models of general distributed apparatus and devices.  ...  The determination of testability and ambiguity groups of the model is in this case more complicated; the lumped model filter, in fact, has a testability value equal to 6, 272 ambiguity groups and 1306  ... 
doi:10.1109/ijcnn.2013.6707136 dblp:conf/ijcnn/LuchettaMP13 fatcat:mf432qiplrgdxfimcnfmcq3ria

Impact and chaotic phenomena in nonlinear nonsmooth electrical dynamical systems

Zdzisław TRZASKA
2015 Przeglad Elektrotechniczny  
The article presents results of the analysis of nonlinear oscillators with nonsmooth elements and nonlinear systems with nonsmooth excitations.  ...  Main attention has been focused on highlighting specific properties of nonsmooth systems compared to their smooth counterparts.  ...  The nonsmooth time transformation shows an explicit link between the underlying dynamics and hyperbolic algebra, analogously to the link between the harmonic approach and complex analysis.  ... 
doi:10.15199/48.2015.03.19 fatcat:7wwj7pvtffadvbqo5sngeydefe

Feedback system design: The tracking and disturbance rejection problems

R. Saeks, J. Murray
1981 IEEE Transactions on Automatic Control  
ACKNOWLEDGEMENT This research was supported in part by the Joint Services Electronics Program at Texas Tech University, under ONR Contract 76-C-1 136.  ...  .: Automatic Generion of Fault lahis linear analog circuits has yet to be demonstrated tion Tests for Analog Circuit Boards-A Srvsey, while the nonlinear problem has yet to progress Presuted at ATEX EAST  ...  The present paper gives a different viewpoint, however, being an analytic approach in contrast to the algebraic approach in [l.  ... 
doi:10.1109/tac.1981.1102561 fatcat:3hhretfd3fes3kmztwjwtr4lxa

Abstracts of Current Computer Literature

1968 IEEE transactions on computers  
The present paper uses the methods of this algebraic approach to obtain a prime decomposition theorem for generalized machines together with the determination of properties preserved under series and parallel  ...  The variational approach to the optimal design of high-speed switching circuits is explored.  ... 
doi:10.1109/tc.1968.229105 fatcat:2ijvliiwarh2jc2lxnwiyktyjq

Computer-aided design of analog and mixed-signal integrated circuits

G.G.E. Gielen, R.A. Rutenbar
2000 Proceedings of the IEEE  
This survey presents an overview of recent advances in the state of the art for computer-aided design (CAD) tools for analog and mixed-signal integrated circuits (ICs).  ...  But due to the increasing levels of integration available in silicon technology and the growing requirement for digital systems to communicate with the continuous-valued external world, there is a growing  ...  For analog circuits, the entities to be handled are structural groups of one single or a special grouping of devices (e.g., a matching pair of transistors).  ... 
doi:10.1109/5.899053 fatcat:2kjzezalevhuzayfrkykyvm5py

ComputerAided Design of Analog and MixedSignal Integrated Circuits [chapter]

2009 Computer-Aided Design of Analog Integrated Circuits and Systems  
This survey presents an overview of recent advances in the state of the art for computer-aided design (CAD) tools for analog and mixed-signal integrated circuits (ICs).  ...  But due to the increasing levels of integration available in silicon technology and the growing requirement for digital systems to communicate with the continuous-valued external world, there is a growing  ...  For analog circuits, the entities to be handled are structural groups of one single or a special grouping of devices (e.g., a matching pair of transistors).  ... 
doi:10.1109/9780470544310.ch1 fatcat:nz4on5owvvdxbneeuh3aqrkkfe

Signal Folding in A/D Converters

H. Pan, A.A. Abidi
2004 IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications  
Signal folding appears in A/D converters (ADCs) in various ways. In this paper, the evolution of this technique is derived from the fundamentals of quantization to obtain systematic insights.  ...  By appreciating similarities between the well-known pipeline ADCs, folding ADCs, and ripple through ADCs, this enables the circuit designer to more freely choose the best architecture to meet the specified  ...  In summary, just as circuits that fold an array of zero crossings need not be as linear as circuits that fold the analog input, similarly simple nonlinear circuits can hold an array of zero crossings whereas  ... 
doi:10.1109/tcsi.2003.821278 fatcat:mb53dkvlhfdujcxossjvesgcla

Abstracts of Current Computer Literature

1969 IEEE transactions on computers  
Automatic Parameter Optimization of Nonlinear Control Systems 6505 -see also Analog Storage Analog Storage Storage of Analog Variables in Delay Lines 6504 Analysis Real-Time Spectrum Analyzers  ...  This paper shows how the decision analysis approach can be used to determine the most economic method of carrying out computations or analyses.  ... 
doi:10.1109/t-c.1969.222625 fatcat:n6paydv7k5aaphhvk5wom2xplu
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