Filters








9,577 Hits in 7.5 sec

2-Transitivity Is Insufficient for Local Testability

Elena Grigorescu, Tali Kaufman, Madhu Sudan
2008 2008 23rd Annual IEEE Conference on Computational Complexity  
" of the code (i.e., the code is invariant under a 2-transitive group of permutations on the coordinates of the code) suffice to get local testability.  ...  For the case when the property to be tested is membership in a binary linear error-correcting code, Alon et al. [2] had conjectured that the presence of a single low weight code in the dual, and "2-transitivity  ...  For every n, F ⊥ n has a non-zero function of weight at most 8. 2. For every n, F n is 2-transitive. F is not k-locally testable.  ... 
doi:10.1109/ccc.2008.31 dblp:conf/coco/GrigorescuKS08 fatcat:wmqhry3rejg5ndjmdhe4xo5ita

2-Transitivity is Insufficient for Local Testability

Elena Grigorescu, Tali Kaufman, Madhu Sudan
2012 Computational Complexity  
" of the code (i.e., the code is invariant under a 2-transitive group of permutations on the coordinates of the code) suffice to get local testability.  ...  For the case when the property to be tested is membership in a binary linear error-correcting code, Alon et al. [2] had conjectured that the presence of a single low weight code in the dual, and "2-transitivity  ...  For every n, F ⊥ n has a non-zero function of weight at most 8. 2. For every n, F n is 2-transitive. F is not k-locally testable.  ... 
doi:10.1007/s00037-012-0055-3 fatcat:rawo37tevje7thtiogoaagrjey

From Regular to Strictly Locally Testable Languages

Stefano Crespi Reghizzi, Pierluigi San Pietro
2011 Electronic Proceedings in Theoretical Computer Science  
Local languages are characterized by the value k=2 of the sliding window width in the McNaughton and Papert's infinite hierarchy of strictly locally testable languages (k-slt).  ...  which any smaller alphabetic ratio is insufficient.  ...  Acknowledgments: Thanks to Aldo De Luca for suggesting relevant references.  ... 
doi:10.4204/eptcs.63.14 fatcat:cut3qi6jdvfk3jaew3fl2xgtmq

FROM REGULAR TO STRICTLY LOCALLY TESTABLE LANGUAGES

STEFANO CRESPI REGHIZZI, PIERLUIGI SAN PIETRO
2012 International Journal of Foundations of Computer Science  
Local languages are characterized by the value k = 2 of the sliding window width in the McNaughton and Papert's infinite hierarchy of strictly locally testable languages (k-slt).  ...  which any smaller alphabetic ratio is insufficient.  ...  Acknowledgments: Thanks to Aldo De Luca for suggesting relevant references.  ... 
doi:10.1142/s0129054112400710 fatcat:wtc7q7hpj5aoxjfqqyeu6sacpy

Path delay test compaction with process variation tolerance

S. Kajihara, M. Fukunaga, Xiaoqing Wen, T. Maeda, S. Hamada, Y. Sato
2005 Proceedings. 42nd Design Automation Conference, 2005.  
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths selected with a criterion.  ...  While the proposed method generates each two-pattern test for more than one fault in the target fault list as well as ordinary test compaction methods, secondary target faults are selected from the fault  ...  Among delay fault models for test generation and fault diagnosis [1] [2] [3] , the path delay fault model [2] has many advantages since it models localized as well as distributed excessive delays.  ... 
doi:10.1109/dac.2005.193933 fatcat:5djv262urvcvfjw5srlz7ppcxu

Path delay test compaction with process variation tolerance

Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato
2005 Proceedings of the 42nd annual conference on Design automation - DAC '05  
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths selected with a criterion.  ...  While the proposed method generates each two-pattern test for more than one fault in the target fault list as well as ordinary test compaction methods, secondary target faults are selected from the fault  ...  Among delay fault models for test generation and fault diagnosis [1] [2] [3] , the path delay fault model [2] has many advantages since it models localized as well as distributed excessive delays.  ... 
doi:10.1145/1065579.1065802 dblp:conf/dac/KajiharaFWMHS05 fatcat:ueqpfjr5pvfobpd6bhz7bpgrdm

Page 5102 of Mathematical Reviews Vol. , Issue 2000g [page]

2000 Mathematical Reviews  
Inform. 38 (1999), no. 1-2, 189-200. Summary: “It is shown that the universe problem L(s/’) = A* is undecidable for 4-state finite automata . with integer weight function y on its transitions.  ...  The new associative language description (ALD) model, a combination of locally testable and constituent structure ideas, is proposed, arguing that in practice it equals context-free grammars in explanatory  ... 

Information extraction from structured documents using k-testable tree automaton inference

Raymond Kosala, Hendrik Blockeel, Maurice Bruynooghe, Jan Van den Bussche
2006 Data & Knowledge Engineering  
However, the quality of the extraction is still suboptimal.  ...  In this work, we explore induction of k-testable ranked tree automata from a small set of annotated examples.  ...  Hendrik Blockeel is a post-doctoral fellow of the Fund for Scientific Research of Flanders.  ... 
doi:10.1016/j.datak.2005.05.002 fatcat:cwqsa7kewbe3tcoanxnjoujvou

Electroweak Baryogenesis: A Brief Review [article]

Mark Trodden
1998 arXiv   pre-print
A brief review of the fundamental ideas behind electroweak baryogenesis is presented.  ...  Since a successful implementation of these ideas requires an extension of the minimal standard model, I comment on the necessary physics and how experimental constraints make these scenarios testable at  ...  Acknowledgements I would like to thank the organizing committee for inviting me to speak, and for working so hard to make the conference run smoothly.  ... 
arXiv:hep-ph/9805252v1 fatcat:ykhaqhmnvzcbfcnhywrdoroudm

Local variables affecting H-mode threshold on Alcator C-Mod

A E Hubbard, R L Boivin, J F Drake, M Greenwald, Y In, J H Irby, B N Rogers, J A Snipes
1998 Plasma Physics and Controlled Fusion  
An edge temperature threshold for the L-H transition is found on the Alcator C-Mod tokamak.  ...  T e at the H-L transition can be greater than or equal to the L-H threshold. Magnetic fluctuations are observed at some H-L transitions.  ...  Local conditions at L-H and H-L transition The primary electron temperature diagnostic used for local threshold studies is a ninechannel ECE grating polychromator, which has ∼2 cm channel spacing and 9  ... 
doi:10.1088/0741-3335/40/5/024 fatcat:pgwktarh6ndj7nliou7egzdysu

On effective criterion of path selection for delay testing

Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka, Shinichi Yosimura
2003 Proceedings of the 2003 conference on Asia South Pacific design automation - ASPDAC  
Since a logic circuit often has too many paths to test delay of all paths in the circuit, it is necessary for path delay testing to limit the number of paths to be tested.  ...  In addition, a test set for the paths are required to detect other models of faults as many as possible. In this paper, we investigate criteria of path selection for path delay testing.  ...  Even if we test paths extracted by a static timing analyzer, it is insufficient to detect delay defects of the circuit because conditions (2) and (3) are not considered enough.  ... 
doi:10.1145/1119772.1119941 dblp:conf/aspdac/FukunagaKTY03 fatcat:yrhuvcbh7fhinivdaundsr3oyy

BIST for systems-on-a-chip

Hans-Joachim Wunderlich
1998 Integration  
Core-providers offer RISC-kernels, embedded memories, DSPs, and many other functions, and built-in self-test is the appropriate method for testing complex systems composed of different cores.  ...  In this paper, we overview BIST methods for different types of cores and present advanced BIST solutions.  ...  For test pattern generation the LFSR with the feedback polynomial 1 2 + + x x is used. Its autonomous state transitions are shown in Figure 16 b.  ... 
doi:10.1016/s0167-9260(98)00021-2 fatcat:qenkm6odojampcjqguhbco6l6m

Local decoding and testing of polynomials over grids

Mitali Bafna, Srikanth Srinivasan, Madhu Sudan
2020 Random structures & algorithms (Print)  
As a consequence we get a natural example of a code (one with a transitive group of symmetries) that is locally testable but not locally decodable.  ...  In this work we explore their local decodability and local testability.  ...  (resp. testable) for every n.  ... 
doi:10.1002/rsa.20933 fatcat:wrtcbryhf5caxd3kjoucjkssdq

DeepTPI: Test Point Insertion with Deep Reinforcement Learning [article]

Zhengyuan Shi, Min Li, Sadaf Khan, Liuzheng Wang, Naixing Wang, Yu Huang, Qiang Xu
2022 arXiv   pre-print
Test point insertion (TPI) is a widely used technique for testability enhancement, especially for logic built-in self-test (LBIST) due to its relatively low fault coverage.  ...  Moreover, we apply the general node embeddings from a pre-trained model to enhance node features, and propose a dedicated testability-aware attention mechanism for the value network.  ...  INTRODUCTION Logic built-in-self-test (LBIST) [1] is a commonly used technique for in-field tests, especially for many safety-critical scenarios [2] , such as self-driving cars, healthcare systems,  ... 
arXiv:2206.06975v2 fatcat:b2pjanuu7vaf5lr5qrn4nsxlhq

Robust test generation for power supply noise induced path delay faults

Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li
2008 2008 Asia and South Pacific Design Automation Conference  
Based on precise timing analysis, we also propose a robust test generation technique for PSNPDF. Concept of timing window is introduced into the PSNPDF model.  ...  A PSNinduced path delay fault (PSNPDF) model is proposed in this paper, and should be tested to enhance chip quality.  ...  LP stands for a critical path. sp-a is the aggressor sub-path that satisfies the following conditions: 1) LP must be a robustly testable path. 2) sp-a is represented in the form of sp-a(G-a,G-v) .  ... 
doi:10.1109/aspdac.2008.4484033 dblp:conf/aspdac/FuLHL08 fatcat:zkmmlyrgqfbtpf57gzlj3zfzee
« Previous Showing results 1 — 15 out of 9,577 results