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Relationships between Stochastic Phenomena and Optical Contrast in Chemically Amplified Resist Process of Extreme Ultraviolet Lithography
release_zh65zxxko5frzgzyfcsmztfpma
by
Takahiro Kozawa,
Julius Joseph Santillan,
Toshiro Itani
Published
in Journal of Photopolymer Science and Technology (Fotoporima Konwakai shi)
by Technical Association of Photopolymers, Japan.
2014 Volume 27, p11-19
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