@article{chen_tsao_ong_2003, 
  title={The Impact of Gate-to-Source Tunneling Current on the Characterization of Metal-Oxide-Semiconductor Field-Effect Transistor's Hot-Carrier Reliability}, 
  volume={42}, 
  DOI={10.1143/jjap.42.2149}, 
  number={Part 1, No. 4B}, 
  publisher={Japan Society of Applied Physics}, 
  author={Chen and Tsao and Ong}, 
  year={2003}, 
  month={Apr}
  }