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Determining Components of Series Resistance from Measurements on a Finished Cell
release_xqrcc5nfgjgzdad6ynxgamvyle
by
D. Meier,
E. Good,
R. Garcia,
B. Bingham,
S. Yamanaka,
V. Chandrasekaran,
C. Bucher
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as a paper-conference
by IEEE.
2006
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