Automated peak fitting of XPS spectrum using information criteria

by Hiroshi Shinotsuka, Hideki Yoshikawa, Ryo Murakami, Kazuki Nakamura, Hiromi Tanaka, Kazuhiro Yoshihara

Published in Journal of Surface Analysis by Surface Analysis Society of Japan.

2019 Volume 26, p126-127

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Year 2019
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DOI 10.1384/jsa.26.126

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ISSN-L: 1341-1756

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Automated peak fitting of XPS spectrum using information criteria release_x662czann5avpd6rsjfr4gszh4