BibTeX
CSL-JSON
MLA
Harvard
Fluctuation of In composition in InGaAs Layer studied by TEM-CL technique
24pY-3 TEM : カソードルミネッセンス法によるInGaAs成長膜中のIn組成揺らぎ評価
release_vuavxbfw3zfizlwasnftvec4di
by
T. Mita,
N. Yamamoto
Published
in Meeting Abstracts of the Physical Society of Japan (Nihon Butsuri Gakkai koen gaiyoshu)
by The Physical Society of Japan.
2000 Volume 55.1.4, Issue 0, p855
Archived Files and Locations
application/pdf
520.4 kB
file_d33ssscx3vezhnrbo5vk5h3i7i
|
www.jstage.jst.go.jp (repository) web.archive.org (webarchive) |
Read Archived PDF
Preserved and Accessible
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
access all versions, variants, and formats of this works (eg, pre-prints)
Cite This
Lookup Links
oaDOI/unpaywall (OA fulltext)
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar