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High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film
release_vo7yccjb6nhnrijkth5t2cnnza
by
L. Fang,
P. Ricou,
R. Korotkov
Published
in Microscopy and Microanalysis
by Cambridge University Press (CUP).
2013 Volume 19, Issue S2, p1958-1959
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
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