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Principles of surface-phase-resolved shearography
release_tlpes6ufxrhidh3opoybffbbpi
by
Michael J. DeWeert,
Andrew N. Acker,
Reid Noguchi,
Dugan Yoon,
Gary Sawai
Published
in Optical Engineering: The Journal of SPIE
by SPIE-Intl Soc Optical Eng.
2019 Volume 58, Issue 11
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