System of Combined Specialized Test Generators for the New Generation of VLIW DSP Processors with Elcore50 Architecture

by A.V. Garashchenko, A.V. Nikolaev, F.M. Putrya, S.S. Sardaryan

Published in Problems of advanced micro- and nanoelectronic systems development by FSFIS Institute for Design Problems in Microelectronics RAS.

2019 p2-7

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Year 2019

DOI 10.31114/2078-7707-2019-2-2-7

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System of Combined Specialized Test Generators for the New Generation of VLIW DSP Processors with Elcore50 Architecture release_sde4eheryzeuhfthlmy5pjral4