From statistical model checking to statistical model inference: Characterizing the effect of process variations in analog circuits

by Yan Zhang, Sriram Sankaranarayanan, Fabio Somenzi, Xin Chen, Erika Abraham

Published in International Conference on Computer Aided Design by IEEE.

2013 p662-669

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Year 2013

DOI 10.1109/iccad.2013.6691186
dblp conf/iccad/ZhangSSCA13

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